[{"name":"R5-210311","title":"On ACS and IBB FR2 MU definition","source":"Keysight Technologies UK Ltd","contact":"Adan Toril","contact-id":62705,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":3110,"status":"revised","reservation_date":"2021-02-02 08:04:02","uploaded":"2021-02-08 08:58:31","revisionof":"","revisedto":"R5-211943","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210311.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210312","title":"On minimum requirements for Transmit ON\/OFF time mask in UL MIMO FR1","source":"Keysight Technologies UK Ltd","contact":"Adan Toril","contact-id":62705,"tdoctype":"discussion","for":"Endorsement","abstract":"The aim of this document is to analyse the minimum requirements for test case 6.3D.3\tTransmit ON\/OFF time mask for UL MIMO [1], present the potential inconsistency for measuring the ON power compared to other test cases and propose a way forward to solve it.\nThe following observations and proposals were made in this contribution:\nObservation 1: Minimum requirement to measure ON power as part of the transmit ON\/OFF time mask measurement for UL MIMO seems inconsistent with minimum requirements for many other cases where ON power needs to be measured for UL MIMO.\nObservation 2: for measuring ON power for UL MIMO, since there is no requirement indicating how power needs to be distributed between each UE transmit connector, it seems most appropriate to apply the requirements to the sum of the output power from both UE antenna connectors.\nProposal 1: Send an LS to RAN4 to clarify the minimum requirements for transmit ON\/OFF time mask for UL MIMO when ON power needs to be measured.\nObservation 3: Current test procedure measures ON power as the sum of the output power from both UE antenna connectors, what is not aligned with current minimum requirements.\nProposal 2: Add an editor\u2019s note indicating the interpretation of the minimum requirements for measuring ON power needs to be confirmed.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":3120,"status":"revised","reservation_date":"2021-02-02 08:04:02","uploaded":"2021-02-05 12:35:39","revisionof":"","revisedto":"R5-211850","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210312.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210420","title":"Discussion on equal PSD and PCC prioritization for UL CA test","source":"Guangdong OPPO Mobile Telecom.","contact":"Wenhao Zhan","contact-id":86118,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":4200,"status":"revised","reservation_date":"2021-02-05 03:34:26","uploaded":"2021-02-05 08:33:44","revisionof":"","revisedto":"R5-211937","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210420.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210452","title":"On the DL AWGN MTSU for RRM","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Endorsement","abstract":"The DL AWGN (or wanted signal) absolute level MTSU for RRM is not yet finalized. The following table captures the status for the different test setups: ..\nThis paper provides a way forward to define the DL AWGN MTSU for RRM.\nDiscussion\nThere are 134 RRM test cases for FR2. Out of those 134, 106 are defined with AoA Setups 1, 2a or 2b, which require only 1 AoA.\nObservation 1: ~80% of the RRM FR2 test cases require only 1AoA.\nTherefore, it seems reasonable to select a 1 AoA test setup as the baseline for these test cases, since it is the most optimized approach.\nProposal 1: Use a 1AoA test setup as baseline to define the DL AWGN MTSU for RRM 1 AoA test cases.\nThe 1AoA test setups for RRM are the same as for RF. Even for RF, simplified DFF has not been pursued. Thus, our proposal is to use IFF and the baseline for 1AoA RRM test cases.\nProposal 2: Set the DL AWGN MTSU for RRM 1 AoA test cases to 5.19 dB.\nFor 2 AoA test cases, we have the following statement in TS 38.508-1:\nMeasurement Uncertainty:\n-\tThe threshold MU for the equivalence framework for RRM will be based on direct far field (DFF) test method for D = 5 cm and on indirect far field (IFF) test method for D > 5 cm. If the MTSU for the IFF test method for D = 5 cm is finalized before DFF, the IFF MTSU shall be used as provisional threshold MU until DFF is completed.\nObservation 2: Enhanced IFF MTSU has been finalized and the DFF MTSU is still under discussion.\nObservation 3: DFF-IFF was not considered at the time of writing the above statement in TS 38.508-1\nGiven Observations 2 and 3, our proposal is to use the enhanced IFF MTSU as working assumption to progress the RRM FR2 test case analysis until the DFF discussion is finalized.\nProposal 3: Use 5.25 dB as working assumption MTSU for RRM FR2 test cases.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":4520,"status":"revised","reservation_date":"2021-02-05 07:01:58","uploaded":"2021-02-08 12:58:09","revisionof":"","revisedto":"R5-211653","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210452.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210515","title":"Discussion on test issue of ONOFF time mask for UL MIMO","source":"Guangdong OPPO Mobile Telecom.","contact":"Wenhao Zhan","contact-id":86118,"tdoctype":"discussion","for":"Endorsement","abstract":"The purpose of this paper is to discuss the test issue and solutions for transmit ON\/OFF time mask for UL MIMO.\nObservation 1: For transmit ON\/OFF time mask for UL MIMO, ON power is measured as the sum of both antenna connectors. It is not aligned with core requirement which require to measure at each antenna connector.\nObservation 2: Current core requirement of ON\/OFF time mask for UL MIMO cannot be tested because the target ON power of each antenna connector is unpredictable.\nProposal 1: It is proposed to inform RAN4 about the test issue and solutions of ON\/OFF time mask for UL MIMO.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":5150,"status":"noted","reservation_date":"2021-02-05 07:37:33","uploaded":"2021-02-05 08:33:44","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210515.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210557","title":"On the QoQZ standard deviation for ETC testing","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CRs in R5-211264 and R5-211265\nAt the last RAN5 meeting, the measurement uncertainty for ETC has been discussed [1]. In this contribution, we present results of our measurement campaign and propose values for the EIRP\/EIS QoQZ standard deviation for ETC. \n2.