[{"name":"R5-217327","title":"Adding test applicability for switching time mask for inter-band EN-DC","source":"China Telecom, Huawei, HiSilicon","contact":"Jingzhou Wu","contact-id":86334,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":186,"ainumber":"5.3.9.5","ainame":"TS 38.522","tdoc_agenda_sort_order":73270,"status":"revised","reservation_date":"2021-10-29 08:58:21","uploaded":"2021-10-29 09:25:34","revisionof":"","revisedto":"R5-218460","release":"Rel-17","crspec":"38.522","crspecversion":"17.2.0","workitem":[{"winame":"NR_RF_FR1-UEConTest"}],"crnumber":117.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_93_Electronic\/Docs\/R5-217327.zip","group":"R5","meeting":"R5-93-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-217394","title":"Addition of test applicability for 4.5.8.1 EN-DC FR1 DL interruptions at switching between two uplink carriers","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":186,"ainumber":"5.3.9.5","ainame":"TS 38.522","tdoc_agenda_sort_order":73940,"status":"withdrawn","reservation_date":"2021-10-29 09:21:07","uploaded":"2021-10-30 08:45:28","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.522","crspecversion":"17.2.0","workitem":[{"winame":"NR_RF_FR1-UEConTest"}],"crnumber":121.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_93_Electronic\/Docs\/R5-217394.zip","group":"R5","meeting":"R5-93-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-218460","title":"Adding test applicability for switching time mask for inter-band EN-DC","source":"China Telecom, Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":186,"ainumber":"5.3.9.5","ainame":"TS 38.522","tdoc_agenda_sort_order":73271,"status":"agreed","reservation_date":"2021-11-20 18:27:38","uploaded":"2021-11-21 09:41:13","revisionof":"R5-217327","revisedto":"","release":"Rel-17","crspec":"38.522","crspecversion":"17.2.0","workitem":[{"winame":"NR_RF_FR1-UEConTest"}],"crnumber":117.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-212766","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_93_Electronic\/Docs\/R5-218460.zip","group":"R5","meeting":"R5-93-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]