[{"name":"R5-201327","title":"Discussion on AP 85.25 ACLR metric change","source":"Qualcomm Finland RFFE Oy","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Discussion","abstract":"The purpose of this paper is to share Qualcomm data on AP#85.25. This discussion paper provides Qualcomm\u2019s internal ACLR measurement test data comparing Peak EIRP based ACLR and TRP based ACLR results.\n\nObservation 1: The Peak EIRP ACLR can be \u201cliberal\u201d compared to TRP ACLR by 1dB to 2dB.\nObservation 2: Compared to the ACLR TRP (relative) limit of 17dB, both Peak EIRP based and TRP based ACLR pass by significant margin. \nObservation 3: In general Qualcomm view is that ACLR test optimization can be achieved by using Peak EIRP as a test metric. \nProposal 1: Use \u201cACLR test metric change MU element = [2dB]\u201d as a systematic error in [Total MU]. This can be refined further based on any other inputs.\nProposal 2: Adopt Peak EIRP as a test metric for FR2 ACLR testing to determine pass\/fail as follows: If [Peak EIRP ACLR + Total MU) < ACLR TRP limit] then conclude FR2 ACLR test pass or else conclude fail.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":13270,"status":"revised","reservation_date":"2020-04-24 23:50:01","uploaded":"2020-05-08 22:51:17","revisionof":"","revisedto":"R5-202842","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201327.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201468","title":"MBR impact on testability","source":"NTT DOCOMO, INC.","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"The definition of MBR (Multi band relaxation) was discussed and updated in core specification [1] during RAN4#94-bis (Apr-2020) by [2], [3]. On the other hand, this MBR value is considered in RAN5 testability discussions. The purpose of this contribution is to discuss this MBR updates impact on RAN5 testability issues.\nProposal 1\t: To apply following MBR values (as worst case) to estimate testability for each test case.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":14680,"status":"noted","reservation_date":"2020-04-30 01:09:03","uploaded":"2020-05-08 04:20:35","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201468.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201476","title":"MU and TT for MOP spherical coverage for Intra-band contiguous CA","source":"NTT DOCOMO INC.","contact":"Takashi Akao","contact-id":83320,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated with CR R5-201453.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":14760,"status":"noted","reservation_date":"2020-05-01 01:08:12","uploaded":"2020-05-08 10:10:48","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201476.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201603","title":"On the QoQZ validation procedure for enhanced IFF","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Endorsement","abstract":"RRM FR2 MU","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":16030,"status":"revised","reservation_date":"2020-05-05 13:07:28","uploaded":"2020-05-08 16:46:32","revisionof":"","revisedto":"R5-202704","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201603.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201605","title":"RRM FR2 MU: Representative test case 7.7.1.1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Endorsement","abstract":"In RAN5 #86-e, the list of representative RRM test cases was agreed in [1]. This contribution will analyze one of the test cases of the list, f) Test case 7.7.1.1 Intra-frequency SS-RSRP Accuracy.\n7.7.1.1 is based on TS 38.133 Test Case A.7.7.1.1 [2], copied below for reference.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":16050,"status":"revised","reservation_date":"2020-05-05 13:07:34","uploaded":"2020-05-08 07:47:12","revisionof":"","revisedto":"R5-202843","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201605.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201818","title":"Review on test point analysis","source":"NTT DOCOMO, INC.","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":18180,"status":"noted","reservation_date":"2020-05-07 05:36:14","uploaded":"2020-05-08 04:20:35","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201818.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201819","title":"On RRM inter-frequency tests in narrow NR bands","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":18190,"status":"withdrawn","reservation_date":"2020-05-07 05:40:00","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.533","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":632.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201839","title":"On RRM inter-frequency tests in narrow NR bands","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Endorsement","abstract":"RRM inter-frequency test cases need multiple (for NR, maximum two) cells to be allocated in the same band. Considering the current NR FR1 test configurations for RRM, we have two possibilities:\n\u2022\tFor 10 MHz BW, inter-frequency tests need 10+10 = 20 MHz available BW in the band.\n\u2022\tFor 40 MHz BW (only TDD), inter-frequency tests need 40+40 = 80 MHz available BW in the band.\nNot all the NR bands are wide enough to allocate two inter-frequency cells. According to [1], the following NR bands do not have the necessary BW to support inter-frequency tests with the current test configuration: [..]\nProposal 1: Define the auxiliary bands for each of the narrow bands identified above and use the auxiliary band for the serving cell for NR SA tests.\nProposal 2: Send an LS to RAN4 informing them of the potential issue for EN-DC tests for the bands identified above and ask them whether they are planning to enable inter-frequency testing for these bands with 5 MHz test configurations.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":18390,"status":"noted","reservation_date":"2020-05-07 06:14:19","uploaded":"2020-05-08 07:47:13","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.533","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201839.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201840","title":"Discussion on testing of 4Rx vs 2Rx in FR1","source":"Huawei, CAICT, OPPO, Samsung, Bureau Veritas, Sporton, Ericsson, Anritsu, AT&T, Keysight, CMCC, Dish, Telecom Italia, Orange, Rohde&Schwarz","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Discussion","abstract":"CR in R5-201841, R5-201842, R5-201843\nProposal 1: 2Rx RF requirements can be skipped for all Rx test cases on the bands that UE is equipped with 4Rx in FR1 SA.\nProposal 1a: Whether to verify 2Rx REFSENS requirements with 4Rx capable UE with only two Rx antennas connected to test equipment keeps FFS until testability issues are concluded.\nProposal 2: Specify the test principle of NR NSA as in below table [].","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":18400,"status":"revised","reservation_date":"2020-05-07 06:53:54","uploaded":"2020-05-08 09:44:19","revisionof":"","revisedto":"R5-202811","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201840.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201852","title":"On ACLR test metric for FR2 related to AP 85.25","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Discussion","abstract":"RAN5 has agreed the WP for ACLR test in RAN5#85.\nBased on the discussion, please RAN5 considers the proposal below:\nProposal 1: For ACLR testing, use EIRP as the replacement of TRP.\nProposal 2: Consider an MU contributor ranges in +\/-0.6dB when the MU analysis of ACLR is changed from TRP to EIRP.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":18520,"status":"revised","reservation_date":"2020-05-07 06:54:05","uploaded":"2020-05-08 16:25:50","revisionof":"","revisedto":"R5-202844","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201852.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201869","title":"Discussion on test point analysis for spurious emission UE co-existence per EN-DC configuration","source":"Huawei,Hisilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"discussion","for":"Discussion","abstract":"CRs R5-201871-5\nDuring the last meeting RAN5#86-e (Feb.