\tDiscussion\nAt RAN5 #89-e the target completion date for TE vendors to complete MU on ETC has been agreed as RAN5 #90-e. In this contribution, we provide the results our QoQZ characterization campaign of an IFF system with 30cm QZ size equipped with an enclosure for ETC testing. The measurements have been performed according to the QoQZ characterization procedure specified in Clause O.2 of TS 38.521-2 making use of the repositioning approach. The range path calibration has been performed with the ETC enclosure present. \nOur results for the standard deviations for EIRP are summarized in Table 1.\nBased on the results, we propose for the following values for ETC:\nProposal 1: For IFF with 30cm ETC Quiet Zone, specify a standard deviation for the Quality of Quiet Zone for FR2a, FR2b, FR2c, EIRP\/EIS of 1.0 0.8 dB (Stage 1) and 1.1 dB (Stage 2).\nAccompanying CRs [2] & [3] provide a documentation of the assumptions and limits in TR 38.903 [4] and an update of the MTSU in TS 38.521-2 [5], respectively.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":5570,"status":"revised","reservation_date":"2021-02-05 14:03:23","uploaded":"2021-02-08 22:52:19","revisionof":"","revisedto":"R5-211944","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210557.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210600","title":"On MTSU definition for RRM","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution intends to define a MTSU value about DL AWGN absolute power or wanted DL signal absolute power to be used as input in Test Tolerance calculation for RRM FR2 test cases.\nThe following observations and proposals were made in this contribution:\nObservation 1: Maximum measurement uncertainty delta across all test setups is 0.34dB.\nProposal 1: Define only one MTSU for DL AWGN absolute power or wanted DL signal absolute power across all test setups.\nProposal 2: Define MTSU for DL AWGN absolute power or wanted DL signal absolute power as 5.53dB.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":6000,"status":"noted","reservation_date":"2021-02-06 11:16:03","uploaded":"2021-02-08 18:50:12","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210600.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210617","title":"AP#87e.24 Input for Large Device Size","source":"Apple Portugal","contact":"Ashwin Mohan","contact-id":90592,"tdoctype":"discussion","for":"Endorsement","abstract":"FR2 MU Discussion Paper on Large Device Size","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":6170,"status":"noted","reservation_date":"2021-02-06 22:40:10","uploaded":"2021-03-06 17:31:15","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210617.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210722","title":"Discussion on omitting of Rx cases with UL-MIMO on TDD bands","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Agreement","abstract":"CRs in R5-210723, 0724, 0725 and 0726.\nIn 38.101-1\/-2\/-3, there are several RX test cases with UL-MIMO defined. RAN5 has specified test details for each test case. This contribution discusses the possibility to omit testing of these test cases on TDD bands.\nPlease RAN5 consider and endorses below proposals:\nProposal 1: Testing of Rx test cases with UL-MIMO on TDD bands is omitted.\nProposal 2: For Rx test cases with UL-MIMO in TS 38.521-1, update the test applicability to only FDD bands in the TC and in the TS 38.522.\nProposal 3: For Rx test cases with UL-MIMO in TS 38.521-2, only add below text in each TC. The applicability of these test cases shall be removed from TS 38.522.\nThe normative reference for this requirement is TS 38.101-2 [3] clause 7.xD.\nNo test case details are specified. Given UE\u2019s Rx performance would not be impacted by the Tx configuration in TDD bands, the requirements in this test case can be well covered in 7.x and don\u2019t need to be tested again.\nProposal 4: For Rx test cases with UL-MIMO for EN-DC including FR2 in TS 38.521-3, only add below text in each TC. The applicability of these test cases shall be removed from TS 38.522.\nNo exception requirements applicable to NR or LTE. LTE anchor agnostic approach can be applied and only NR carriers need to be tested.\nNo test case details are specified. Given UE\u2019s Rx performance would not be impacted by the Tx configuration in NR FR2 TDD bands, the requirements in this test case can be well covered in 7.xB.y and don\u2019t need to be tested again.\nProposal 5: For Rx test cases with UL-MIMO for EN-DC including FR1 and FR2 in TS 38.521-3, nothing need to be changed.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7220,"status":"noted","reservation_date":"2021-02-07 09:56:07","uploaded":"2021-02-07 14:56:35","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210722.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210733","title":"Discussion on FR2 TT calculation in special scenarios","source":"Huawei, HiSilicon, Vivo","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7330,"status":"noted","reservation_date":"2021-02-07 09:56:20","uploaded":"2021-02-08 09:50:38","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210733.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210734","title":"Discussion on draft LS on on nominal channel spacing calculation","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7340,"status":"noted","reservation_date":"2021-02-07 09:56:20","uploaded":"2021-02-07 14:57:53","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-1","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210734.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210775","title":"On Testability Aspects for FR2 Demodulation Testing","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution provides an analysis of different factors affecting on maximum testable SNR for Demod FR2 test cases.\nThe following observations and proposals were made in this contribution:\nObservation 1: Based on empirical calculations of different fading instances, an average crest factor can be set as 8.7dB instead of 10dB\nProposal 1: Use 8.7dB as fading crest factor to be considered in when determining maximum testable SNR\nProposal 2: Consider a backoff of 21.7 dB (13 dB PAPR + 8.7 dB average crest factor) when determining maximum testable SNR","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7750,"status":"noted","reservation_date":"2021-02-07 12:29:26","uploaded":"2021-02-08 19:49:09","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210775.