[{"name":"R5-205571","title":"Discussion on restructuring of TR 38.905 to better reflect the TS 38.521-x structure.","source":"Ericsson","contact":"Mats Johansson","contact-id":38077,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":55710,"status":"revised","reservation_date":"2020-10-28 17:33:56","uploaded":"2020-10-31 07:16:21","revisionof":"","revisedto":"R5-206842","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205571.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205622","title":"On the influence of the XPD for Enhanced-IFF","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":56220,"status":"noted","reservation_date":"2020-10-29 08:43:44","uploaded":"2020-10-30 15:41:29","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205622.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205623","title":"On the DL AWGN absolute power or wanted DL signal absolute power","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1: Use 5.25 dB as DL AWGN absolute power MU for enhanced IFF.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":56230,"status":"noted","reservation_date":"2020-10-29 08:43:44","uploaded":"2020-10-30 15:41:29","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205623.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205624","title":"On the QoQZ for enhanced IFF","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1: Define the QoQZ MU based on the repositioning approach.\nProposal 2: Use 0.7 dB as QoQZ Measurement Uncertainty for enhanced IFF.\nProposal 3: Use 0.4 dB as QoQZ Measurement Uncertainty for calibration for enhanced IFF.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":56240,"status":"noted","reservation_date":"2020-10-29 08:43:44","uploaded":"2020-10-30 15:41:29","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205624.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205660","title":"Discussion paper on specific test frequencies for RRM testing","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"discussion","for":"Endorsement","abstract":"It is proposed that:\nProposal#1: It is proposed that specific test frequency tables for RRM testing are introduced in TS 38.508-1[3] in chapter 4.3.1 under each NR band sub-clause and that the test frequencies are calculated based on the offset of SSB and CORESET#0 is as close as possible to 0.\nProposal#2: It is proposed that the principles for calculating test frequencies for RRM testing is based on the principles outlined in clause 2.3.2. \nProposal#3: It is proposed study if also NR FR1 bands need specific test frequencies to secure that SSB does not overlap the RMC. \nA CR in [5] to Annex C in TS 38.508-1 [1] have been submitted describing the principles in clause 2.3.3 for calculation RRM test frequencies in for RRM testing. A set of CRs in [6] to [10] have been submitted to add specific test frequency tables for RRM testing in new clause 4.3.1 in TS 38.508-1 [1].","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":56600,"status":"revised","reservation_date":"2020-10-29 15:13:23","uploaded":"2020-10-30 20:52:00","revisionof":"","revisedto":"R5-206789","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205660.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205702","title":"On Fading Impact on CREST and Demod Testability Analysis","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CR in R5-205703.\nIn summary, the impact of fading conditions on the testability of demod test cases has been analyzed.\nObservation 1: Faded signals used in demod FR2 test cases have a CREST factor which is approximately 10 dB higher than that of signals without fading.\nObservation 2: RAN4 has not taken into account fading in the demod SNR analysis.\nObservation 3: RAN5 needs to investigate the testability of demod, CQI, and PMI TCs on a case by case basis.\nProposal 1: Consider a backoff of 23 dB when determining the achievable SNR of the test system. \nProposal 2: Discuss how to proceed with demod test cases which are considered not testable.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":57020,"status":"noted","reservation_date":"2020-10-29 17:58:15","uploaded":"2020-10-31 04:45:16","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205702.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205713","title":"AP#87e.23 Test coverage for large devices","source":"Apple (UK) Limited","contact":"Wisuit Sinsathitchai","contact-id":81714,"tdoctype":"discussion","for":"Endorsement","abstract":"AP#87e.23\nIn this contribution, the following observations and proposal were made\nObservation 1: Extend current QZ size from 30 cm to 35 cm with grey-box approach would cover most of handsets and tablets and limit the device size at 40 cm.\nObservation 2: Measurement Uncertainty impact due to extending QZ size shall be evaluated as a trade-off.\nObservation 3: FR2 test coverage on larger device than 35 cm shall be studied based on feedbacks from Operators and OEMs.\nProposal 1: Have an option to extend the current quiet zone size to 35 cm with grey-box approach to cover all tablets with considering MU impact with limit the maximum device size at 40 cm.