[{"name":"R5-197759","title":"Addition of test applicabilites for V2X test cases","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"TCs in R5-197752, R5-197755, R5-197757","secretary_remarks":"","agenda_item_sort_order":76,"ainumber":"5.3.4.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":77590,"status":"agreed","reservation_date":"2019-10-25 16:11:26","uploaded":"2019-10-31 09:16:55","revisionof":"","revisedto":"","release":"Rel-16","crspec":"36.521-2","crspecversion":"16.2.0","workitem":[{"winame":"LTE_V2X-UEConTest"}],"crnumber":881.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-192461","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_85_Reno\/Docs\/R5-197759.zip","group":"R5","meeting":"R5-85","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]