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210822","title":"Handover of Test Tolerance review process in RAN5","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal for handover of TT review process leadership from Anritsu to Ericsson.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8220,"status":"noted","reservation_date":"2021-02-07 19:26:41","uploaded":"2021-02-08 15:33:22","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210822.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210823","title":"Summary of known issues for NR RRM Test cases in 38.533","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"discussion","for":"Information","abstract":"Summary of known issues for NR RRM Test cases in 38.533, and current status:\nAnritsu said we would provide status and summary of open issues\n- This summary is a snapshot of the issues we are aware of \n-- it does not claim to be comprehensive\n-- many of the issues identified require work in both RAN4 and RAN5\n-- other issues may not have revealed themselves yet\n- Some companies in RAN4 are already working on some topics\n-- some CRs at RAN4#98-e addressed issues across multiple test cases\n-- ..but scope of work not visible, usually learnt when CRs uploaded \n- Some issues only identified when RAN5 implements test cases  \n-- Either from TT analysis, or from TE vendor\/UE vendor trials\n\nThoughts on Way Forward\nMost issues need targeted research to find out scope\nWhich test cases affected, how many, common solution available? \nMost issues have a solution already applied to at least one test \nCareful check needed to see whether it can be applied to other TCs\n..for example, 240kHz SSB SCS Configs may be harder than 120kHz\n..may require a \u201cvery draft\u201d TT analysis to check feasibility   \nDoes RAN5 want to actively manage the process?\nRAN5 has best tools and good visibility\/experience across test cases\nWould companies be willing to \u201cown\u201d issues? \nHigher frequency FR2 bands \nMay affect all RRM Test cases (worse Refsens, increased path loss, higher MU..) and hence more pressure on already-tight dB range","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8230,"status":"noted","reservation_date":"2021-02-07 19:31:32","uploaded":"2021-02-08 18:52:58","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210823.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210838","title":"On MU for FR2 Blocker Test using offset antenna","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8380,"status":"noted","reservation_date":"2021-02-08 02:06:40","uploaded":"2021-02-08 03:26:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210838.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210839","title":"On declaration of FR2 antenna implementation and test method applicability","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"As a FR2 RRM test setup, DFF or IFF+DFF method has been introduced in conformance test specifications. Different from TRx test system where IFF is used, applicability of DFF test method depends on the UE antenna array sizes (D), hence the UE vendor declaration on the antenna implementation is needed. In this paper, we provide our proposal on the declaration form of FR2 antenna implementation used for determination of test method applicability.\nIn this paper, test method applicability rule based on the UE declaration on antenna implementation is discussed. Following observations are made.\nObservation 1: D is explained\/defined in slightly different way\nObservation 2: Current definition of test method applicability rule using 3 antenna configurations is not exhaustive enough\nObservation 3 : 2 Options for test method applicability determination \nOption 1 : Clarify D as a size of phase coherent array antenna active at any one time ( regardless of whether it is on one panel or distributed in multiple panels ) and define test method applicability solely depends on D.\nOption 2 : Define test method applicability rule based on the current form using \u201cantenna configuration\u201d but add missing scenarios.\nObservation 4 : There would be 2 options for the declaration of D\nOption a) Declare D [cm] \nOption b) Declare D <= 5cm or not (TRUE\/FALSE)\nObservation 5 : The typical UE(especially PC3) has smaller array antenna size than 5cm. Test system with shorter range length than for D=5cm can still cover the almost all of the available UEs in reality.\nObservation 6: Benefit with declaration option a)\niv)\tTest system (chamber) size can become smaller\nv)\tDynamic range is better \nvi)\tReuse of the test system designed for early released lower bands(e.g. FR2a \/ FR2b) for later released higher bands (e.g. FR2c \/ FR2x(not formal yet) ) can be possible \nObservation 7 : With the declaration with option b), test system can be judged not usable for higher frequency even though the test system potentially has enough range length for that UE\n\n RAN5 is asked to endorse following proposals\nProposal 1 : Define test method applicability solely based on D rather than antenna configurations, and clarify D with \u201dthe diameter of the smallest sphere that encloses the radiating parts of the phase coherent array antenna active at any one time\u201d.\nProposal 2 : Add UE declaration with Option a) in TS 38.508-2.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8390,"status":"noted","reservation_date":"2021-02-08 02:06:40","uploaded":"2021-02-08 03:26:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210839.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210840","title":"On Quality of Quiet Zone for DFF","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"QoQZ for DFF have been discussed for these several meetings [1-2]. In the previous meeting, we proposed the QoQZ based on the range length 650mm [1] and we observed a difference from the values in [2] where the range length was longer. In this paper we provide our measurement result for Quality of Quiet Zone for FR2 DFF probe with longer range length than assumed in [1].\nBased on the measured QoQZ and XPD as summarized in Table 1 and Table 2, RAN5 is asked to endorse following proposal.\nProposal 1 : Adopt 1.2dB for measurement stage QoQZ for DFF\nProposal 2 : Adopt 0.4dB for calibration stage QoQZ for DFF\nProposal 3 : Adopt 0.06dB for influence of XPD for DFF","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8400,"status":"noted","reservation_date":"2021-02-08 02:06:40","uploaded":"2021-02-08 03:26:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210840.