[{"name":"R5-210935","title":"Discussion about REFSENS for SUL testing for 3CC","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"discussion","for":"Discussion","abstract":"CR in R5-210934","secretary_remarks":"","agenda_item_sort_order":441,"ainumber":"5.3.31.11","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":9350,"status":"noted","reservation_date":"2021-02-08 04:13:01","uploaded":"2021-02-08 11:49:26","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R17-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210935.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]