[{"name":"R5-170790","title":"Update to Test Tolerance analysis for the Test cases 9.1.29 and 9.1.30","source":"LG Electronics","contact":"Changsoo Lee","contact-id":59602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":40,"ainumber":"5.3.3.5","ainame":"\tTR 36.903 (E-UTRAN RRM TT analyses)","tdoc_agenda_sort_order":7900,"status":"agreed","reservation_date":"2017-02-02 08:50:18","uploaded":"2017-02-03 12:24:44","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.903","crspecversion":"13.0.0","workitem":[{"winame":"LTE_SC_enh_L1-UEConTest"}],"crnumber":310.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-170068","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_74_Athens\/Docs\/R5-170790.zip","group":"R5","meeting":"R5-74","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]