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210841","title":"On MU for FR2 Blocker Test","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8410,"status":"revised","reservation_date":"2021-02-08 02:06:40","uploaded":"2021-02-08 03:26:22","revisionof":"","revisedto":"R5-211945","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210841.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210842","title":"On MU of IFF DFF test method for FR2 RRM","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"The MU of IFF-DFF method was once discussed in [1] several meetings ago.\nProposal 4: Define measurement uncertainty of elements that are applicable to both test setups  for 2 AoA test cases as Max(MUIFF,Hybrid, MUDFF,Hybrid) where MUIFF,Hybrid, MUDFF,Hybrid are assessed MU of IFF TRxP and DFF TRxP in IFF+DFF Hybrid Setup.\n Proposal 5: Revise the approach in proposal 4 ( taking element-by-element max ) if it gets clear that this approach results in bigger MU than Max(Total MUIFF,Hybrid, Total MUDFF,Hybrid)\nIn this paper, we re-discuss on the definition of MU for IFF-DFF test method after the some discussion on the concrete MU values, and finally propose to define the total MU of IFF-DFF test method with Max(Total MUIFF,Hybrid, Total MUDFF,Hybrid).\n\nObservation 1 : In case  at least one MU element of IFF is bigger than the DFF, then Max(Total MUIFF,Hybrid, Total MUDFF,Hybrid) > Max(MUIFF,Hybrid, MUDFF,Hybrid).\nObservation 2 : Total MU obtained by taking the element by element maximum of DFF and IFF probe has no physical meaning\nObservation 3 : The test parameters (DL levels, SNRs etc) are defined for \u201cper cell\u201d = \u201cper probe antenna\u201d basis and TT analysis assume per cell MU, then the MU needs to be defined for each probe.\nProposal 1 : Overall MU of IFF-DFF test method is defined by the MAX(Total MUIFF,Hybrid, Total MUDFF,Hybrid).","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8420,"status":"noted","reservation_date":"2021-02-08 02:06:40","uploaded":"2021-02-08 03:26:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210842.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210843","title":"On FR2 OBW MU","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"OBW MUs have been discussed in [1-19] but no conclusion was reached as of now. This paper provides proposal on FR2 OBW MU and test limit analysis for FR2a, FR2b and FR2c.\nRAN5 is asked to endorse following proposals.\nProposal 1 : Adopt the MU as shown in Table 1 for the cases without relaxation.\nProposal 2 : Adopt Option 1 in Table 1 for the MU and relaxation value for the cases with relaxation","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8430,"status":"revised","reservation_date":"2021-02-08 02:06:40","uploaded":"2021-02-08 03:26:22","revisionof":"","revisedto":"R5-211946","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210843.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210844","title":"On MTSU for FR2 RRM test","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"MU for FR2 RRM test setups have been discussed for these several meetings.  Various types of test setups: DFF, IFF, Enhanced IFF, IFF+DFF, test setups were studied. It is already captured in TS 38.508-1 that the threshold MU for D = 5cm is that for DFF and IFF for otherwise. This does not clearly say about the final MTSU definition hence we discuss here the definition of MTSU for FR2 RRM test setup and also the MU used for TT analysis.\n2.       \tDiscussion\nAs already mentioned in our papers ever, MU for TT analysis would be desired to be a single value considering the heavy workload of TT analysis. It will not be realistic to use different values for different test methods and test case types etc.\n\nObservation 1 : Considering the workload of TT analysis, using different MU value for test setup types and test case type(1AoA, 2AoA, etc\u2026) is not realistic.\n\nAs expected, the MU studies even in RAN5 shows that the absolute power MU will be bigger with DFF than with IFF. Despite that, as the DFF has been considered as a test setup from the very beginning of the OTA test method study and is beneficial in terms of cost, complexity aspect especially for 2AoA test cases, then it shall not be eliminated. \n\nObservation 2 : Despite IFF will have an advantage in total MU perspective, DFF will have an advantage in terms of test system cost, complexity, footprints especially for 2AoA test cases\n\nConsidering these aspects, we propose the followings for the MTSU definition and MU for TT analysis.\nProposal 1 : Define MTSU based on DFF for all the FR2 RRM test cases and use it for TT analysis.\nNote that it is likely the difference of MU between DFF and IFF will be only in absolute power MU(DL and UL) and will not be in relative power MU and timing measurement MUs.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8440,"status":"noted","reservation_date":"2021-02-08 02:06:40","uploaded":"2021-02-08 03:26:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210844.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210845","title":"On FR2 relative power measurement uncertainty","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8450,"status":"noted","reservation_date":"2021-02-08 02:06:40","uploaded":"2021-02-08 03:26:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210845.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210945","title":"Discussion on the default TDD configuration for EN-DC RF test cases","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"discussion","for":"Discussion","abstract":"CRs in R5-210946 and 0947.\nIn TS 38.521-3 EN-DC Tx test cases, E-UTRA configuration is reconfigured to TDD Config 2 for the case of E-UTRA and NR UL simultaneous transmission when both bands are TDD (overlapping test points), while E-UTRA carrier is configured with the default TDD Config 1 as per TS 38.508 for other non-overlapping test points. \nThe purpose of this document is to analyse why TDD Config 2 also applies to the non-overlapping EN-DC Tx test cases so that TDD config 2 can replace TDD Config to be the default E-UTRA TDD configuration in TS 38.508.\nFor EN-DC Tx test cases, it is proposed RAN5 consider below proposal.