-2020), a portion of EN-DC configurations have been marked as 100% completed. However, the default test setting as defined in TS 38.521-3 is not perfect enough to ensure that all protected bands of each EN-DC configuration can be tested in term of spurious emission band UE co-existence. Consequently, the current test configuration of TS 38.521-3 is actually incomplete for spurious emission band UE co-existence. \nThe purpose of this contribution is to illustrate why additional test setting needs to be analysed per inter-band EN-DC configuration so that all protected bands can be covered by the configured testing points in TX spurious emission test cases.\nFor spurious emission testing for EN-DC configuration, it is proposed RAN5 consider below proposals.\nProposal 1: For each inter-band EN-DC configuration, always analyse intermodulation frequency range of each protected band to derive additional test points so that all protected bands can be covered and the redundant test points are removed.\nProposal 2: Select 1RB allocation with accurate calculation for each test point.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":18690,"status":"noted","reservation_date":"2020-05-07 07:31:27","uploaded":"2020-05-08 10:01:27","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201869.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201919","title":"Discussion on how to update TS 38.522","source":"China Mobile, Bureau Veritas, Huawei, Hisilicon, TTA, Sporton","contact":"Dan Song","contact-id":75340,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1: To add TDD-TDD PC2 inter-band EN-DC UE RF Baseline implementation Capabilities declaration in TS 38.508-2. To update the \u201cCA\u201d into \u201cCA\/DC\u201d in both Table 4.0-3 and the corresponding column title of Table 4.1.3-1 in TS 38.522.\nProposal 2: To add NOTE at the bottom of Table 4.1.1-1 to indicate how to skip TS 38.521-1 2Rx test cases. To add NOTE at the bottom of Table 4.1.3-1 to indicate how to skip TS 38.521-3 2Rx test cases.\nProposal 3: The test cases addressed by different WIs shall be added into TS 38.522 by different jumbo CRs with corresponding different work Item codes rather just one jumbo.\nProposal 4: To keep the \u201cAdditional Information\u201d for TC 6.5.3.1 as it is in TS 38.522-g30.\nProposal 5: To add NOTE to the \u201cAdditional Information\u201d of TC 6.2.2 (MPR), TC 6.5.2.2 (SEM), TC 6.5.2.4.1 (NR ACLR) as well as to the bottom of Table 4.1.1-1 to indicate all the three test cases need to be implemented under the same optimization status of UE.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":19190,"status":"revised","reservation_date":"2020-05-07 07:36:21","uploaded":"2020-05-09 05:49:45","revisionof":"","revisedto":"R5-202919","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201919.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202082","title":"Discussion on size of Quiet Zone above 30cm","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CRs in R5-202083, R5-202084, R5-202085\nFollowing the discussion in previous meetings regarding QZ sizes bigger than 30cm in diameter, we present here our views on the next steps.\nThis is a resubmission of draft shared before RAN5 #86-e meeting with additional data from a device survey.\nIn this contribution, the following observations and proposals were made:\nObservation 1: The attempt to cover all possible devices sizes with a discrete number of QZ sizes is not a sustainable approach.\nObservation 2: ~81% of the devices in the available dataset are covered with a 50cm QZ.\nProposal 1: Select 50cm as the QZ size to test devices larger than current QZ limited to 30cm.\nProposal 2: OEM and operators to provide data on NR FR2 devices size.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":20820,"status":"noted","reservation_date":"2020-05-07 17:23:42","uploaded":"2020-05-09 07:16:38","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202082.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202115","title":"On Beam Peak Searches for different test configurations","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution addresses the need to perform TX and RX beam peak searches for different test configurations.\n\nThe following observations and proposals were made in this contribution\nObservation 1: Whether the beam peak searches need to be performed for every test condition has not been decided yet.\nObservation 2: Beam peak searches under ETC are discussed elsewhere and not addressed in this contribution.\nProposal 1: Perform beam peak searches for every test frequency range by default unless the device manufacturer explicitly declares that the beam peak at the mid test frequency range is applicable for the remaining (low, high) test frequency ranges.\nProposal 2: Beam peak search results cannot be re-used across different bands that do not overlap.\nProposal 3: Based on an explicit vendor declaration, allow beam peak search results to be re-used from bands that completely contain the target bands.\nProposal 4: Perform beam peak searches for every CBW by default unless the device manufacturer explicitly declares that the beam peak at the highest supported CBW is applicable for the remaining CBWs.\nProposal 5: Chipset vendors\/OEMs to provide feedback whether different waveforms and modulations could yield different beam peak directions","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21150,"status":"revised","reservation_date":"2020-05-08 00:06:16","uploaded":"2020-05-08 23:08:17","revisionof":"","revisedto":"R5-202939","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202115.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202116","title":"On Beam Peak Searches for Intra-Band Contiguous CA","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution addresses the need to perform TX and RX beam peak searches for Intra-Band Contiguous CA test cases.\nFor Intra-Band Contiguous CA test cases, it is currently assumed that tests are performed at the beam peak of the aggregated CBW.\n\n3.6.3 Applicability for intra-band FR2 \nFor the requirements in RRC connected state specified in this version of the specification, UE shall assume that the transmitted signals from the serving cells should have the same downlink spatial domain transmission filter on one OFDM symbol in the same band in FR2. Otherwise, the UE is not supposed to satisfy any requirements for SCell.\n\nThe safest approach would be to mandate a separate beam peak search for aggregated intra-band contiguous combinations. However, due to the long test times of these scans, a re-use of beam peak directions should be allowed if applicable. \nIt is therefore proposed to perform beam peak searches for every intra-band contiguous combination by default unless the device manufacturer explicitly declares that the beam peak at the single carrier is applicable for the intra-band contiguous combination. \nProposal 1: Perform a beam peak search for every intra-band contiguous combination by default unless the device manufacturer explicitly declares that the beam peak at the single carrier is applicable for the intra-band contiguous combination.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21160,"status":"revised","reservation_date":"2020-05-08 00:06:17","uploaded":"2020-05-08 23:08:17","revisionof":"","revisedto":"R5-202920","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202116.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202117","title":"On UBF for Intra-Band Carrier Aggregation","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution is discussing the need to further clarify the UBF, defined in 38.509, and the need to augment the applicability of the UBF for Carrier Aggregation (CA).\nThe following observations and proposals were made in this contribution\nObservation 1: For testing beyond Rel-15, an extension of the UBF might be required that allows the locking of beams for different CCs independently\nProposal 1: OEMs and chipset vendors to confirm that upon UBF activation, the TX, RX, and TX&RX beams for all aggregated CCs are locked for intra-band combinations (either contiguous or non-contiguous).\nProposal 2: Augment the UBF definition in [1] to highlight that the UBF activation applies to all intra-band CCs","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21170,"status":"noted","reservation_date":"2020-05-08 00:06:17","uploaded":"2020-05-08 23:08:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202117.