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":57130,"status":"noted","reservation_date":"2020-10-29 20:36:52","uploaded":"2020-10-30 04:32:44","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205713.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205865","title":"Noise impact for FR2 CA test case where MPR applies","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":58650,"status":"revised","reservation_date":"2020-10-30 08:27:04","uploaded":"2020-10-30 08:36:04","revisionof":"","revisedto":"R5-206611","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205865.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205921","title":"Discussion on FR2 Demod and CSI MTSU and TT","source":"Qualcomm Austria RFFE GmbH","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":59210,"status":"revised","reservation_date":"2020-10-30 09:59:59","uploaded":"2020-10-31 04:22:41","revisionof":"","revisedto":"R5-206612","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205921.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205971","title":"Discussion on Test Tolerance for RRM test 6.1.1.1","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1: Assuming baseband combining for the signal and noise in RRM testing.\nProposal 2: Set the MU to \u00b10.3 dB Es\/Noc accuracy over Meas PRBs and apply the MU to FR1 and FR2 RRM testing with baseband combining of AWGN and signal assumed.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":59710,"status":"revised","reservation_date":"2020-10-30 12:07:14","uploaded":"2020-10-31 03:54:38","revisionof":"","revisedto":"R5-206607","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205971.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205990","title":"Discussion on test points in Receiver test cases for EN-DC configurations with exception requirements","source":"Ericsson, DISH, Orange","contact":"Mikael Ziren","contact-id":88614,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal\nProposal 1: Update section 4.5 of 38.521-3 (Applicability and test coverage rules) to more clearly indicate category 3 case\nProposal 2: For EN-DC configurations with exceptions, add test coverage for standalone FR1 requirement when the exception is avoided whenever possible for NSA only UE.\nProposal 3: Also for SA+NSA UE add test coverage for standalone FR1 requirement when the exception is avoided whenever possible.\nProposal 4:  Test the standalone FR1 requirement when the exception is avoided with the agressor still active but with a frequency setting causing harmonic interference to fall outside the victim carrier (\u201cmiss\u201d).\nProposal 5: Other than refsens Rx test cases should use the MSD=0 test points defined in refsens test case, or minimum achievable MSD\nProposal 6: Include test coverage in IMD EN-DC configurations for when the IMD does not apply. This is especially important in other Rx requirements than refsens.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":59900,"status":"revised","reservation_date":"2020-10-30 12:29:42","uploaded":"2020-10-30 15:43:43","revisionof":"","revisedto":"R5-206841","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205990.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205991","title":"Discussion on FR2 ON-OFF time mask","source":"Ericsson","contact":"Mikael Ziren","contact-id":88614,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1: Apply TT=0 in the OFF power measurement inside ON\/OFF time mask test case \nProposal 2: Since the ON power measurement is not useful, focus on the OFF power measurement instead. Ensure that ON power is at max power (min peak EIRP), which will improve the OFF power measurement (make non-conformant transients more visible).","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":59910,"status":"revised","reservation_date":"2020-10-30 12:29:42","uploaded":"2020-10-30 15:43:43","revisionof":"","revisedto":"R5-206785","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205991.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206068","title":"On Larger Quiet Zone Sizes","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution addresses an approach to test devices that cannot be tested in the largest 30cm diameter QZ","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":60680,"status":"noted","reservation_date":"2020-10-30 14:43:06","uploaded":"2020-10-31 00:28:34","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206068.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206069","title":"On 20cm Quiet Zone","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution is proposing to abandon the 20cm diameter quiet zone size.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":60690,"status":"noted","reservation_date":"2020-10-30 14:43:06","uploaded":"2020-10-31 00:28:34","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206069.