\nProposal: For EN-DC Tx test cases, TDD Config 2 could be used as the default configuration for E-UTRA TDD since it is not only necessary for overlapping testing but also applicable to non-overlapping testing.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":9450,"status":"withdrawn","reservation_date":"2021-02-08 07:42:08","uploaded":"2021-02-08 11:18:08","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210945.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-210948","title":"Discussion on the uplink power configuration for EN-DC RF cases","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"discussion","for":"Discussion","abstract":"CRs in R5-210949 and 0950.\nFor EN-DC Tx test cases, UEs need to be configured a maximum power PLTE for transmissions on the MCG by p-MaxEUTRA and a maximum power PNR for transmissions in FR1 on the SCG by p-NR-FR1. In TS 38.521-3, there are a lot of EN-DC Tx test cases with LTE anchor agnostic applied, where the value of PLTE and PNR follows the default configuration of TS 38.508-1. However, the default value of PLTE and PNR may not be appropriate for critical testing.\nThe purpose of this document is to derive the appropriate value of PLTE and PNR for EN-DC Tx test cases applying LTE anchor agnostic to acheive critical testing.For EN-DC Tx test cases, it is proposed RAN5 consider below proposals:\nProposal 1: In EN-DC RF test cases with LTE anchor agnostic applied, for non-DPS UEs PNR shall be set to the supported power class so that the active NR carrier could achieve the maximum transmitted power.\nProposal 2: In EN-DC RF test cases that LTE anchor agnostic applied, for non-DPS UEs it is suggested to set PLTE as 10 dBm for PC3 and 13 dBm for PC2 to ensure that TDM pattern configuration is not needed.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":9480,"status":"revised","reservation_date":"2021-02-08 07:42:10","uploaded":"2021-02-08 11:43:00","revisionof":"","revisedto":"R5-211938","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-210948.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211015","title":"Discussion on test coverage for reference sensitivity for EN-DC configs with exceptions","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"discussion","for":"Discussion","abstract":"CRs in R5-211016 and 1017","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":10150,"status":"revised","reservation_date":"2021-02-08 09:37:20","uploaded":"2021-02-08 12:09:20","revisionof":"","revisedto":"R5-211939","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211015.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211083","title":"Input on fading crest factor margin for FR2 Demodulation test cases","source":"Qualcomm Wireless GmbH","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution provides input on action point AP#89e.23 which was raised to collect inputs on acceptable fading crest factor margin for FR2 Demod performance and CSI test cases.\nProposal 1: Consider the faded signal (signal after channel emulation) crest factor for computing the achievable SNR in FR2 system.\nProposal 2: Use 17.71 dB as the overall backoff for maximum testable SNR calculation instead of separately considering signal and fading PAPR.\nObservation 1: Consider a higher probability of saturation of faded signal (say 10^-6) to further optimize the maximum testable SNR.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":10830,"status":"revised","reservation_date":"2021-02-08 11:30:35","uploaded":"2021-03-06 17:31:15","revisionof":"","revisedto":"R5-211947","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211083.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211104","title":"Correction of parameters of FR2 ACLR test cases","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"This paper provides the correction of relaxation value of single carrier FR2a ACLR test cases. The relaxation value for single carrier test and CA tests have already endorsed at RAN5#88e [1] and RAN5#89e [2] respectively, however, T(MPR) was considered for derivation of relaxation only in CA and not in single carrier. To correct this inconsistency, we re-propose the relaxation for single carrier test with the proper consideration of T(MPR). Note that this paper does not cover FR2b, because we decided not to apply relaxation in FR2b.\nRAN5 is asked to endorse following proposals.\nProposal 1 : For FR2 ACLR test case for single carrier, apply the relaxation in Table 2 for FR2a.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11040,"status":"noted","reservation_date":"2021-02-08 11:54:01","uploaded":"2021-02-08 12:17:53","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211104.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211105","title":"The degradation of TE noise floor for ON OFF time mask and how to avoid it","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11050,"status":"noted","reservation_date":"2021-02-08 11:54:01","uploaded":"2021-02-08 12:17:53","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211105.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211112","title":"Discussion on inter-band CA configurations in RAN5 specs","source":"ZTE Corporation","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"discussion","for":"Endorsement","abstract":"This paper is to discuss the optimization issue of inter-band CA configurations in RAN5 specs","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11120,"status":"noted","reservation_date":"2021-02-08 11:57:12","uploaded":"2021-02-08 14:30:14","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211112.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211135","title":"Discussion on test points for EN-DC refsens with exception avoiding","source":"Ericsson","contact":"Mikael Ziren","contact-id":88614,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11350,"status":"revised","reservation_date":"2021-02-08 13:18:26","uploaded":"2021-02-08 23:00:29","revisionof":"","revisedto":"R5-211940","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211135.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211179","title":"On Additional Spurious emissions","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"'This document provides updates to Additional Spurious emissions MU and testability","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11790,"status":"revised","reservation_date":"2021-02-08 14:02:12","uploaded":"2021-02-08 14:04:58","revisionof":"","revisedto":"R5-211948","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211179.