[{"name":"R5-220966","title":"Discussion on test cases about EN-DC with 3UL (2CC LTE, 1CC NR)","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"discussion","for":"Discussion","abstract":"\"Associated CR R5-220962, 0963, 0964, 0965, 0967, 0968\nQC comment to TC CR R5-220962, 0963, 0964\"","secretary_remarks":"","agenda_item_sort_order":525,"ainumber":"5.3.37.6","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":9660,"status":"noted","reservation_date":"2022-02-11 07:39:36","uploaded":"2022-02-11 10:23:00","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"DC_Pcmax_3UL_CC-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220966.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]