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206072","title":"QoQZ and EIRP\/EIS MU results for ETC testing","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution is providing QoQZ results evaluated using the IFF methodology with a 30cm QZ. Two separate campaigns were performed, one with NTC and another with ETC. The results outline that the effect of the ETC enclosure surrounding the DUT on the Q","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":60720,"status":"revised","reservation_date":"2020-10-30 14:43:08","uploaded":"2020-10-31 00:28:34","revisionof":"","revisedto":"R5-206819","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206072.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206075","title":"On DFF QoQZ MU","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution is presenting DFF QoQZ MU for 2 AoA RRM.\nThe following observations and proposals were made in this contribution\nProposal 1: Set the MU element of Quality of Quiet Zone for FR2_A, FR2_B, and FR2_C to 1.1dB or 1.3dB for Stage 2 depending on whether the re-positioning concept is used as a baseline for MTSU and to 0.3dB for Stage 1 for 2 AoA RRM test cases based on the DFF implementation\nProposal 2: Set the MU element of Quality of Quiet Zone for FR2_A, FR2_B, and FR2_C for 1 AoA RRM test cases to the same values as for the 2 AoA RRM test cases based on the DFF implementation.\nProposal 3: For validation test ranges FR2_A, FR2_B, and FR2_C, define the \u201cInfluence of XPD\u201d MU for DFF to be 0.03dB.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":60750,"status":"revised","reservation_date":"2020-10-30 14:43:10","uploaded":"2020-10-31 00:28:34","revisionof":"","revisedto":"R5-206608","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206075.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206130","title":"Discussion on size of Quiet Zone above 30cm","source":"ROHDE & SCHWARZ","contact":"Jose M. Fortes Lopez","contact-id":78787,"tdoctype":"discussion","for":"Endorsement","abstract":"This contribution addresses the need for larger quiet zone sizes and provides our view on this topic.\nThe following observations and proposals were made in this contribution:\nObservation 1: introducing grey-box approach with current 30cm QZ size will enab","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61300,"status":"noted","reservation_date":"2020-10-30 17:28:47","uploaded":"2020-10-30 17:36:39","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206130.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206150","title":"On PC3 Beam Correspondence Measurement Uncertainty","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61500,"status":"withdrawn","reservation_date":"2020-10-30 19:51:09","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206153","title":"On Testability Aspects for FR2 Demodulation Testing","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61530,"status":"withdrawn","reservation_date":"2020-10-30 21:03:45","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206154","title":"On DFF MU Tables in 38.903","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"The following observations and proposals were made in this contribution:\nProposal 1: For MU elements belonging to Group 1, the proposal is to re-use values from IFF test setup defined in TR 38.903 Table E.3.1.3-2 for DFF test setup.\nProposal 2: To add Table 4 in TR 38.903 Annex E.3.1.1 as Uncertainty assessment for DL AWGN absolute power or wanted DL signal absolute power (f=23.45GHz, 32.125GHz, 40.8GHz, Quiet Zone size = 30 cm) for DFF test setup.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61540,"status":"revised","reservation_date":"2020-10-30 21:06:00","uploaded":"2020-10-30 22:20:13","revisionof":"","revisedto":"R5-206613","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206154.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206166","title":"On Measurement Distance uncertainty and phase curvature uncertainty for DFF","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"In this contribution, we present our view on the measurement distance uncertainty and phase curvature in DFF budget table. RAN5 is asked to endorse following proposals.\nProposal 1 : Define measurement distance uncertainty as 0.15dB with triangular distribution for DFF.\nProposal 2 : Define phase curvature 0.0dB for DFF.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61660,"status":"noted","reservation_date":"2020-10-30 21:59:54","uploaded":"2020-10-31 00:52:24","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206166.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206167","title":"DFF Quality of Quiet Zone for DFF and IFF-DFF FR2 RRM test setup","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"RAN5 is asked to endorse following proposals.\nObservation 1 : QoQZ for 30deg(best case assumption) and 150deg(worst case assumption) are well matches and there is no significant difference\nObservation 2: QoQZ with non-repositioning concept will become large to make the total MU above 6dB.\nObservation 3: Lost of test coverage by the re-positioning concept is slight.\nProposal 1 : Mandate verification of QoQZ in IFF-DFF chamber against the one DFF probe among all the DFF probes and against one IFF reflector among all the IFF reflectors.\nProposal 2 : Define DFF QoQZ with 1.4dB for measurement stage based on re-positioning approach\nProposal 3 : Define DFF QoQZ with 0.4dB for calibration stage based on re-positioning approach.