[{"name":"R5-226916","title":"Updating test applicability for TxD test cases","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":401,"ainumber":"5.3.24.4","ainame":"TS 38.522","tdoc_agenda_sort_order":69160,"status":"revised","reservation_date":"2022-04-11 08:48:16","uploaded":"2022-11-04 14:55:00","revisionof":"","revisedto":"R5-228040","release":"Rel-17","crspec":"38.522","crspecversion":"17.6.0","workitem":[{"winame":"NR_RF_TxD-UEConTest"}],"crnumber":229.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_97_Toulouse\/Docs\/R5-226916.zip","group":"R5","meeting":"R5-97","year":2022,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-228040","title":"Updating test applicability for TxD test cases","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":401,"ainumber":"5.3.24.4","ainame":"TS 38.522","tdoc_agenda_sort_order":69161,"status":"agreed","reservation_date":"2022-11-23 15:52:40","uploaded":"2022-11-23 16:01:18","revisionof":"R5-226916","revisedto":"","release":"Rel-17","crspec":"38.522","crspecversion":"17.6.0","workitem":[{"winame":"NR_RF_TxD-UEConTest"}],"crnumber":229.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-222767","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_97_Toulouse\/Docs\/R5-228040.zip","group":"R5","meeting":"R5-97","year":2022,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]