[{"name":"R5-172307","title":"Update to the Dual Connectivity performance test cases","source":"LG Electronics","contact":"Changsoo Lee","contact-id":59602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":60,"ainumber":"5.3.4.2","ainame":"\tTS 36.521-1","tdoc_agenda_sort_order":23070,"status":"agreed","reservation_date":"2017-05-04 02:57:49","uploaded":"2017-05-06 07:13:38","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.521-1","crspecversion":"14.2.0","workitem":[{"winame":"LTE_SC_enh_dualC-UEConTest"}],"crnumber":"3488","crrevision":"","crcategory":"F","tsg_crp":"RP-171337","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_75_Hangzhou\/Docs\/R5-172307.zip","group":"R5","meeting":"R5-75","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]