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61670,"status":"noted","reservation_date":"2020-10-30 21:59:54","uploaded":"2020-10-31 00:52:24","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206167.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206168","title":"On the achievable SNR for FR2 demod and perf test cases","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61680,"status":"revised","reservation_date":"2020-10-30 21:59:54","uploaded":"2020-10-31 00:52:24","revisionof":"","revisedto":"R5-206614","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206168.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206172","title":"On XPD MU for DFF","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61720,"status":"noted","reservation_date":"2020-10-30 21:59:57","uploaded":"2020-10-31 02:48:55","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206172.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206173","title":"On FR2 Blocker Test with Offset Antenna","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1 : Introduce new MU terms regarding impact from offset antenna for FR2 blocker test \nProposal 2 : Define MTSU based on the common antenna assumption and permit the use of offset antenna for the FR2 blocking test case (ACS and IBB) as long as total MTSU is met.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61730,"status":"revised","reservation_date":"2020-10-30 21:59:57","uploaded":"2020-10-31 00:52:24","revisionof":"","revisedto":"R5-206615","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206173.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206174","title":"On n259 MU and testability limit","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61740,"status":"revised","reservation_date":"2020-10-30 21:59:57","uploaded":"2020-10-31 05:40:55","revisionof":"","revisedto":"R5-206786","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206174.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206175","title":"On FR2 OBW MU","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"In this paper FR2 OBW MU and testability limit is studied, which is summarized in Table 4.\nObservation 1 : Testability of FR2 OBW is analyzed as in Table 4.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61750,"status":"noted","reservation_date":"2020-10-30 21:59:57","uploaded":"2020-10-31 05:40:55","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206175.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206176","title":"On FR2b Spurious emission MU","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1 : Adopt the values in Table 2 for the FR2b spurious emission MTSU(General, Receiver).\nConsidering the fact that there was no contribution on this topic for several meeting despite the original target date is well passed, if RAN5 requests more time for the confirmation, put [ ] for the value and remove it unless contributions on the concrete values are provided.\nProposal 2 : In case RAN5 requests more time to confirmation, put [ ] for the values and remove [ ] unless contributions for the concrete values are provided in RAN5#90e.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61760,"status":"revised","reservation_date":"2020-10-30 21:59:57","uploaded":"2020-10-31 02:48:55","revisionof":"","revisedto":"R5-206616","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206176.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206180","title":"On AoA change in FR2 RRM test","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61800,"status":"withdrawn","reservation_date":"2020-10-30 22:00:00","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206182","title":"On Spurious measurement uncertainties","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61820,"status":"withdrawn","reservation_date":"2020-10-30 22:35:59","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206183","title":"On Occupied Bandwidth measurement uncertainties","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61830,"status":"withdrawn","reservation_date":"2020-10-30 22:47:05","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206184","title":"On the MU of FR2 OBW","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"In summary, the impact of SNR and frequency flatness on the OBW MU has been analyzed.\nProposal 1: For the MU of the single carrier occupied bandwidth TC apply the values in Table 2 for  PC3.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61840,"status":"revised","reservation_date":"2020-10-30 22:38:24","uploaded":"2020-10-31 08:59:23","revisionof":"","revisedto":"R5-206617","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206184.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206185","title":"PC1 Assumptions for CDF Curve for MOP EIRP Spherical Coverage","source":"Qualcomm Japan LLC","contact":"Shahab Mohammad","contact-id":77324,"tdoctype":"discussion","for":"Endorsement","abstract":"PC1 Assumptions for CDF Curve for MOP EIRP Spherical Coverage","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61850,"status":"revised","reservation_date":"2020-10-30 22:55:33","uploaded":"2020-10-31 05:15:54","revisionof":"","revisedto":"R5-206618","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206185.