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202124","title":"On PC1 MUs","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution reviews the MU elements and values for PC1 devices.\nThe following observations and proposals were made in this contribution\nProposal 1: define the PC1 MU element \u201cInfluence of TRP measurement grid\u201d with a standard uncertainty of 0.25dB with the systematic error of PC1 MU element \u201cSystematic error due to TRP calculation\/quadrature\u201d set to 0\nProposal 2: define the systematic error of PC1 MU element \u201cSystematic error related to beam peak search\u201d to be 0.7dB.\nProposal 3: define the PC1 MU element \u201cInfluence of spherical coverage grid\u201d with a standard uncertainty of 0.05dB with the systematic error of PC1 MU element \u201cSystematic error related to EIS spherical coverage\u201d set to 0.2dB\nProposal 4: Use the existing QoQZ validations outlined in [4], specifically Annex O, for PC1 devices\nProposal 5: Apply the QoQZ MU values agreed for PC3 [5] to PC1\nProposal 6: define the standard uncertainty of the \u201cPositioning misalignment\u201d MU element for PC1 to be 0.02dB\nProposal 7: define the standard uncertainty of the \u201cDUT repositioning\u201d MU element for PC1 to be 0.35dB for EIRP and EIS metrics\nProposal 8: Re-evaluate the MU values for the following list of MU elements for PC1: Uncertainty of the RF power measurement equipment, gNB emulator uncertainty, Mismatch, Amplifier Uncertainties, Insertion Loss Variation, RF leakage (from measurement antenna to the receiver\/transmitter)\nProposal 9: Create an Action Point to UE vendors to provide an acceptable PC1 assumption for the CDF curve for MOP EIRP spherical coverage\nProposal 10: Re-Use the MU values from PC3 for the following list of MU elements for PC1: Measure Distance Uncertainty, Standing wave between the DUT and measurement antenna, Phase curvature, Random Uncertainty, Influence of XPD, , DUT repositioning (TRP, spherical coverage), Multiple measurement antenna uncertainty, Uncertainty of the absolute gain of the calibration antenna, Phase centre offset of calibration antenna, Phase centre offset of calibration antenna, Standing wave between reference calibration antenna and measurement antenna, Influence of the calibration antenna feed cable, Insertion Loss Variation\nProposal 11: Re-use the test equipment MU value from PC3 for the Uncertainty of the Network Analyzer","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21240,"status":"revised","reservation_date":"2020-05-08 00:06:27","uploaded":"2020-05-08 23:08:17","revisionof":"","revisedto":"R5-202845","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202124.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202126","title":"On the order of test steps for output power dynamics test cases","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution addresses justification for changing the order of test steps of output power dynamics test cases and potentially most transmitter test cases to harmonize the sequence of test steps. \nThe following observations and proposals were made in this contribution:\nProposal 1: Change the order of test steps in the Minimum Output Power test procedure to: Form UL beam towards TX beam peak direction & dwell time ? power \u201cdown\u201d commands ? dwell time ? UBF activation\nProposal 2: Change the order of test steps in the Absolute Power Tolerance test procedure to: Form UL beam towards TX beam peak direction & dwell time ? Configure UL power to test points 1-3 ? dwell time ? UBF activation\nProposal 3: To harmonize on the sequence of test steps, adjust the order of test steps for the remaining TX power test cases from Scheduling ? TPC commands ? Beam Forming to TX Beam Peak Direction & dwell time ? UBF to Scheduling ? Beam Forming to TX Beam Peak Direction & dwell time ? TPC commands & dwell time ? UBF","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21260,"status":"noted","reservation_date":"2020-05-08 00:06:28","uploaded":"2020-05-08 23:08:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202126.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202127","title":"On NR FR2 Demodulation MUs","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution is investigating select MU elements for NR FR2 demodulation test cases and whether the elements apply to demodulation test cases just like they did for UE RF REFSENS test case. \n\nThe following observations and proposals were made in this contribution\nObservation 1: MU elements related to positioning and\/or misalignments (Positioning misalignment, DUT repositioning, Misalignment of positioning system, Positioning and pointing misalignment between the reference antenna and the measurement antenna) for Mode 1 and Mode 2 test cases can be considered negligible if the REFSENS condition was verified without any re-positioning between the verification and the start of the demodulation test case.\nObservation 2: MU element descriptions and uncertainties related to positioning and\/or misalignments (Positioning misalignment, DUT repositioning, Misalignment of positioning system, Positioning and pointing misalignment between the reference antenna and the measurement antenna) for Mode 1 and Mode 2 test cases should be re-used from the REFSENS test case if the UE has been re-positioned between the RESENS verification and the start of the demodulation test case.\nProposal 1: Regarding MU elements related to positioning and\/or misalignments (Positioning misalignment, DUT repositioning, Misalignment of positioning system, Positioning and pointing misalignment between the reference antenna and the measurement antenna) for Mode 1 and Mode 2 test cases: re-use from the REFSENS test case.\nProposal 2: Feedback from the OEMs is requested: allow more time to further study the \u2018Systematic error related to beam peak search\u2019 for Mode 2 demodulation test cases or assume the worst case, i.e., re-use the \u2018Systematic error related to beam peak search\u2019 of 0.5dB from the REFSENS test case.\nProposal 3: Re-use the descriptions and uncertainty values of MU elements for Mode 2 test cases from REFSENS test case: Measure distance uncertainty, Standing wave between the DUT and measurement antenna, Phase curvature, Random uncertainty, Influence of the XPD, Multiple measurement antenna uncertainty, Uncertainty of the Network Analyzer, Uncertainty of the absolute gain of the calibration antenna, Standing wave between reference calibration antenna and measurement antenna, Influence of the calibration antenna feed cable\nProposal 4: Re-evaluate the uncertainty values of MU elements for Mode 2 test cases: Mismatch, gNB uncertainty on absolute level, Amplifier uncertainties, Insertion Loss Variation, and RF leakage (from measurement antenna to the receiver\/transmitter)\nProposal 5: Further evaluate the descriptions and uncertainty values of the following MU elements: Measure distance uncertainty, Mismatch, Standing wave between the DUT and measurement antenna, Phase curvature, Amplifier uncertainties, Influence of the XPD, Insertion Loss Variation, RF leakage (from measurement antenna to the receiver\/transmitter), Multiple measurement antenna uncertainty, Uncertainty of the absolute gain of the calibration antenna, Phase centre offset of calibration antenna, Standing wave between reference calibration antenna and measurement antenna, Influence of the calibration antenna feed cable, Insertion Loss Variation\nProposal 6: OEMs and chipset vendors to confirm that demodulation testing only assumes cross-polarized transmission and no spatial MIMO.\nObservation 3: Depending on the feedback in Proposal 6, the Quality of QZ MU for Mode 1 test cases could be considered zero.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21270,"status":"revised","reservation_date":"2020-05-08 00:06:28","uploaded":"2020-05-08 23:08:17","revisionof":"","revisedto":"R5-202846","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202127.