[{"name":"R5-162480","title":"Addition of applicability for Dual Connectivity test cases","source":"TTA","contact":"Youngik Jo","contact-id":39032,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":67,"ainumber":"5.3.8.3","ainame":"TS 36.521-2","tdoc_agenda_sort_order":24800,"status":"withdrawn","reservation_date":"2016-05-13 04:02:55","uploaded":"2016-05-13 14:04:47","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-2","crspecversion":"13.1.0","workitem":[{"winame":"LTE_SC_enh_L1-UEConTest"}],"crnumber":412.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162480.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-162711","title":"Applicability CR to 36.521-2 for new DC test cases","source":"Ericsson, TTA, LG Electronics","contact":"Fredrik Sundstr\u00f6m","contact-id":41388,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":67,"ainumber":"5.3.8.3","ainame":"TS 36.521-2","tdoc_agenda_sort_order":27110,"status":"revised","reservation_date":"2016-05-13 19:01:45","uploaded":"2016-05-13 19:49:52","revisionof":"","revisedto":"R5-163118","release":"Rel-13","crspec":"36.521-2","crspecversion":"13.1.0","workitem":[{"winame":"LTE_SC_enh_dualC-UEConTest"}],"crnumber":425.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-162711.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-163118","title":"Applicability CR to 36.521-2 for new DC test cases","source":"Ericsson, TTA, LG Electronics","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":67,"ainumber":"5.3.8.3","ainame":"TS 36.521-2","tdoc_agenda_sort_order":27111,"status":"agreed","reservation_date":"2016-05-31 13:32:29","uploaded":"2016-08-31 15:49:16","revisionof":"R5-162711","revisedto":"","release":"Rel-13","crspec":"36.521-2","crspecversion":"13.1.0","workitem":[{"winame":"LTE_SC_enh_dualC-UEConTest"}],"crnumber":425.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-160837","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_71_Nanjing\/Docs\/R5-163118.zip","group":"R5","meeting":"R5-71","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]