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206186","title":"PC1 Assumptions for CDF Curve for MOP EIRP Spherical Coverage","source":"Qualcomm Japan LLC","contact":"Shahab Mohammad","contact-id":77324,"tdoctype":"discussion","for":"Endorsement","abstract":"RAN5 is asked to endorse following proposals.\nObservation 1 : Required crest factor margin due to fading defers depending on fading model and doppler frequency.\nObservation 2 : Worst case scenario (among those defined for FR2 demod test) in terms of required crest factor margin is TDLA30. \nObservation 3 : Crest factor margin of fading and OFDM waveform needs to be added in dB in order. If enough crest factor margin is considered due to fading, the clipping occurrence frequency at the fading peak will be same as that in static propagation(no-fading) scenario.  \nObservation 4 : If we need additional margin like 5~10dB due to fading crest factor, many of the test points will be judged as \u201cnot testable\u201d especially for higher frequencies . Discussion on the possible reduction of margin due to fading crest factor at the cost of increased clipping frequency is needed.\nObservation 5 : Clipping probability of 1.0e-4 may be considered to give small impact to the test result. \nProposal 1 : Confirm chip\/UE vendors\u2019 on the acceptable clipping occurrence frequency for FR2 demodulation\/performance test case with fading.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61860,"status":"withdrawn","reservation_date":"2020-10-30 23:56:58","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206192","title":"Discussion on the MU for band n259","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"Proposal 1: Apply the MU values in Table 1 as basis solely for TT derivation and not to use them for MTSU \nProposal 2: For MTSU related to n259, analyze at least mismatch, quality of quiet zone, impact of noise, relaxation and testability in detail. Analysis of the other MU contributors is encouraged.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61920,"status":"revised","reservation_date":"2020-10-30 22:42:00","uploaded":"2020-10-31 04:45:17","revisionof":"","revisedto":"R5-206787","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206192.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206240","title":"Proposing update to Rel-16 EN-DC PC2 MOP test cases based on TEI-16 maintenance in RAN4","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Agreement","abstract":"This document provides the background of RAN4 TEI-16 maintenance of NR part power class of EN-DC band combination, also along with the proposed RAN5 changes.\nIt\u2019s suggested RAN5 discuss and endorse below proposal:\nProposal 1: RAN5 endorses the WP for introducing powerClassNRPart in conformance test specifications.\nProposal 2: Complete Rel-16 PC2 EN-DC MOP test case by splitting test requirement of NR part depending on UE reported capability. The changes shall be clearly indicated as applying to only Rel-16.","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":58871,"status":"revised","reservation_date":"2020-11-22 12:48:14","uploaded":"2020-11-22 12:51:20","revisionof":"","revisedto":"R5-206840","release":"Rel-16","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"TEI16_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206240.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206607","title":"Discussion on Test Tolerance for RRM test 6.1.1.1","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":59711,"status":"noted","reservation_date":"2020-11-22 12:52:28","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205971","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206607.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206608","title":"On DFF QoQZ MU","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":60751,"status":"noted","reservation_date":"2020-11-22 12:52:28","uploaded":"2020-11-22 13:01:18","revisionof":"R5-206075","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206608.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206611","title":"Noise impact for FR2 CA test case where MPR applies","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":58651,"status":"noted","reservation_date":"2020-11-22 12:52:31","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205865","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206611.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206612","title":"Discussion on FR2 Demod and CSI MTSU and TT","source":"Qualcomm Austria RFFE GmbH","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":59211,"status":"noted","reservation_date":"2020-11-22 12:52:31","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205921","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206612.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206613","title":"On DFF MU Tables in 38.903","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61541,"status":"noted","reservation_date":"2020-11-22 12:52:31","uploaded":"2020-11-22 13:01:18","revisionof":"R5-206154","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206613.