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202163","title":"Discussion about power configuration for spurious emission for inter-band EN-DC","source":"Guangdong OPPO Mobile Telecom.","contact":"Wenhao Zhan","contact-id":86118,"tdoctype":"discussion","for":"Endorsement","abstract":"CR is R5-202207 and R5-202208\nCurrently power configurations for spurious emission for inter-band EN-DC within FR1 are not accurate enough. This paper introduces the unreasonable configuration and propose a new power configuration.\nObservation 1: The second and third intermodulation products which occurred by NR and E-UTRA transmission might be very weak or even inexistence with currently power configurations so that the test case of spurious emission for inter-band EN-DC within FR1 might not meet the requirement.\nProposal 1: For test cases 6.5B.3.3.1 and 6.5B.3.3.2, both NR and E-UTRA transmit power configuration are set to 20 for PC3 UE no matter it supports pc_dynamicPowerSharing or not.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21630,"status":"noted","reservation_date":"2020-05-08 02:46:17","uploaded":"2020-05-08 12:41:23","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202163.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202312","title":"DL Absolute Level Uncertainty for FR2 RRM","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"In this paper we provide our view on DL Absolute Level Uncertainty for FR2 RRM Tests.\n2.\tDiscussion\nAs is already stated in [1], we have following views on the DL absolute level uncertainty for FR2 RRM test cases. \nObservation 1 : QoQZ can be bigger in 2AoA chamber due to the existence of multiple TRxPs inside a chamber.\nObservation 2 : In real test operation, 1AoA test can be carried out in 2AoA chamber and in that case bigger QoQZ applies even for 1AoA test.\nObservation 3 : It is not realistic to have different MUs for different test setups, chambers, AoA setups etc for TT analysis considering its workload .\nOn the other hand, it will be not realistic to wait for all the MUs for all the cases(method, chambers, AoA test setup of tests etc) are analysed. For example, stopping 1AoA test case progress due to 2AoA MU analysis will not be an optimal decision.\nIn this situation where these issues are not yet fully resolved, we propose to introduce the concept of working assumption MU of +\/- 6dB for DL absolute level uncertainty for the test cases where Downlink absolute level MU is not critical.\nProposal 1 : Adopt working assumption MU of +\/-6dB for the test cases where Downlink absolute level MU is not critical and use it for FR2 TT analyses.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23120,"status":"revised","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"R5-202847","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202312.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202313","title":"FR2 receiver spurious emission uncertainties","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23130,"status":"noted","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202313.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202314","title":"FR2 RRM timing measurement uncertainty","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"This paper proposes measurement uncertainties for FR2 RRM timing test cases.\nRAN5 is asked to endorse following proposals.\nProposal 1: Adopt \u00b148 Tc  as measurement uncertainty for FR2 \u201cUplink signal transmit timing relative to downlink\u201c\nProposal 2: Adopt \u00b140 Tc  as measurement uncertainty for FR2 \u201cRelative transmit timing accuracy during UE timing adjustment\u201d and \u201cTiming Advance Adjustment accuracy\u201d","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23140,"status":"revised","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"R5-202921","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202314.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202315","title":"FR2 SNR Uncertainty","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"In [1], the table format for the uncertainty budget table for Performance test is endorsed. In this paper we present our view on the SNR uncertainty for both FR2 RRM and Performance tests.\nFollowing observations are made.\nObservation 1 : MU of RRM\/PERF test case with SNR as test parameter consists of\nA.\tSNR uncertainty : Reference point is centre of QZ(in the space)\nB.\tOther uncertainty factors which affect the measurement result\nObservation 2 : In general, non-ideal TxEVM affect the SNR uncertainty but its effective uncertainty is 0 in conformance test due to the fact certain TxEVM is already built in the test requirement and TE needs to meet it.\nObservation 3 : With the condition that TxEVM requirement is met by TE, all the MU elements associated with parts after that combining point will be 0 or N\/A.\nObservation 4 :  H-V isolation, multi-path effect inside a chamber etc\u2026 can be considered separately from SNR uncertainty.\nObservation 5 : For external combining approach, SNR uncertainty and budget table will be much different depends on how the carrier and AWGN are combined, and how the SNR is calibrated.\nRAN5 is asked to endorse following proposals.\nProposal 1: For baseband combining approach,   make all the stage 1 MU elements not applicable for SNR uncertainty\nProposal 2:  For baseband combining approach and for up to 64QAM, set Stage 2 MU elements not applicable except for \u201cgNB emulator SNR uncertainty\u201d\nProposal 3 : For baseband-combining approach and for up to DL 64QAM, apply +\/- 0.3dB(1.96sigma)  for FR2a and FR2b for up to 400MHz BW for\u201d gNB emulator SNR uncertainty\u201d\nProposal 4 : Define MTSU of FR2 RRM and PERF with baseband combining approach.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23150,"status":"revised","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"R5-202922","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202315.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202316","title":"Noise impact for FR2 TRx test cases","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"This paper provides the SNR estimations and proposals to cater for low PSD testability issue for P1\/P2 TRx test cases.\nProposal 1 : Use Table 1 for determination of test requirement relaxation value and ?SNR for P1 and P2 FR2 TRx Test Case.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23160,"status":"revised","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"R5-202848","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202316.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202317","title":"On FR2 ACLR MUs","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23170,"status":"revised","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"R5-202849","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202317.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202318","title":"On FR2 OBW MU","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"OBW MUs have been discussed in [1-9] but no conclusion was reached as of now. In [9], action item for UE\/Chip vendors for the spectrum assumption for deriving the OBW MUs are made, and the reference spectrum is provided in [10]. In RAN5#86e, OBW MU analyses based on the reference spectrum [10] are provided [11]-[13]. It is observed that there were several mismatches on the definition of OBW MU among provided analysis from TEVs, and no conclusion was reached in RAN5#86-e.\nObservation 1 : 2 options of OBW MU definition\nOption A1 : (OBWmeas - OBWsignal) \/ OBWsignal *100\nOption A2 : (OBWmeas - OBWsignal) \/ CBW *100\nObservation 2:Two options for definition of OBWmeas for MTSU assessment.\nOption B1 : For MTSU assessment, define OBWmeas = OBWsignal+noise\nOption B2 : For MTSU assessment, define OBWmeas = OBWsignal+noise+flatness\nProposal 1 : Define OBW Measurement Error Rate based on Option A1: (OBWmeas - OBWsignal) \/ CBW *100 [%CBW]\nProposal 2 : Define OBWmeas with Option B2: (i.e. consider noise and flatness impact) for MTSU assessment.\nProposal 3 : Adopt either Option C1 or Option C2 for MTSU and  measurement span forFR2 OBW test","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23180,"status":"noted","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202318.