[{"name":"R5-213095","title":"Adding test applicability for new test cases introduced in R17","source":"Huawei, HiSilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":430,"ainumber":"5.3.30.7","ainame":"TS 38.522","tdoc_agenda_sort_order":309500,"status":"agreed","reservation_date":"2021-05-07 09:58:16","uploaded":"2021-05-08 06:30:44","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.522","crspecversion":"17.0.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R17-UEConTest"}],"crnumber":78.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-211030","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_91_Electronic\/Docs\/R5-213095.zip","group":"R5","meeting":"R5-91-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]