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{"name":"R5-155206","title":"Add Test Tolerance analysis for 3DL E-UTRA for Carrier Aggregation RSRP Accuracy Test cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"","abstract":"Adds Test Tolerance analysis","secretary_remarks":"","agenda_item_sort_order":33,"ainumber":"5.3.3.5","ainame":"\tTR 36.903 (E-UTRAN RRM TT analyses)","tdoc_agenda_sort_order":52060,"status":"agreed","reservation_date":"2015-11-03 08:41:49","uploaded":"2015-11-05 18:01:11","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.903","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"0225","crrevision":"","crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155206.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155208","title":"Add Test Tolerance analysis for 3DL E-UTRA for Carrier Aggregation RSRQ Accuracy Test cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"","abstract":"Adds Test Tolerance analysis","secretary_remarks":"","agenda_item_sort_order":33,"ainumber":"5.3.3.5","ainame":"\tTR 36.903 (E-UTRAN RRM TT analyses)","tdoc_agenda_sort_order":52080,"status":"agreed","reservation_date":"2015-11-03 08:49:49","uploaded":"2015-11-05 18:01:11","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.903","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"0226","crrevision":"","crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155208.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155418","title":"Addition of Test Tolerance analysis for 3DL E-UTRA for Carrier Aggregation RSRP Accuracy Test cases","source":"LG Electronics Inc.","contact":"Joongsun Park","contact-id":53561,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":33,"ainumber":"5.3.3.5","ainame":"\tTR 36.903 (E-UTRAN RRM TT analyses)","tdoc_agenda_sort_order":54180,"status":"agreed","reservation_date":"2015-11-05 09:30:11","uploaded":"2015-11-06 14:24:25","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.903","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"0227","crrevision":"","crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155418.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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