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202319","title":"On FR2 TRx testability and MU for PC1 device","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"Common assumptions of  PC1 device are provided in [1]. Also, some views on PC1 MU are provided in [2]. This paper provides our view on measurement uncertainties for PC1UE devices and also addresses one testability issue for PC1 devices.\nRAN5 is asked to endorse following proposals.\nProposal 1 :  Re-study Amplifier Uncertainties, Mismatch and RF power measurement equipment uncertainty for SEM and General Spurious\nProposal 2 : Other than MOP(TRP, EIPR), MOP Spherical Coverage, OFF Power, Peak EIS, EIS Spherical coverage, SEM, general spurious, further study all MU elements.\nProposal 3: Re-study \u201cImpact of noise\u201d for all the test cases for PC1 DevicesProposal 4 : Study the MU when non-full sphere measurement for TRP and spherical coverage and count additional MU element due to it by either following way :\nA)\tCount it in measurement grid MU\nB)\tIndependent MU element for impact of non-full sphere measurement for TRP and spherical coverage","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23190,"status":"revised","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:11","revisionof":"","revisedto":"R5-202850","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202319.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202320","title":"On frequency flatness uncertainty for FR2 RRM and Performance tests","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"In [1], the table format for the uncertainty budget table for Performance test is endorsed. In this paper we propose the MU term \u201cDL AWGN and signal flatness\u201d factor for FR2 RRM and Performance test cases. \nDiscussion\nIn LTE and in FR1 NR up to 40MHz BW,+\/-  2.0 dB (1.96sigma) was applied for MU term \u201eDL AWGN and signal flatness\u201d. The same value is used for both RRM and performance test cases.\nGenerally saids, spectrum flatness will become bigger for wider BW. As in FR2, we need to consider wider BW than FR1, then the flantess value becomes bigger than those in LTE or FR1. With our internal evaluation of test system, DL signal flatness is within +\/- 3.0dB for both FR2a and FR2b and up to 400MHz BW. \nFor performance test, the test case needs full RBs allocation then we propose to apply +\/- 3dB for all the cases we see up to 400Mhz BW.\nProposal 1: For FR2 performance test, apply +\/-3.0 dB(1.96sigma) for MU term of AWGN and signal flatness for both FR2a and FR2b for up to 400MHz.\nFor RRM, only RLM test uses flaness factor as MU contributor and it is counted to total MU with the same way as demodulation test( i.e 0.25 * flatness) in LTE\/NR FR1. We need some more study whether the flantess factor with the full BW assumption can be applied for RLM test case as is as it can be considred that SS-PBCH block, which is narrower than total BW, may be more relevant for RLM performance.  We may need more understanding how flatness factor can impact the RLM test case.\nObservation 1 : Flatness impact for RRM test needs further study.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23200,"status":"revised","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-09 02:12:46","revisionof":"","revisedto":"R5-202851","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202320.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202321","title":"On the FR2 ACLR Testability","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"This paper provides the views on treatment of FR2 ACLR Testability issue.\n\nRAN5 is asked to endorse following proposals.\nProposal 1 : Change the test metric of FR2 ACLR from TRP to EIRP\nProposal 2 : Test FR2 ACLR without relaxation for the configuration with MPR not greater than the values in Table 2.\nProposal 3 : For FR2a, apply the test requirement relaxation for 400MHz BW as shown in Table 3.\nTable 3 Relaxation of test requirement for FR2a CBW=400MHz\nProposal 4 : For FR2b, do not test the test points with MPR values bigger than Table 2 \nProposal 5: Apply SNR for FR2 ACLR MU as summarized in Table 4.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23210,"status":"noted","reservation_date":"2020-05-08 12:41:59","uploaded":"2020-05-08 18:02:12","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202321.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202374","title":"Discussion on requirements for power class 2 UE in EN-DC MOP test case","source":"Ericsson","contact":"Mikael Ziren","contact-id":86068,"tdoctype":"discussion","for":"Endorsement","abstract":"At RAN5-86-e there was a debate about requirements for some UE Power class 2 implementations in the EN-DC MOP test case [1, 2], and no agreement could be reached on how to interpret the core requirements. The problem arises for a UE implementing power class 2 with two power class 3 chains and signalling support of power class 2. \nThis paper highlights the core requirements and network impact to facilitate further discussion and lists some potential solutions to the problem.\nProposal 1: Test requirements for Rel-16 PC2 UE shall assume 26 dBm UE capability \nProposal 2: RAN5 to agree that solution 1 in section 3.2 shall be pursued since this is the only one solving all the problems. Since it is under RAN4 control, send an LS.\nProposal 3: As the UE PC2 implementation with two PC3 transmit chains will anyway fail the standalone MOP test in 38.521-1 as it is defined now since only one connector is used, a solution need to take also this into account so that certification can be successful. Therefore, it is proposed to come up with a solution for both SA MOP and NSA MOP test cases combined before agreeing changes to the specification.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23740,"status":"noted","reservation_date":"2020-05-08 14:22:40","uploaded":"2020-05-08 17:53:10","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202374.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202375","title":"Discussion on Testpoint analysis and testing of lower order fallback in NR Rx CA test cases","source":"Ericsson, WE Certification, DISH","contact":"Mikael Ziren","contact-id":86068,"tdoctype":"discussion","for":"Endorsement","abstract":"At RAN5#85 meeting, the following Action Point was created.\nAction ID\tsWG\tAction\tResponsible\tRelevant Tdoc\tDeadline\tStatus\nAP#85.21\tRF\tDefine framework for NR CA Rx test optimization by re-using higher order fallbacks results\n\tE\/\/\/, Huawei, Anritsu, Qualcomm, CAICT, Samsung, DCM, CMCC, DISH, WE Certification\tR5-198342\tRAN5#87\tOpen\n\nThis paper looks back at how test optimization of lower order fallbacks in CA Rx test cases was solved for LTE and proposes how to specify it for NR. It is the result of an offline discussion among compnies responsible for the AP.\nThis proposal includes a re-structuring of Rx CA test cases in TS38.521-1.\nIt also includes a proposal on how to expand the current very generic TP analysis in 38.905 to a more detailed analysis including also the per CA configuration settings that are required in the test case.\n3.2.1\tObservations\nRequirements other Rx tests:\n\u2022\tLike LTE requirements are band independent\n\u2022\tLike LTE, Some BW classes have different requirements meaning we can\u2019t skip some fallbacks. \n\u2022\tA new aspect compared to LTE is the fallback groups, where only fallbacks within the fallback group is mandatory for the UE. Meaning if we test a fallback group 2 config, only lower order group 2 configs can be considered redundant. If UE support also fallback group 1 configs (which are optional) these need also to be tested. However, in current 38.101-1 Rx requirements for fallback group 2 are missing and may not be specified in Rel16 time frame. \nProposals\n1)\tReuse same mechanism as in 36.521-2 but simplify it slightly. In LTE we have a table that defines exactly which config is a fallback (Table 4.1-2). We can skip this and let the TE decide which configs are fallbacks (should be obvious) \n2)\tIn LTE there was a problem that it is not ensured that these other Rx tests are tested with test points that avoids a large exception. Due to the separation of default\/additional refsens test cases above, this problem is now completely solved by referring back to test points from \u201cdefault\u201d refsens\n\nOne issue with all the tests is that it is not ensured that the higher order test case is available\/validated. Of course, only if the highest order test case is run, the lower order fallback can be skipped. This issue is not addressed for LTE and is FFS","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23750,"status":"noted","reservation_date":"2020-05-08 14:22:40","uploaded":"2020-05-08 17:53:10","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202375.