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211184","title":"On ETC MUs","source":"Keysight Technologies UK Ltd, Rohde & Schwarz","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution is revisiting preliminary agreements made on ETC MUs in the last meeting.\nThe following observations and proposals were made in this contribution\nObservation 1: The QoQZ with the ETC enclosure, MUQoQZ,ETC is generally higher than without the ETC enclosure, MUQoQZ,NTC.\nProposal 1: Remove the recently added MU element \u2018Influence of ETC on EIRP\/EIS\u2019 from 38.903\nProposal 2: Add a note in the tables for ETC in [2], i.e., Table B.3.2-8 and B.19.2-4, to highlight that the ETC QoQZ MU and ETC calibration path losses shall be applied to the NTC test cases if the ETC environment is used for NTC test cases.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11840,"status":"noted","reservation_date":"2021-02-08 15:22:31","uploaded":"2021-02-08 22:42:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211184.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211186","title":"On Larger Quiet Zone Sizes with Grey Box","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11860,"status":"revised","reservation_date":"2021-02-08 15:22:35","uploaded":"2021-02-08 22:42:17","revisionof":"","revisedto":"R5-211949","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211186.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211189","title":"PC1 MUs based on the revised antenna array assumptions","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11890,"status":"noted","reservation_date":"2021-02-08 15:22:37","uploaded":"2021-02-08 22:42:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211189.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211192","title":"On n259 QoQZ and XPD MU","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11920,"status":"noted","reservation_date":"2021-02-08 15:22:39","uploaded":"2021-02-08 22:42:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211192.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211193","title":"On the MU Element \u201cUncertainty of an absolute gain of the calibration antenna\u201d for n259","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11930,"status":"noted","reservation_date":"2021-02-08 15:22:39","uploaded":"2021-02-08 22:42:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211193.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211194","title":"On Declaration of Antenna Aperture for DFF based RRM systems","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution is addressing the need for antenna aperture D declaration for DFF methodologies.\nThe following observations and proposals were made in this contribution. \nObservation 1: Radiating aperture declarations have not been captured in 38.508-2.\nObservation 2: Since some focus has shifted towards the DFF methodology, especially for 2 AoA RRM test cases, it is important to define the vendor declaration of the radiation aperture in 38.508-2.\nObservation 3: UE vendors have been reluctant to declare the detailed radiating aperture information\nProposal 1: OEMs to provide feedback on which antenna aperture declaration to incorporate in TS38.508-2 for DFF methodology: \n--- Option 1: UE vendors declares the exact maximum radiation aperture of any of the panels integrated in the UE\n--- Option 2: UE vendor declares whether the maximum radiation aperture of any of the panels integrated in the UE is =5cm or not\n--- Other options are not precluded","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11940,"status":"noted","reservation_date":"2021-02-08 15:22:39","uploaded":"2021-02-08 22:42:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211194.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211206","title":"FR1 Test Tolerance review training","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"RRM FR1 TT review process explanation.\nContent of this document\nWhy do we need an analysis\nReview of the analysis for a simple intra-frequency re-selection test case 6.1.1.1 \nHigh level summary of the analysis .doc\nTest Tolerances in 38.533\nTest Case Grouping in 38.903\nThe document focus is on .xls file\nThis document covers technical aspects of TT review\nFR1 Test Tolerance review process is covered in R5-192615","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12060,"status":"revised","reservation_date":"2021-02-08 17:37:21","uploaded":"2021-02-08 20:40:37","revisionof":"","revisedto":"R5-211654","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211206.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211207","title":"FR2 Test Tolerance review training","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"RRM FR2 TT review process explanation.\nContent of this document\nBasic information.\nReview of the analysis for a test case 5.7.1.1 focusing on .xls file.\nThe document focus is on .xls file.\nThis document covers technical aspects of TT review\nFR2 Test Tolerance review process is covered in R5-204848.\nThe FR2 Test Tolerance framework is based on FR1 which is covered in R5-211206. Most of the principles are the same. This document focuses on differences. It is advised to read R5-211206 first, followed by this document to get the understanding of both FR1 and FR2 TT analysis. \nScope\nThis training covers an example RRM Test Case in 38.533, with the analysis stored in TS 38.903.\nThe chosen test case is 5.7.1.1 \u2013 intra-frequency measurement accuracy.\nAt the time of creating this document no formally agreed FR2 TT is completed. TT analysis used as example is draft which contains the main features for the test cases covered.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12070,"status":"revised","reservation_date":"2021-02-08 17:37:25","uploaded":"2021-02-08 20:40:37","revisionof":"","revisedto":"R5-211655","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211207.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211227","title":"Discussion on PCC prioritization for FR1 and FR2 UL CA testing","source":"Qualcomm Finland RFFE Oy","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Endorsement","abstract":"The purpose of this discussion paper is to revive the discussion in RAN 5 on 5G NR PCC prioritization configuration for FR1 and FR2 UL CA testing.