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{"name":"R5-173230","title":"Test Tolerance analysis for TS 36.521-3 Test case 8.22.7 and 8.22.8","source":"Huawei, Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":56,"ainumber":"5.3.3.5","ainame":"\tTR 36.903 (E-UTRAN RRM TT analyses)","tdoc_agenda_sort_order":27301,"status":"agreed","reservation_date":"2017-06-05 17:32:47","uploaded":"2017-06-05 17:37:56","revisionof":"R5-172730","revisedto":"","release":"Rel-13","crspec":"36.903","crspecversion":"13.1.0","workitem":[{"winame":"LTE_SC_enh_L1-UEConTest"}],"crnumber":"0345","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-171336","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_75_Hangzhou\/Docs\/R5-173230.zip","group":"R5","meeting":"R5-75","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]