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202379","title":"Discussion on clarification of disabling of Tx diversity in FR2 testing","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Discussion","abstract":"CR in R5-202199~R5-202203","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23790,"status":"revised","reservation_date":"2020-05-08 15:16:12","uploaded":"2020-05-08 15:33:34","revisionof":"","revisedto":"R5-202923","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202379.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202382","title":"Discussion on FR2 EIRP Tx OFF power MU for test cases usage","source":"Samsung R&D Institute UK","contact":"Carolyn Taylor","contact-id":81481,"tdoctype":"discussion","for":"Discussion","abstract":"This is related to EIRP Tx OFF power.\nIt was decided at previous meeting to include an editor\u2019s note for \u201ctestability of OFF power needs further study\u201d [1] in all test cases that are dependent on EIRP OFF power that consist of the following test cases:\n\u2022\t6.3.3.2: General ON\/OFF time mask\n\u2022\t6.3A.3.1: Transmit ON\/OFF time mask for CA (2UL CA)\n\u2022\t6.3D.3.1: General ON\/OFF time mask for UL MIMO\n\u2022\t6.3D.3.4: SRS time mask for UL MIMO\nEven though they may not be considered priority test cases in GCF CAG and PTCRB PVG in Q3 2020 and not RF MU\/TT priority 1 test cases (regulatory), we would like to see what remaining open issues for FR2 EIRP Tx OFF power MU can be resolved as the FR2 TRP Tx OFF power MU values have been agreed at RAN5#86 E-Meeting.\nThe test cases listed above minimum conformance requirements are as such:[]\nIn this contribution, we briefly discuss and provide our view on the FR2 EIRP Tx OFF power requirements. \nIn this contribution, we further discussed our views on the FR2 EIRP OFF power requirements and related test cases. Based on the discussion, our observation and proposal are summarized as follows:\nObservation 1: TR38.903 Annex B.8 Transmit OFF power is only referring to TRP measurements for Transmit OFF power and is missing the inclusion of EIRP Transmit OFF power. \nProposal 1: Test proposal 1 is agreed for TR38.903.\nProposal 2: Test proposal 2 is agreed for TR38.903.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23820,"status":"revised","reservation_date":"2020-05-08 16:02:47","uploaded":"2020-05-08 18:19:07","revisionof":"","revisedto":"R5-202872","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202382.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202392","title":"Discussion on Beam Correspondence measurement procedure","source":"Samsung R&D Institute UK","contact":"Carolyn Taylor","contact-id":81481,"tdoctype":"discussion","for":"Discussion","abstract":"RAN4 dependency with R4-2008014 for TR 38.810.\nThere has been offline discussion on changes for Annex K.1.1: Tx beam peak direction search in regards to beam correspondence. These changes are related to beam correspondence capability [bit-0] DUT. It is to further clarify that SS should configure an additional semi-persistent SRS resource set with the field usage as \u201ccodebook\u2019. Currently, this is not allowed in TR38.810 near is it specified in TS38.521-2. \n\nIn this contribution we provide background information on TX beam peak direction search defined in TR38.810 and our views on how changes to TR38.810 and TS38.521-2 alignment.In this contribution, we provide background information on TX beam peak direction search defined in TR38.810 and our views on how changes to TR38.810 [1] and TS38.521-2 [2] alignment for beam correspondence. The proposal is summarized as follows:\nProposal 1: If it is agreed to add the additional clarification in TS38.521-2 [2] Annex K.1.1, then a CR should be proposed to TR38.810 [1] section 5.2.1.3.7.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23920,"status":"noted","reservation_date":"2020-05-08 16:33:14","uploaded":"2020-05-08 18:19:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202392.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202397","title":"Discussion on SCell activation and deactivation delay","source":"Samsung R&D Institute UK","contact":"Carolyn Taylor","contact-id":81481,"tdoctype":"discussion","for":"Discussion","abstract":"In this contribution, we discussed specific RAN5 test aspects for TCs 7.5.3.1 and 7.5.3.2. Based on the discussion, our observations are summarized as follows:\nObservation 1: Based on analysis the message contents needed for test cases 7.5.3.1 and 7.5.3.2 are provided in Table 2.2-1 and 2.2-2.\nObservation 2: The test parameters and metrics needed for TCs in 7.5.3 includes: DL AWGN absolute power, DL applied SNR, and UL signal transmit timing relative to DL.\nObservation 3:  The SSB Es\/Iot of both NR Cells shall be above -4dB.\nObservation 4: The tightest requirement for Io of NR Cells shall be between -117.5dBm\/15kHz (-89.5dBm \/ 9.36MHz) or -114.5dBm\/30kHz (-83.5dBm \/ 38.16MHz) and -50dBm \/ CBW for band group NR_FDD_FR1_H.\nObservation 5: The tightest requirement for SSB_RP shall be above -121.5dBm \/ 15kHz or -118.5\/30kHz for band groups NR_FDD_FR1_H.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23970,"status":"noted","reservation_date":"2020-05-08 16:51:17","uploaded":"2020-05-08 18:19:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202397.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202398","title":"Discussion on UE PSCell addition and release delay","source":"Samsung R&D Institute UK","contact":"Carolyn Taylor","contact-id":81481,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23980,"status":"noted","reservation_date":"2020-05-08 16:52:54","uploaded":"2020-05-08 18:19:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202398.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202417","title":"On txDirectCurrentLocation","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"This paper discusses how to capture the DC location issue in conformance test spec.\nProposal 1 : For carrier lakage test, make all the UEs applicable regardless of txDirectionCurrentLocation. Clarify in the test description to check this value and determine test case verdict.\nProposal 2 : Implement Table 1 to conformance test specification for signal quality test cases","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24170,"status":"revised","reservation_date":"2020-05-08 18:21:35","uploaded":"2020-05-09 08:26:08","revisionof":"","revisedto":"R5-202924","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202417.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202434","title":"Discussion on per port testing for FR1 UL MIMO devices","source":"QUALCOMM JAPAN LLC.","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Discussion","abstract":"Proposes additional steps need to be added in the FR1 UL MIMO test procedure to align with per port requirements as per core spec.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24340,"status":"noted","reservation_date":"2020-05-08 19:37:09","uploaded":"2020-05-08 22:51:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202434.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202452","title":"DUT alignment for form factors other than smartphones","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"\"Associated CR R5-202453(R&S)","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24520,"status":"noted","reservation_date":"2020-05-08 20:26:20","uploaded":"2020-05-09 07:26:41","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202452.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202454","title":"On the MU for ALCR","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"The MU for ACLR has been discussed in RAN5 during the last meetings [1-11], however, not all  MU contributors\u2019 values could be concluded. \nIn this discussion paper, we share our view on some of the remaining MU contributors for ACLR.