[{"name":"R5-155180","title":"Update to RSRP accuracy test cases for FDD-TDD CA","source":"QUALCOMM UK Ltd","contact":"Mayur Vora","contact-id":46658,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":51800,"status":"revised","reservation_date":"2015-11-02 17:25:57","uploaded":"2015-11-06 17:04:27","revisionof":"","revisedto":"R5-155862","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1284","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155180.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155204","title":"Uncertainties and Test Tolerances for 3DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX Test cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"","abstract":"Adds uncertainties and Test Tolerances","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":52040,"status":"revised","reservation_date":"2015-11-03 08:37:27","uploaded":"2015-11-05 18:01:11","revisionof":"","revisedto":"R5-155878","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1288","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155204.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155207","title":"Uncertainties and Test Tolerances for 3DL E-UTRA for Carrier Aggregation RSRP Accuracy Test cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"","abstract":"Adds uncertainties and Test Tolerances","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":52070,"status":"revised","reservation_date":"2015-11-03 08:45:26","uploaded":"2015-11-05 18:01:11","revisionof":"","revisedto":"R5-156032","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1289","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155207.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155209","title":"Uncertainties and Test Tolerances for 3DL E-UTRA for Carrier Aggregation RSRQ Accuracy Test cases","source":"ANRITSU LTD, ZTE","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"","abstract":"Adds uncertainties and Test Tolerances","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":52090,"status":"revised","reservation_date":"2015-11-03 08:54:05","uploaded":"2015-11-05 18:01:12","revisionof":"","revisedto":"R5-155879","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1290","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155209.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155303","title":"Update of message contents for 3DL CA RSRP and RSRQ Accuracy tests","source":"CMCC","contact":"Jinqiang Xing","contact-id":62081,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":53030,"status":"revised","reservation_date":"2015-11-04 10:04:24","uploaded":"2015-11-06 06:52:48","revisionof":"","revisedto":"R5-155863","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1299","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155303.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155375","title":"Correction to message contents for RRM 3DL CA TC 9.2.41","source":"ZTE Corporation","contact":"Carolyn Taylor","contact-id":19440,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":53750,"status":"withdrawn","reservation_date":"2015-11-04 19:15:07","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1302","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155376","title":"Corrections to message contents for RRM 3DL CA TCs 8.16.27+8.16.28","source":"ZTE Corporation","contact":"Carolyn Taylor","contact-id":19440,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":53760,"status":"withdrawn","reservation_date":"2015-11-04 19:17:07","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1303","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155427","title":"Uncertainties and Test Tolerances for 3DL FDD RSRP for E-UTRAN in Carrier Aggregation","source":"LG Electronics Inc.","contact":"Joongsun Park","contact-id":53561,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54270,"status":"agreed","reservation_date":"2015-11-05 09:47:29","uploaded":"2015-11-06 14:24:27","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1305","crrevision":"","crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155427.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155428","title":"Update to 3DL FDD RSRP for E-UTRAN in Carrier Aggregation","source":"LG Electronics Inc.","contact":"Joongsun Park","contact-id":53561,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54280,"status":"withdrawn","reservation_date":"2015-11-05 09:48:49","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1306","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155429","title":"Update to 3DL PCell in FDD RSRQ for E-UTRAN in Carrier Aggregation","source":"LG Electronics Inc.","contact":"Joongsun Park","contact-id":53561,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54290,"status":"agreed","reservation_date":"2015-11-05 09:50:22","uploaded":"2015-11-07 02:34:20","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1307","crrevision":"","crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155429.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155435","title":"Update of Annex E for 3DL CA RRM","source":"Anritsu","contact":"Takahiko Sato","contact-id":31320,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54350,"status":"revised","reservation_date":"2015-11-05 10:32:40","uploaded":"2015-11-07 05:32:52","revisionof":"","revisedto":"R5-156033","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1308","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155435.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155436","title":"Correction to test applicability in 3DL CA RRM test cases","source":"Anritsu","contact":"Takahiko Sato","contact-id":31320,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54360,"status":"revised","reservation_date":"2015-11-05 10:32:40","uploaded":"2015-11-07 05:32:52","revisionof":"","revisedto":"R5-155864","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1309","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155436.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155437","title":"Removable of wait time after activation of Scell","source":"Anritsu","contact":"Takahiko Sato","contact-id":31320,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54370,"status":"agreed","reservation_date":"2015-11-05 10:32:41","uploaded":"2015-11-07 05:32:52","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1310","crrevision":"","crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155437.