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206614","title":"On the achievable SNR for FR2 demod and perf test cases","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61681,"status":"noted","reservation_date":"2020-11-22 12:52:31","uploaded":"2020-11-22 13:01:18","revisionof":"R5-206168","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206614.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206615","title":"On FR2 Blocker Test with Offset Antenna","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61731,"status":"noted","reservation_date":"2020-11-22 12:52:32","uploaded":"2020-11-22 13:01:18","revisionof":"R5-206173","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206615.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206616","title":"On FR2b Spurious emission MU","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61761,"status":"noted","reservation_date":"2020-11-22 12:52:32","uploaded":"2020-11-22 13:01:18","revisionof":"R5-206176","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206616.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206617","title":"On the MU of FR2 OBW","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61841,"status":"noted","reservation_date":"2020-11-22 12:52:32","uploaded":"2020-11-22 13:01:18","revisionof":"R5-206184","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206617.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206618","title":"PC1 Assumptions for CDF Curve for MOP EIRP Spherical Coverage","source":"Qualcomm Japan LLC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61851,"status":"noted","reservation_date":"2020-11-22 12:52:32","uploaded":"2020-11-22 13:01:18","revisionof":"R5-206185","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206618.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206785","title":"Discussion on FR2 ON-OFF time mask","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":59911,"status":"noted","reservation_date":"2020-11-22 12:58:02","uploaded":"2020-11-22 13:01:23","revisionof":"R5-205991","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206785.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206786","title":"On n259 MU and testability limit","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61741,"status":"noted","reservation_date":"2020-11-22 12:58:02","uploaded":"2020-11-22 13:01:23","revisionof":"R5-206174","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206786.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206787","title":"Discussion on the MU for band n259","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":61921,"status":"noted","reservation_date":"2020-11-22 12:58:02","uploaded":"2020-11-22 13:01:23","revisionof":"R5-206192","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206787.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206789","title":"Discussion paper on specific test frequencies for RRM testing","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":56601,"status":"noted","reservation_date":"2020-11-22 12:58:02","uploaded":"2020-11-22 13:01:23","revisionof":"R5-205660","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206789.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206819","title":"QoQZ and EIRP\/EIS MU results for ETC testing","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":60721,"status":"noted","reservation_date":"2020-11-22 12:58:39","uploaded":"2020-11-22 13:01:23","revisionof":"R5-206072","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206819.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206840","title":"Proposing update to Rel-16 EN-DC PC2 MOP test cases based on TEI-16 maintenance in RAN4","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":58872,"status":"noted","reservation_date":"2020-11-22 12:59:00","uploaded":"2020-11-22 13:01:24","revisionof":"R5-206240","revisedto":"","release":"Rel-16","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"TEI16_Test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206840.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206841","title":"Discussion on test points in Receiver test cases for EN-DC configurations with exception requirements","source":"Ericsson, DISH, Orange","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":59901,"status":"noted","reservation_date":"2020-11-22 12:59:00","uploaded":"2020-11-22 13:01:24","revisionof":"R5-205990","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206841.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206842","title":"Discussion on restructuring of TR 38.905 to better reflect the TS 38.521-x structure.","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":93,"ainumber":"5.3.2.17","ainame":"\tDiscussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":55711,"status":"noted","reservation_date":"2020-11-22 12:59:00","uploaded":"2020-11-22 13:01:24","revisionof":"R5-205571","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206842.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]