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12270,"status":"revised","reservation_date":"2021-02-08 17:56:12","uploaded":"2021-02-08 18:38:19","revisionof":"","revisedto":"R5-211941","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211227.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211232","title":"Quality of the Quiet Zone measurement results for 20cm QZ","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Endorsement","abstract":"Following the discussion during last meeting regarding 20cm QZ size, we present here the requested measurements results.\nObservation 1: 20cm QZ results are comparable to the QZ results used to define MTSU.\nObservation 2: 20cm QZ results drive to expanded uncertainty values = MTSU in all cases.\nProposal: keep 20cm QZ as currently defined in TS 38.521-2, TS 38.508-1 and TR 38.901.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12320,"status":"noted","reservation_date":"2021-02-08 18:22:44","uploaded":"2021-02-08 21:58:51","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211232.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211235","title":"Discussion on the size of Quiet Zone above 30cm","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Endorsement","abstract":"Following the discussion in previous meetings regarding QZ sizes larger than 30cm in diameter, we present here our views on the next steps.\nObservation 1: irrespective of potential improvements to current QZ size (i.e. 30cm), a new QZ size is required in","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12350,"status":"noted","reservation_date":"2021-02-08 18:28:34","uploaded":"2021-02-08 21:58:51","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211235.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211247","title":"Simplified Quality of the Quiet Zone procedure","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution presents the analysis of current QoQZ procedure, corresponding effort and proposals for an alternate reduced procedure.\nObservation 1: full QoQZ evaluation requires between 10-15 working days.\nObservation 2: reference positions P1 to P5","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12470,"status":"noted","reservation_date":"2021-02-08 18:31:23","uploaded":"2021-02-08 21:58:51","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211247.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211259","title":"On the achievable SNR for demod test cases","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CR in R5-211260 and R5-211261.\nIn the last RAN5 meeting the testability of high SNR demod test cases has been discussed [1, 2]. However, the maximum achievable SNR could not be finalized since details on the acceptable clipping frequency are still open. In the meantime, a limit on the achievable SNR has been defined for FR2a in order to enable testing of low SNR test points. In this contribution, we propose limits for frequency range FR2b and FR2c and an update of FR2a as interim solution until the acceptable backoff due to fading has been decided.\nIn summary, the maximum achievable SNR of demod test cases has been discussed.\nProposal 1: For the cable loss assume 6.3 dB for FR2a, 8.6 dB for FR2b, and 10.0 dB for FR2c.\nProposal 2: Specify an interim maximum achievable SNR of 11.9 dB (FR2a), 7.1 dB (FR2b), and [4.5] dB (FR2c) for 100MHz CHBW, PC3 and IFF with 30cm Quiet Zone. The FR2c value is preliminary and maybe further reduced since the absolute DL MU has not been finalized for FR2c. Enable testing of the test points with SNR less than or equal to these values for 100 MHz CHBW.\nProposal 3: Update the backoff in the Demod SNR range calculator spreadsheet based on the outcome of the acceptable clipping discussion in order to obtain the final maximum achievable SNR.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12590,"status":"revised","reservation_date":"2021-02-08 19:44:19","uploaded":"2021-02-08 22:52:19","revisionof":"","revisedto":"R5-211950","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211259.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211262","title":"On the QoQZ standard deviation for ETC testing","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"withdrawn due to double reservation","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12620,"status":"withdrawn","reservation_date":"2021-02-08 19:44:21","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211263","title":"On the MU for n259","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12630,"status":"revised","reservation_date":"2021-02-08 19:44:21","uploaded":"2021-02-08 22:52:19","revisionof":"","revisedto":"R5-211656","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211263.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211266","title":"On the MU of FR2 OBW","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"The measurement uncertainty (MU) of occupied bandwidth (OBW) has been discussed during the last meetings [1] to [20]. However, no final conclusion has been reached. This contribution is a resubmission of the paper submitted to RAN5#89-e [19].\nIn summary, the impact of SNR and frequency flatness on the OBW MU has been analyzed. \nProposal 1: For the MU of the single carrier occupied bandwidth TC apply the values in Table 2 for  PC3.","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12660,"status":"noted","reservation_date":"2021-02-08 19:44:23","uploaded":"2021-02-08 22:52:19","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211266.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211268","title":"On FR2 ON\/OFF Time Mask","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12680,"status":"noted","reservation_date":"2021-02-08 19:44:23","uploaded":"2021-02-08 22:52:19","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211268.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211275","title":"Measurement uncertainties for PC1 devices","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12750,"status":"noted","reservation_date":"2021-02-08 21:28:03","uploaded":"2021-02-08 21:30:21","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211275.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211276","title":"FR2 Extreme testing conditions applicability","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12760,"status":"noted","reservation_date":"2021-02-08 21:44:45","uploaded":"2021-03-06 17:31:16","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211276.