[{"name":"R5-196126","title":"Addition of new SIB combination for RRM EN-DC tests","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":109,"ainumber":"5.3.5.","ainame":"\tTS 36.508","tdoc_agenda_sort_order":61260,"status":"withdrawn","reservation_date":"2019-08-14 05:57:41","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-16","crspec":"36.508","crspecversion":"16.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1282.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-84","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]