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155438","title":"Correction to 3DL CA RSRP\/RSRQ test cases","source":"Anritsu","contact":"Takahiko Sato","contact-id":31320,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54380,"status":"revised","reservation_date":"2015-11-05 10:32:41","uploaded":"2015-11-07 05:32:52","revisionof":"","revisedto":"R5-156034","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1311","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155438.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155472","title":"Correction to message contents for RRM 3DL CA TC 9.2.41","source":"ZTE Corporation","contact":"Carolyn Taylor","contact-id":19440,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54720,"status":"not pursued","reservation_date":"2015-11-05 13:36:47","uploaded":"2015-11-06 13:11:03","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1313","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155472.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155473","title":"Corrections to message contents for RRM 3DL CA TCs 8.16.27+8.16.28","source":"ZTE Corporation","contact":"Carolyn Taylor","contact-id":19440,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54730,"status":"not pursued","reservation_date":"2015-11-05 13:38:39","uploaded":"2015-11-06 13:11:03","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1314","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155473.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155484","title":"Clarification on frequency swapping and references to connection diagrams in 3DL CA RRM test cases","source":"Rohde & Schwarz","contact":"Bledar Karajani","contact-id":41759,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54840,"status":"revised","reservation_date":"2015-11-05 14:21:08","uploaded":"2015-11-06 22:43:06","revisionof":"","revisedto":"R5-155866","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1315","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155484.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155485","title":"Addition of missing applicability release to test case 9.2.39","source":"Rohde & Schwarz","contact":"Bledar Karajani","contact-id":41759,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54850,"status":"revised","reservation_date":"2015-11-05 14:21:08","uploaded":"2015-11-06 16:00:37","revisionof":"","revisedto":"R5-155867","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1316","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155485.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155486","title":"Addition of cell configuration mappings for 3CC DL CA RRM test cases","source":"Rohde & Schwarz","contact":"Bledar Karajani","contact-id":41759,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54860,"status":"withdrawn","reservation_date":"2015-11-05 14:21:08","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1317","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155579","title":"Introduction of new 3DL CA RRM test case TC 8.16.41 \u201c3 DL FDD CA activation and deactivation of unknown SCell in non-DRX\u201d","source":"7LAYERS GmbH","contact":"Mohamed El-fikri","contact-id":46721,"tdoctype":"CR","for":"Agreement","abstract":"Work item for \u201cFurther Rel-12 Configurations for LTE Advanced Carrier Aggregation with 3DL\u201d requirers testing of RRM requirement A.8.16.41 from 3GPP TS 36.133. Intetion of this CR is to introduce the appropriate test case TC 8.16.41 for \u201c3 DL FDD CA activ","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":55790,"status":"revised","reservation_date":"2015-11-06 12:32:29","uploaded":"2015-11-06 16:15:26","revisionof":"","revisedto":"R5-155868","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1320","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155579.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155589","title":"Uncerts and Test Tols for TCs 8.16.31+8.16.32+8.16.33+8.16.34 36.521-3 CR","source":"Huawei, Anritsu","contact":"Xiang Li","contact-id":56874,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":55890,"status":"revised","reservation_date":"2015-11-06 13:33:37","uploaded":"2015-11-07 08:01:35","revisionof":"","revisedto":"R5-155880","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1321","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155589.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155662","title":"Updating 3DL CA test cases 8.16.29 and 8.16.30","source":"Ericsson LM","contact":"Fredrik Sundstr\u00f6m","contact-id":41388,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":56620,"status":"revised","reservation_date":"2015-11-06 17:56:49","uploaded":"2015-11-06 19:32:02","revisionof":"","revisedto":"R5-155869","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1327","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155662.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155680","title":"Adding new RRM test case 8.16.35 for 3DL CA","source":"Ericsson LM","contact":"Fredrik Sundstr\u00f6m","contact-id":41388,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":56800,"status":"agreed","reservation_date":"2015-11-06 19:20:28","uploaded":"2015-11-06 19:32:02","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1328","crrevision":"","crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155680.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155681","title":"Adding new RRM test case 8.16.36 for 3DL CA","source":"Ericsson LM","contact":"Fredrik Sundstr\u00f6m","contact-id":41388,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":56810,"status":"agreed","reservation_date":"2015-11-06 19:23:38","uploaded":"2015-11-06 19:32:02","revisionof":"","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1329","crrevision":"","crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155681.