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211653","title":"On the DL AWGN MTSU for RRM","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":4521,"status":"noted","reservation_date":"2021-03-08 12:28:42","uploaded":"2021-03-08 12:31:25","revisionof":"R5-210452","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211653.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211654","title":"FR1 Test Tolerance review training","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12061,"status":"noted","reservation_date":"2021-03-08 12:28:42","uploaded":"2021-03-08 12:31:25","revisionof":"R5-211206","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211654.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211655","title":"FR2 Test Tolerance review training","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12071,"status":"noted","reservation_date":"2021-03-08 12:28:42","uploaded":null,"revisionof":"R5-211207","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211656","title":"On the MU for n259","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12631,"status":"noted","reservation_date":"2021-03-08 12:28:42","uploaded":"2021-03-08 12:31:25","revisionof":"R5-211263","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211656.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211850","title":"On minimum requirements for Transmit ON\/OFF time mask in UL MIMO FR1","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":3121,"status":"noted","reservation_date":"2021-03-08 12:32:10","uploaded":"2021-03-08 12:41:19","revisionof":"R5-210312","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211850.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211937","title":"Discussion on equal PSD and PCC prioritization for UL CA test","source":"Guangdong OPPO Mobile Telecom.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":4201,"status":"noted","reservation_date":"2021-03-08 12:34:10","uploaded":"2021-03-09 09:51:17","revisionof":"R5-210420","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211937.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211938","title":"Discussion on the uplink power configuration for EN-DC RF cases","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":9481,"status":"noted","reservation_date":"2021-03-08 12:34:10","uploaded":"2021-03-08 12:41:21","revisionof":"R5-210948","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211938.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211939","title":"Discussion on test coverage for reference sensitivity for EN-DC configs with exceptions","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":10151,"status":"noted","reservation_date":"2021-03-08 12:34:10","uploaded":"2021-03-08 12:41:21","revisionof":"R5-211015","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211939.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211940","title":"Discussion on test points for EN-DC refsens with exception avoiding","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11351,"status":"noted","reservation_date":"2021-03-08 12:34:10","uploaded":"2021-03-08 12:41:21","revisionof":"R5-211135","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211940.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211941","title":"Discussion on PCC prioritization for FR1 and FR2 UL CA testing","source":"Qualcomm Finland RFFE Oy","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12271,"status":"noted","reservation_date":"2021-03-08 12:34:10","uploaded":"2021-03-08 12:41:21","revisionof":"R5-211227","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211941.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211943","title":"On ACS and IBB FR2 MU definition","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":3111,"status":"noted","reservation_date":"2021-03-08 12:34:11","uploaded":"2021-03-08 12:41:21","revisionof":"R5-210311","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211943.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211944","title":"On the QoQZ standard deviation for ETC testing","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":5571,"status":"noted","reservation_date":"2021-03-08 12:34:11","uploaded":"2021-03-08 12:41:21","revisionof":"R5-210557","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211944.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211945","title":"On MU for FR2 Blocker Test","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8411,"status":"noted","reservation_date":"2021-03-08 12:34:11","uploaded":"2021-03-08 12:41:21","revisionof":"R5-210841","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211945.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211946","title":"On FR2 OBW MU","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8431,"status":"noted","reservation_date":"2021-03-08 12:34:11","uploaded":"2021-03-08 12:41:21","revisionof":"R5-210843","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211946.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211947","title":"Input on fading crest factor margin for FR2 Demodulation test cases","source":"Qualcomm Wireless GmbH","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":10831,"status":"noted","reservation_date":"2021-03-08 12:34:11","uploaded":"2021-03-08 12:41:21","revisionof":"R5-211083","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211947.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211948","title":"On Additional Spurious emissions","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11791,"status":"noted","reservation_date":"2021-03-08 12:34:11","uploaded":"2021-03-08 12:41:21","revisionof":"R5-211179","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211948.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211949","title":"On Larger Quiet Zone Sizes with Grey Box","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11861,"status":"noted","reservation_date":"2021-03-08 12:34:12","uploaded":"2021-03-08 12:41:21","revisionof":"R5-211186","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211949.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-211950","title":"On the achievable SNR for demod test cases","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":91,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12591,"status":"noted","reservation_date":"2021-03-08 12:34:12","uploaded":"2021-03-08 12:41:21","revisionof":"R5-211259","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211950.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]