[{"name":"R5-203932","title":"Discussion on measurement uncertainty for sTTI test cases","source":"Huawei, Hisilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.5.7","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":39320,"status":"revised","reservation_date":"2020-08-07 06:20:37","uploaded":"2020-08-07 15:22:09","revisionof":"","revisedto":"R5-204955","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_sTTIandPT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203932.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204955","title":"Discussion on measurement uncertainty for sTTI test cases","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.5.7","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":39321,"status":"noted","reservation_date":"2020-09-02 09:26:19","uploaded":"2020-09-02 09:31:17","revisionof":"R5-203932","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_sTTIandPT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204955.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]