\nIn this contribution, the following observations and proposals were made:\nObservation 1: Limitations in the frequency correction exist and the residual frequency response cannot be neglected.\nObservation 2: Since ACLR is tested also with 1RB_Edge allocation, the frequency response of the test system is not reduced by averaging the channel power over a considerable bandwidth.\nProposal 1: Keep the value of 2.16 dB for the Uncertainty of the RF power measurement equipment in TR 38.903 and remove the square brackets.\nProposal 2: Keep the value of 0.6 dB for the MU contributor Uncertainty of the absolute gain of the calibration antenna and remove the square brackets.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24540,"status":"noted","reservation_date":"2020-05-08 20:26:21","uploaded":"2020-05-09 08:59:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202454.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202455","title":"Discussion on the power level for transmit modulation quality test cases","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"In this contribution, we discuss our preliminary analysis of the measurement uncertainty of the transmit modulation quality test cases applicable for SA and NSA operation mode with respect to the UE transmit power level.\nIn this contribution we have presented a preliminary analysis of the measurement uncertainty of Tx modulation quality test cases. Due to the low SNR conditions and the low PSD nature of these test cases we propose to limit testing of FR2 Tx modulation quality test cases to UE maximum output power level.\nObservation 1: The low SNR results in EVM values exceeding the core requirement unacceptably. This is especially severe for power classes 2, 3 and 4. \nObservation 2: Due to the high MPR for large channel bandwidths and allocation, there exists a low PSD issue for EVM even when tested at UE PUMAX. Consequently, it is not reasonable to test EVM at lower power levels than PUMAX.\nProposal 1: Test FR2 EVM only at PUMAX level and remove the test steps associated with lower power levels from the test case.\nObservation 3: PC3 CP-OFDM 64QAM with 400 MHz channel bandwidth is not testable without relaxation.\nProposal 2: In addition to testing only at UE maximum output power, reconsider the test point selection to optimize MPR and single channel noise by choosing appropriate channel bandwidths and allocations. \nProposal 3: Test FR2 Carrier Leakage only at the upper power level (=0 dBm for PC3) and remove step 7 to 9 from the test procedure. \nObservation 4: The requirement for non-allocated RBs cannot be tested without relaxation.\nProposal 4: Omit testing of Power ID 3 in the FR2 In-band emission test case and consider relaxation or not testing of the requirement for non-allocated RBs .\nProposal 5: Apply the other proposals to the CA test cases as well.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24550,"status":"revised","reservation_date":"2020-05-08 20:26:21","uploaded":"2020-05-09 08:59:07","revisionof":"","revisedto":"R5-202852","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202455.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202457","title":"Discussion on testability of ACS and IBB for CA","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24570,"status":"noted","reservation_date":"2020-05-08 20:26:22","uploaded":"2020-05-09 08:59:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202457.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202458","title":"On the MU of FR2 OBW","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"The measurement uncertainty (MU) of occupied bandwidth (OBW) has been discussed during the last meetings [1] to [12]. However, no final conclusion has been reached due to the dependence of OBW on the UE ACLR. At RAN5#85, measured data has been provided to be used as basis for the OBW MU analysis [9]. This contribution is an updated version of the paper submitted to RAN5#86-e [10] with respect to interpolation of the measurement data and the calculation of OBW.\nIn summary, the SNR impact on the MU for ACLR has been analyzed. \nObservation 1: By applying a span to CHBW ratio of 1.5 instead of 2.0 the impact of the SNR on the OBW can be considerably reduced.\n\nProposal 1: Apply a span of 1.5 CHBW for 400 MHz and use the same span for the other channel bandwidth in order to optimize the impact of noise. \nObservation 2: Occupied bandwidth is tested with CP-OFDM waveform which has a larger MPR than DTF-s-OFDM waveform.\nProposal 2: Select DFT-s-OFDM QPSK as waveform and modulation since it has the lowest MPR and allows to reduce the impact of noise on the OBW MU.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24580,"status":"noted","reservation_date":"2020-05-08 20:26:22","uploaded":"2020-05-09 08:59:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202458.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202459","title":"On the SNR for FR2 TRx test cases","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"At RAN5 #86, estimations for the SNR and relaxations of core requirements have been discus-sed [1 \u2013 7]. In this document, we present the results of our analysis based on the common assumptions for the not yet decided figures.\nDiscussion\nA detailed description of the total SNRtotal based on the measurement of total component power for both polarizations can be found in reference [6]. \nIn Table 1, we present our results for SNRtotal under the assumption that the UE is allowed to transmit a maximum peak EIRP of 43 dBm. \nFor ACLR we provide the same numbers as in the previous meeting but note that the general case can be derived by \nSNR = SNRtable + (6.5 dB \u2013 MPR) + ?CHBW + ?ArrayMetric\nThe values in the table SNRtable are for assumption 1, i.e., 8x2 antenna array and TRP metric, an MPR of 6.5 dB , and 400 MHz channel bandwidth. MPR is the worst MPR of the chosen test points, and ?CHBW = 10log10(400MHz\/CHBW). ?ArrayMetric is 0 dB for 8x2 antenna array and TRP metric (ACLR Assumption 1). ?ArrayMetric is 6 dB for 1x4 antenna array and TRP metric (ACLR Assumption 2). For EIRP metric, ?ArrayMetric is 16 dB and is independent from the directivity of the antenna array. \nThe MPR depends on waveform, modulation and RB allocation. For the currently defined test points the highest MPR occurs for 400 MHz channel bandwidth and 64QAM DFT-s-OFDM with a value of 6.5 dB. It is noted that the MU and SNR analysis has to be updated once CP-OFDM 64QAM were applied as test point for ACLR.\nIn summary, SNR estimations for low PSD test cases have been provided and the influence of noise has been analyzed.\nProposal 1: Apply the SNR values in Table 1 and Table 2 as basis for determining the relaxation amount and for specifying the MU impact due to noise for the TT analysis.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24590,"status":"noted","reservation_date":"2020-05-08 20:26:22","uploaded":"2020-05-09 08:59:07","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202459.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202460","title":"On FR2 OBW MU","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution is discussing FR2 OBW MU. This topic has been discussed for long ([1]-[13]) without agreement. This document provides additional simulations in order to achieve agreement on FR2 OBW MU.\nThe following observations and proposals were made in this contribution\nObservation 1: In order to run similar analysis with frequency band n260, similar information to the one provided to close AP#84.22 is required.\nProposal 1: OEM and chipset vendors to provide the information on the Tx spectrum shape (PSD, slope), to help determine MU of FR2 OBW test for frequency band n260.\nProposal 2: Reduce FR2 OBW span from 2*CBW to 1.5 *CBW.\nProposal 3: Define FR2 OBW MU as ((CBW-0.99*Tx BW config))\/CBW*100% for FR2a frequency range in order to accommodate variations on UE ACLR as well as on SS spectral flatness.","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24600,"status":"noted","reservation_date":"2020-05-08 20:43:13","uploaded":"2020-05-15 19:56:45","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202460.