[{"name":"R5-182666","title":"Addition of test frequency of CA_40E","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":53,"ainumber":"5.3.4.1","ainame":"TS 36.508","tdoc_agenda_sort_order":26660,"status":"agreed","reservation_date":"2018-05-11 03:30:20","uploaded":"2018-05-11 10:26:59","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.508","crspecversion":"15.1.0","workitem":[{"winame":"LTE_CA_R14-UEConTest"}],"crnumber":1158.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-180699","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182666.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]