[{"name":"R5-184151","title":"Test tolerance update of eHST FDD event reporting test case","source":"Qualcomm Europe Inc. (Spain)","contact":"Mayur Vora","contact-id":46658,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":111,"ainumber":"5.3.9.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":41510,"status":"agreed","reservation_date":"2018-08-07 09:28:12","uploaded":"2018-08-10 16:12:20","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-3","crspecversion":"15.2.1","workitem":[{"winame":"LTE_high_speed-UEConTest"}],"crnumber":2226.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-181561","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184151.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]