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202461","title":"On FR2 ACLR MU","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24610,"status":"withdrawn","reservation_date":"2020-05-08 20:44:23","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202462","title":"On FR2 Spurious coexistence MU","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24620,"status":"withdrawn","reservation_date":"2020-05-08 20:46:08","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202463","title":"On FR2 EVM MU","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24630,"status":"withdrawn","reservation_date":"2020-05-08 20:47:43","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202464","title":"On FR2 Minimum Output power MU","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24640,"status":"withdrawn","reservation_date":"2020-05-08 20:48:47","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202704","title":"On the QoQZ validation procedure for enhanced IFF","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":16031,"status":"noted","reservation_date":"2020-06-01 16:33:38","uploaded":"2020-06-10 14:56:20","revisionof":"R5-201603","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202704.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202811","title":"Discussion on testing of 4Rx vs 2Rx in FR1","source":"Huawei, CAICT, OPPO, Samsung, Bureau Veritas, Sporton, Ericsson, Anritsu, AT&T, Keysight, CMCC, Dish, Telecom Italia, Orange, Rohde&Schwarz","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":18401,"status":"noted","reservation_date":"2020-06-01 16:35:50","uploaded":"2020-06-10 14:56:21","revisionof":"R5-201840","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202811.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202842","title":"Discussion on AP 85.25 ACLR metric change","source":"Qualcomm Finland RFFE Oy","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":13271,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:22","revisionof":"R5-201327","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202842.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202843","title":"RRM FR2 MU: Representative test case 7.7.1.1","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":16051,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:22","revisionof":"R5-201605","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202843.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202844","title":"On ACLR test metric for FR2 related to AP 85.25","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":18521,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-201852","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202844.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202845","title":"On PC1 MUs","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21241,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202124","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202845.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202846","title":"On NR FR2 Demodulation MUs","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21271,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202127","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202846.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202847","title":"DL Absolute Level Uncertainty for FR2 RRM","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23121,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202312","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202847.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202848","title":"Noise impact for FR2 TRx test cases","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23161,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202316","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202848.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202849","title":"On FR2 ACLR MUs","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23171,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202317","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202849.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202850","title":"On FR2 TRx testability and MU for PC1 device","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23191,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202319","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202850.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202851","title":"On frequency flatness uncertainty for FR2 RRM and Performance tests","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23201,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202320","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202851.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202852","title":"Discussion on the power level for transmit modulation quality test cases","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24551,"status":"noted","reservation_date":"2020-06-01 16:58:21","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202455","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202852.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202872","title":"Discussion on FR2 EIRP Tx OFF power MU for test cases usage","source":"Samsung R&D Institute UK","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23821,"status":"noted","reservation_date":"2020-06-01 16:58:40","uploaded":"2020-06-10 14:56:27","revisionof":"R5-202382","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202872.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202919","title":"Discussion on how to update TS 38.522","source":"China Mobile, Bureau Veritas, Huawei, Hisilicon, TTA, Sporton,  Ericsson, CAICT, Qualcomm, R&S","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":19191,"status":"noted","reservation_date":"2020-06-01 16:59:43","uploaded":"2020-06-10 14:56:28","revisionof":"R5-201919","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202919.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202920","title":"On Beam Peak Searches for Intra-Band Contiguous CA","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21161,"status":"noted","reservation_date":"2020-06-01 16:59:43","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202116","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202920.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202921","title":"FR2 RRM timing measurement uncertainty","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23141,"status":"noted","reservation_date":"2020-06-01 16:59:43","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202314","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202921.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202922","title":"FR2 SNR Uncertainty","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23151,"status":"noted","reservation_date":"2020-06-01 16:59:43","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202315","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202922.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202923","title":"Discussion on clarification of disabling of Tx diversity in FR2 testing","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23791,"status":"noted","reservation_date":"2020-06-01 16:59:43","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202379","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202923.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202924","title":"On txDirectCurrentLocation","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":24171,"status":"noted","reservation_date":"2020-06-01 16:59:43","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202417","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202924.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202939","title":"On Beam Peak Searches for different test configurations","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":89,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":21151,"status":"noted","reservation_date":"2020-06-01 16:59:58","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202115","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202939.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]