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155862","title":"Update to RSRP accuracy test cases for FDD-TDD CA","source":"QUALCOMM UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":51801,"status":"agreed","reservation_date":"2015-11-24 16:27:33","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155180","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1284","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155862.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155863","title":"Update of message contents for 3DL CA RSRP and RSRQ Accuracy tests","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":53031,"status":"agreed","reservation_date":"2015-11-24 16:27:33","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155303","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1299","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155863.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155864","title":"Correction to test applicability in 3DL CA RRM test cases","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54361,"status":"agreed","reservation_date":"2015-11-24 16:27:34","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155436","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1309","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155864.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155866","title":"Clarification on frequency swapping and references to connection diagrams in 3DL CA RRM test cases","source":"Rohde & Schwarz","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54841,"status":"agreed","reservation_date":"2015-11-24 16:27:34","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155484","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1315","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155866.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155867","title":"Addition of missing applicability release to test case 9.2.39","source":"Rohde & Schwarz","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54851,"status":"agreed","reservation_date":"2015-11-24 16:27:34","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155485","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1316","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155867.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155868","title":"Introduction of new 3DL CA RRM test case TC 8.16.41 \u201c3 DL FDD CA activation and deactivation of unknown SCell in non-DRX\u201d","source":"7LAYERS GmbH","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":55791,"status":"agreed","reservation_date":"2015-11-24 16:27:34","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155579","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1320","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155868.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155869","title":"Updating 3DL CA test cases 8.16.29 and 8.16.30","source":"Ericsson LM","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":56621,"status":"agreed","reservation_date":"2015-11-24 16:27:35","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155662","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1327","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155869.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155878","title":"Uncertainties and Test Tolerances for 3DL CA Event Triggered Reporting under Deactivated SCells in Non-DRX Test cases","source":"ANRITSU LTD","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":52041,"status":"agreed","reservation_date":"2015-11-24 16:27:37","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155204","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1288","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155878.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155879","title":"Uncertainties and Test Tolerances for 3DL E-UTRA for Carrier Aggregation RSRQ Accuracy Test cases","source":"ANRITSU LTD, ZTE","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":52091,"status":"agreed","reservation_date":"2015-11-24 16:27:37","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155209","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1290","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155879.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-155880","title":"Uncerts and Test Tols for TCs 8.16.31+8.16.32+8.16.33+8.16.34 36.521-3 CR","source":"Huawei, Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":55891,"status":"agreed","reservation_date":"2015-11-24 16:27:37","uploaded":"2016-10-27 10:31:04","revisionof":"R5-155589","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1321","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-155880.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-156032","title":"Uncertainties and Test Tolerances for 3DL E-UTRA for Carrier Aggregation RSRP Accuracy Test cases","source":"ANRITSU LTD","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":52071,"status":"agreed","reservation_date":"2015-11-24 16:31:55","uploaded":"2016-10-27 10:31:06","revisionof":"R5-155207","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1289","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-156032.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-156033","title":"Update of Annex E for 3DL CA RRM","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54351,"status":"agreed","reservation_date":"2015-11-24 16:31:56","uploaded":"2016-10-27 10:31:06","revisionof":"R5-155435","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1308","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-156033.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-156034","title":"Correction to 3DL CA RSRP\/RSRQ test cases","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":32,"ainumber":"5.3.3.4","ainame":"\tTS 36.521-3","tdoc_agenda_sort_order":54381,"status":"agreed","reservation_date":"2015-11-24 16:31:56","uploaded":"2016-10-27 10:31:06","revisionof":"R5-155438","revisedto":"","release":"Rel-12","crspec":"36.521-3","crspecversion":"12.7.0","workitem":[{"winame":"LTE_CA_Rel12_3DL-UEConTest"}],"crnumber":"1311","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-151700","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5_69_Anaheim\/Docs\/R5-156034.zip","group":"R5","meeting":"R5-69","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]