[{"name":"R5-252303","title":"Addition of test tolerance analysis for 4.5.3.11 SCell activation of SSB-less Cell","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 5\/9\/2025. Original source : Huawei, HiSilicon","agenda_item_sort_order":391,"ainumber":"5.3.23.6","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":23030,"status":"revised","reservation_date":"2025-08-05 09:30:23","uploaded":"2025-05-09 13:18:30","revisionof":"","revisedto":"R5-253566","release":"Rel-18","crspec":"38.903","crspecversion":"18.6.0","workitem":[{"winame":"Netw_Energy_NR-UEConTest"}],"crnumber":1000.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__107_Malta\/Docs\/R5-252303.zip","group":"R5","meeting":"R5-107","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"8","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-252777","title":"Test Tolerance analysis for intra-frequency NES triggering conditional handover test case 7.3.3.3","source":"Ericsson","contact":"Kuba Kolodziej","contact-id":76956,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 5\/9\/2025. Original source : Ericsson","agenda_item_sort_order":391,"ainumber":"5.3.23.6","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":27770,"status":"agreed","reservation_date":"2025-09-05 12:47:02","uploaded":"2025-05-09 17:28:42","revisionof":"","revisedto":"","release":"Rel-18","crspec":"38.903","crspecversion":"18.6.0","workitem":[{"winame":"Netw_Energy_NR-UEConTest"}],"crnumber":1017.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-251085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__107_Malta\/Docs\/R5-252777.zip","group":"R5","meeting":"R5-107","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"8","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-253566","title":"Addition of test tolerance analysis for 4.5.3.11 SCell activation of SSB-less Cell","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":391,"ainumber":"5.3.23.6","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":23031,"status":"agreed","reservation_date":"2025-05-28 16:12:25","uploaded":"2025-05-28 16:21:10","revisionof":"R5-252303","revisedto":"","release":"Rel-18","crspec":"38.903","crspecversion":"18.6.0","workitem":[{"winame":"Netw_Energy_NR-UEConTest"}],"crnumber":1000.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-251085","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__107_Malta\/Docs\/R5-253566.zip","group":"R5","meeting":"R5-107","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"8","crsinpack":null,"crsinpacknumber":0}]