[{"name":"R5-246434","title":"NTN A-Spurious test - corrections for NS 02N","source":"Keysight Technologies","contact":"Adan Toril","contact-id":62705,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 11\/7\/2024. Original source : Keysight Technologies UK Ltd","agenda_item_sort_order":187,"ainumber":"5.3.7.4","ainame":"TS 38.521-5","tdoc_agenda_sort_order":64340,"status":"agreed","reservation_date":"2024-05-11 08:48:54","uploaded":"2024-11-07 15:20:00","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.521-5","crspecversion":"18.3.0","workitem":[{"winame":"NR_NTN_solutions_plus_CT-UEConTest"}],"crnumber":79.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-242680","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__105_Orlando\/Docs\/R5-246434.zip","group":"R5","meeting":"R5-105","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"6.5.3.3","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-247028","title":"Discussion on updating NTN demodulation test case","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":187,"ainumber":"5.3.7.4","ainame":"TS 38.521-5","tdoc_agenda_sort_order":70280,"status":"noted","reservation_date":"2024-08-11 08:53:56","uploaded":"2024-11-08 10:25:46","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.521-5","crspecversion":"","workitem":[{"winame":"NR_NTN_solutions_plus_CT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__105_Orlando\/Docs\/R5-247028.zip","group":"R5","meeting":"R5-105","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-247029","title":"Updating the test description in NTN performance test case","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":187,"ainumber":"5.3.7.4","ainame":"TS 38.521-5","tdoc_agenda_sort_order":70290,"status":"revised","reservation_date":"2024-08-11 08:53:56","uploaded":"2024-11-08 10:25:46","revisionof":"","revisedto":"R5-247785","release":"Rel-18","crspec":"38.521-5","crspecversion":"18.3.0","workitem":[{"winame":"NR_NTN_solutions_plus_CT-UEConTest"}],"crnumber":80.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__105_Orlando\/Docs\/R5-247029.zip","group":"R5","meeting":"R5-105","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-247149","title":"addition of subtest selection criteria for DEMOD NR-NTN test case","source":"Qualcomm Inc","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 11\/9\/2024. Original source : Qualcomm Inc","agenda_item_sort_order":187,"ainumber":"5.3.7.4","ainame":"TS 38.521-5","tdoc_agenda_sort_order":71490,"status":"revised","reservation_date":"2024-08-11 12:17:09","uploaded":"2024-11-09 08:37:10","revisionof":"","revisedto":"R5-247787","release":"Rel-18","crspec":"38.521-5","crspecversion":"18.3.0","workitem":[{"winame":"NR_NTN_solutions_plus_CT-UEConTest"}],"crnumber":81.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__105_Orlando\/Docs\/R5-247149.zip","group":"R5","meeting":"R5-105","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"8.2.1.2.2.1.1_1.2","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-247408","title":"Updates on defintion of NTN terms and abbreviations","source":"ZTE Corporation, Tejet, SRTC","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"CR","for":"Agreement","abstract":"[Core spec alignment]","secretary_remarks":"Source modified on 11\/8\/2024. Original source : ZTE Corporation, Tejet, SRTC","agenda_item_sort_order":187,"ainumber":"5.3.7.4","ainame":"TS 38.521-5","tdoc_agenda_sort_order":74080,"status":"revised","reservation_date":"2024-08-11 17:38:20","uploaded":"2024-11-08 22:36:22","revisionof":"","revisedto":"R5-247800","release":"Rel-18","crspec":"38.521-5","crspecversion":"18.3.0","workitem":[{"winame":"NR_NTN_solutions_plus_CT-UEConTest"}],"crnumber":86.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__105_Orlando\/Docs\/R5-247408.zip","group":"R5","meeting":"R5-105","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"3.1, 3.3","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-247785","title":"Updating the test description in NTN performance test case","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":187,"ainumber":"5.3.7.4","ainame":"TS 38.521-5","tdoc_agenda_sort_order":70291,"status":"agreed","reservation_date":"2024-11-28 19:09:53","uploaded":"2024-11-28 19:11:07","revisionof":"R5-247029","revisedto":"","release":"Rel-18","crspec":"38.521-5","crspecversion":"18.3.0","workitem":[{"winame":"NR_NTN_solutions_plus_CT-UEConTest"}],"crnumber":80.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-242681","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__105_Orlando\/Docs\/R5-247785.zip","group":"R5","meeting":"R5-105","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-247787","title":"addition of subtest selection criteria for DEMOD NR-NTN test case","source":"Qualcomm Inc","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":187,"ainumber":"5.3.7.4","ainame":"TS 38.521-5","tdoc_agenda_sort_order":71491,"status":"agreed","reservation_date":"2024-11-28 19:09:55","uploaded":"2024-11-28 19:11:07","revisionof":"R5-247149","revisedto":"","release":"Rel-18","crspec":"38.521-5","crspecversion":"18.3.0","workitem":[{"winame":"NR_NTN_solutions_plus_CT-UEConTest"}],"crnumber":81.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-242681","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__105_Orlando\/Docs\/R5-247787.zip","group":"R5","meeting":"R5-105","year":2024,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-247800","title":"Updates on defintion of NTN terms and abbreviations","source":"ZTE Corporation, Tejet, SRTC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 28\/11\/2024. Original source : ZTE Corporation, Tejet, SRTC","agenda_item_sort_order":187,"ainumber":"5.3.7.4","ainame":"TS 38.521-5","tdoc_agenda_sort_order":74081,"status":"agreed","reservation_date":"2024-11-28 19:07:28","uploaded":"2024-11-28 19:11:06","revisionof":"R5-247408","revisedto":"","release":"Rel-18","crspec":"38.521-5","crspecversion":"18.3.0","workitem":[{"winame":"NR_NTN_solutions_plus_CT-UEConTest"}],"crnumber":86.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-242681","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5__105_Orlando\/Docs\/R5-247800.zip","group":"R5","meeting":"R5-105","year":2024,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"3.1, 3.3","crsinpack":null,"crsinpacknumber":0}]