[{"name":"R5-220322","title":"Adding Reference sensitivity exceptions and MSD test points for Rel-16 inter-band EN-DC FR1 two band combinations","source":"Nokia, Nokia Shanghai Bell","contact":"Tuomo S\u00e4yn\u00e4j\u00e4kangas","contact-id":69937,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":3220,"status":"agreed","reservation_date":"2022-02-08 06:38:11","uploaded":"2022-02-11 10:11:50","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1267.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220322.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220323","title":"Adding reference sensitivity requirements for Rel-16 inter-band EN-DC FR1 two band combinations","source":"Nokia, Nokia Shanghai Bell","contact":"Tuomo S\u00e4yn\u00e4j\u00e4kangas","contact-id":69937,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":3230,"status":"agreed","reservation_date":"2022-02-08 06:38:12","uploaded":"2022-02-11 10:11:50","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1268.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220323.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220380","title":"Introduction of DC_1A-n5A reference sensitivity test requirements","source":"Ericsson","contact":"Mats Johansson","contact-id":38077,"tdoctype":"CR","for":"Agreement","abstract":"TP analysis in  R5-220379.","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":3800,"status":"agreed","reservation_date":"2022-02-08 21:35:29","uploaded":"2022-02-12 02:36:53","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1273.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220380.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220382","title":"Introduction of DC_3A-n5A reference sensitivity test requirements","source":"Ericsson","contact":"Mats Johansson","contact-id":38077,"tdoctype":"CR","for":"Agreement","abstract":"TP analysis in  R5-220381,","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":3820,"status":"agreed","reservation_date":"2022-02-08 21:35:31","uploaded":"2022-02-12 02:36:53","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1274.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220382.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220384","title":"Introduction of DC_7A-n5A reference sensitivity test requirements","source":"Ericsson","contact":"Mats Johansson","contact-id":38077,"tdoctype":"CR","for":"Agreement","abstract":"TP analysis in  R5-220383.","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":3840,"status":"agreed","reservation_date":"2022-02-08 21:35:33","uploaded":"2022-02-12 02:36:53","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1275.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220384.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220387","title":"Introduction of DC_7A-n78A reference sensitivity test requirements","source":"Ericsson","contact":"Mats Johansson","contact-id":38077,"tdoctype":"CR","for":"Agreement","abstract":"TP analysis in  R5-220386.","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":3870,"status":"agreed","reservation_date":"2022-02-08 21:35:36","uploaded":"2022-02-12 02:36:53","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1276.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220387.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220390","title":"Introduction of DC_28A_n7A-n78A reference sensitivity test requirements","source":"Ericsson","contact":"Mats Johansson","contact-id":38077,"tdoctype":"CR","for":"Agreement","abstract":"TP analysis in  R5-220389.","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":3900,"status":"agreed","reservation_date":"2022-02-08 21:35:39","uploaded":"2022-02-12 02:36:53","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1277.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220390.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220759","title":"Introduction of maximum output power test requirements for DC_1A_n5A, DC_1A_n7A, DC_3A_n5A, DC_7A_n5A and DC_28A_n7A","source":"Ericsson","contact":"Mats Johansson","contact-id":38077,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":7590,"status":"agreed","reservation_date":"2022-02-10 13:15:44","uploaded":"2022-02-12 02:36:53","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1290.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220759.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221326","title":"Update for 7.3B.2.0 Min Requirements of Ref sensitivity for EN-DC","source":"Qualcomm Korea","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":13260,"status":"revised","reservation_date":"2022-02-11 18:35:55","uploaded":"2022-02-12 06:33:06","revisionof":"","revisedto":"R5-221773","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1329.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221326.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221329","title":"Update Ref sense for r16 DC combos","source":"Qualcomm Korea","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"TP covered in R5-221327","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":13290,"status":"agreed","reservation_date":"2022-02-11 18:43:02","uploaded":"2022-02-12 06:33:06","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1330.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220086","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221329.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221773","title":"Update for 7.3B.2.0 Min Requirements of Ref sensitivity for EN-DC","source":"Qualcomm Korea","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":120,"ainumber":"5.3.4.5.2","ainame":"Rx Requirements (Clause 7)","tdoc_agenda_sort_order":13261,"status":"agreed","reservation_date":"2022-03-06 15:08:10","uploaded":"2022-03-08 07:51:11","revisionof":"R5-221326","revisedto":"","release":"Rel-17","crspec":"38.521-3","crspecversion":"17.3.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R16-UEConTest"}],"crnumber":1329.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220086","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221773.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]