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{"name":"R5-192094","title":"Incorporating Test Tolerance into Test requirement for  IM-DLCCH PCFICH-PDCCH Type B TCs","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Agreement","abstract":"Incorporating Test Tolerance into Test requirement for  IM-DLCCH PCFICH-PDCCH Type B TCs","secretary_remarks":"","agenda_item_sort_order":62,"ainumber":"5.3.5.2","ainame":"\tTS 36.521-1","tdoc_agenda_sort_order":209400,"status":"agreed","reservation_date":"2019-02-15 15:02:56","uploaded":"2019-02-16 03:54:24","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.4.0","workitem":[{"winame":"LTE_IM_DLCCH-UEConTest"}],"crnumber":4728.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-190069","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_82_Athens\/Docs\/R5-192094.zip","group":"R5","meeting":"R5-82","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-192096","title":"Incorporating Test Tolerance into Test requirement for  IM-DLCCH PHICH Type A TCs","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Agreement","abstract":"Incorporating Test Tolerance into Test requirement for  IM-DLCCH PHICH Type A TCs","secretary_remarks":"","agenda_item_sort_order":62,"ainumber":"5.3.5.2","ainame":"\tTS 36.521-1","tdoc_agenda_sort_order":209600,"status":"agreed","reservation_date":"2019-02-15 15:05:11","uploaded":"2019-02-16 03:54:24","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.4.0","workitem":[{"winame":"LTE_IM_DLCCH-UEConTest"}],"crnumber":4729.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-190069","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_82_Athens\/Docs\/R5-192096.zip","group":"R5","meeting":"R5-82","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-192098","title":"Incorporating Test Tolerance into Test requirement for  IM-DLCCH PHICH Type B TCs","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Agreement","abstract":"Incorporating Test Tolerance into Test requirement for  IM-DLCCH PHICH Type B TCs","secretary_remarks":"","agenda_item_sort_order":62,"ainumber":"5.3.5.2","ainame":"\tTS 36.521-1","tdoc_agenda_sort_order":209800,"status":"agreed","reservation_date":"2019-02-15 15:07:17","uploaded":"2019-02-16 03:54:24","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.4.0","workitem":[{"winame":"LTE_IM_DLCCH-UEConTest"}],"crnumber":4730.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-190069","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_82_Athens\/Docs\/R5-192098.zip","group":"R5","meeting":"R5-82","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-192100","title":"Incorporating Test Tolerance into Test requirement for  IM-DLCCH PEDPCCH Type A TCs","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Agreement","abstract":"Incorporating Test Tolerance into Test requirement for  IM-DLCCH PEDPCCH Type A TCs","secretary_remarks":"","agenda_item_sort_order":62,"ainumber":"5.3.5.2","ainame":"\tTS 36.521-1","tdoc_agenda_sort_order":210000,"status":"agreed","reservation_date":"2019-02-15 15:09:28","uploaded":"2019-02-16 03:54:24","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.4.0","workitem":[{"winame":"LTE_IM_DLCCH-UEConTest"}],"crnumber":4731.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-190069","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_82_Athens\/Docs\/R5-192100.zip","group":"R5","meeting":"R5-82","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-192102","title":"Test Tolerance and MU update for Interference Mitigation for Downlink Control Channels Demod TCs","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Agreement","abstract":"Test Tolerance and MU update for Interference Mitigation for Downlink Control Channels Demod TCs","secretary_remarks":"","agenda_item_sort_order":62,"ainumber":"5.3.5.2","ainame":"\tTS 36.521-1","tdoc_agenda_sort_order":210200,"status":"agreed","reservation_date":"2019-02-15 15:12:03","uploaded":"2019-02-16 03:54:24","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.4.0","workitem":[{"winame":"LTE_IM_DLCCH-UEConTest"}],"crnumber":4732.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-190069","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_82_Athens\/Docs\/R5-192102.zip","group":"R5","meeting":"R5-82","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]