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{"name":"R5-197777","title":"Addition of TT Analysis for 6.3.1.1+6.3.1.2 NR SA FR1 Intra-Freq Handover","source":"Qualcomm UK Ltd.","contact":"Shahab Mohammad","contact-id":77324,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":77770,"status":"withdrawn","reservation_date":"2019-10-26 04:49:03","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.903","crspecversion":"15.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":89.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-197778","title":"Addition of TT Analysis for 6.3.1.3 NR SA FR1 Inter-Freq Handover","source":"Qualcomm UK Ltd.","contact":"Shahab Mohammad","contact-id":77324,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":77780,"status":"withdrawn","reservation_date":"2019-10-26 04:49:03","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.903","crspecversion":"15.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":90.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-197807","title":"FR1 Test tolerance analysis for interruptions active and non-active","source":"Huawei, HiSilicon, Bureau Veritas","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":78070,"status":"revised","reservation_date":"2019-10-28 06:47:24","uploaded":"2019-10-31 08:10:54","revisionof":"","revisedto":"R5-199362","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":91.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-197807.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-197808","title":"FR1 Test tolerance analysis for interruptions deactivated NR SCC","source":"Huawei, HiSilicon, Bureau Veritas","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":78080,"status":"withdrawn","reservation_date":"2019-10-28 06:47:25","uploaded":"2019-10-31 08:10:54","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":92.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-197808.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-197809","title":"FR1 Test tolerance analysis for interruptions deactivated E-UTRAN SCC","source":"Huawei, HiSilicon, Bureau Veritas","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":78090,"status":"withdrawn","reservation_date":"2019-10-28 06:47:27","uploaded":"2019-10-31 08:10:54","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":93.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-197809.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-197810","title":"FR1 Test tolerance analysis for CSI-RS based RLM","source":"Huawei, HiSilicon, Bureau Veritas","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":78100,"status":"revised","reservation_date":"2019-10-28 06:47:28","uploaded":"2019-10-31 08:10:54","revisionof":"","revisedto":"R5-199363","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":94.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-197810.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-197811","title":"FR1 Test tolerance analysis for interRAT measurement","source":"Huawei, HiSilicon, Bureau Veritas","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":78110,"status":"withdrawn","reservation_date":"2019-10-28 06:47:30","uploaded":"2019-10-31 08:10:54","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":95.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-197811.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198025","title":"MU elements definition for FR2 RRM","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":80250,"status":"withdrawn","reservation_date":"2019-10-31 10:16:39","uploaded":"2019-10-31 10:23:22","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":96.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198025.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198027","title":"FR2 RRM Measurement Accuracy MU","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":80270,"status":"withdrawn","reservation_date":"2019-10-31 10:16:40","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":97.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198054","title":"Editorial corrections to FR1 Test Tolerance files","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"Agreement","abstract":"Update and correct errors in existing Test Tolerance analyses:\n\u2022\tRename the Test Tolerance analysis files for 38.533 4.4.3.1.\n\u2022\tAdd missing Io during T2 in the Test Tolerance analysis.xls for 38.533 4.6.1.1+4.6.1.2+4.6.1.3+4.6.1.4 \n\u2022\tAdd missing condition","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":80540,"status":"revised","reservation_date":"2019-11-01 13:03:10","uploaded":"2019-11-07 18:34:10","revisionof":"","revisedto":"R5-199070","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":98.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198054.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198260","title":"CR to 38.903 to define Reference Methodology for SE","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":82600,"status":"agreed","reservation_date":"2019-11-06 18:44:21","uploaded":"2019-11-08 23:43:42","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":99.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-192464","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198260.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198285","title":"FR1 Test tolerance analysis for interRAT measurement","source":"Huawei, HiSilicon, ANRITSU LTD","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":82850,"status":"agreed","reservation_date":"2019-11-07 03:23:54","uploaded":"2019-11-07 04:00:03","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":100.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-192464","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198285.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198427","title":"Correction to uncertainty budget calculation principles","source":"Samsung R&D Institute UK","contact":"Carolyn Taylor","contact-id":81481,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":84270,"status":"agreed","reservation_date":"2019-11-08 03:27:16","uploaded":"2019-11-08 18:43:48","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":101.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-192464","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198427.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198456","title":"Update on FR2 MUs in 38.903","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":84560,"status":"revised","reservation_date":"2019-11-08 05:25:05","uploaded":"2019-11-23 01:08:00","revisionof":"","revisedto":"R5-199091","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":102.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198456.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198458","title":"Update on FR2 Spurious MUs in 38.903","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":84580,"status":"revised","reservation_date":"2019-11-08 05:25:08","uploaded":"2019-11-09 01:33:33","revisionof":"","revisedto":"R5-199092","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":103.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198458.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198642","title":"FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.1 NR SA FR1 Intra-Freq Handover","source":"Qualcomm UK Ltd.","contact":"Shahab Mohammad","contact-id":77324,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":86420,"status":"revised","reservation_date":"2019-11-08 14:46:50","uploaded":"2019-11-09 06:39:17","revisionof":"","revisedto":"R5-199553","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":104.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198642.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198643","title":"FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.2 NR SA FR1 Intra-Freq Handover","source":"Qualcomm UK Ltd.","contact":"Shahab Mohammad","contact-id":77324,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":86430,"status":"revised","reservation_date":"2019-11-08 14:46:51","uploaded":"2019-11-09 06:39:17","revisionof":"","revisedto":"R5-199554","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":105.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198643.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-198644","title":"FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.3 NR SA FR1 Inter-Freq Handover","source":"Qualcomm UK Ltd.","contact":"Shahab Mohammad","contact-id":77324,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":115,"ainumber":"5.3.5.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":86440,"status":"revised","reservation_date":"2019-11-08 14:46:52","uploaded":"2019-11-09 06:39:17","revisionof":"","revisedto":"R5-199555","release":"Rel-16","crspec":"38.903","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":106.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-198644.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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