[{"name":"R5-201606","title":"MU contributors for RRM FR2 TC 7.7.1.1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"RRM FR2 MU CR implementing R5-201605","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":16060,"status":"revised","reservation_date":"2020-05-05 13:07:34","uploaded":"2020-05-08 07:47:12","revisionof":"","revisedto":"R5-202915","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":117.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201606.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201662","title":"FR1 Test tolerance analysis for interruptions deactivated E-UTRAN SCC","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":16620,"status":"agreed","reservation_date":"2020-05-06 03:38:30","uploaded":"2020-05-09 01:45:27","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":118.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201662.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201663","title":"FR1 Test tolerance analysis for SCell activation","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":16630,"status":"revised","reservation_date":"2020-05-06 03:38:35","uploaded":"2020-05-09 01:45:27","revisionof":"","revisedto":"R5-203094","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":119.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201663.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201664","title":"FR1 Test tolerance analysis for SSB based BFR","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":16640,"status":"withdrawn","reservation_date":"2020-05-06 03:38:36","uploaded":"2020-05-09 01:45:27","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":120.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201664.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201665","title":"FR1 Test tolerance analysis for CSI-RS based BFR","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":16650,"status":"withdrawn","reservation_date":"2020-05-06 03:38:37","uploaded":"2020-05-09 01:45:27","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":121.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201665.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201713","title":"FR2 TT analysis for 38.533 5.7.1.1+7.7.1.1 Intra-freq SS-RSRP","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"discussion","for":"Endorsement","abstract":"\"At RAN5#86-e, R5-200160 was endorsed, providing an initial FR2 TT analysis template for the Intra-freq SS-RSRP Test cases. Some updates are required to improve the efficiency going forward:\n> Band n259 needs to be included, as it has different core requirement values\n> Test cases with UE measurements need uncertainties over both Channel BW and Measurement BW\n> UE usage of Rough beams or Fine beams can be handled with a switch in the analysis.xls\n> Beam peak or Spherical coverage Angle of Arrival can be handled with a switch in the analysis.xls\nUpdated FR2 TT analysis which include the above features are attached in this Tdoc, and we ask for endorsement at RAN5#87-e.","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":17130,"status":"noted","reservation_date":"2020-05-06 08:06:52","uploaded":"2020-05-07 16:54:59","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201713.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201714","title":"FR2 TT analysis for 38.533 5.7.1.2+7.7.1.2 Inter-freq SS-RSRP","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"discussion","for":"Endorsement","abstract":"\"At RAN5#86-e, R5-200161 was endorsed, providing an initial FR2 TT analysis template for the Inter-freq SS-RSRP Test cases. Some updates are required to improve the efficiency going forward:\n> Band n259 needs to be included, as it has different core requirement values\n> Test cases with UE measurements need uncertainties over both Channel BW and Measurement BW\n> UE usage of Rough beams or Fine beams can be handled with a switch in the analysis.xls\n> Beam peak or Spherical coverage Angle of Arrival can be handled with a switch in the analysis.xls\nUpdated FR2 TT analysis which include the above features are attached in this Tdoc, and we ask for endorsement at RAN5#87-e.","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":17140,"status":"noted","reservation_date":"2020-05-06 08:12:34","uploaded":"2020-05-07 16:54:59","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201714.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-201716","title":"Addition of Test Tolerance analysis for FR2 Tx Timing Test cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"Agreement","abstract":"Adds the Test Tolerance analysis for 38.533 Tx Timing Test cases 5.4.1.1 and 7.4.1.1.\nRAN4 Dependency : R4-2006438, R4-2006387and R4-2006389","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":17160,"status":"revised","reservation_date":"2020-05-06 08:25:47","uploaded":"2020-05-07 13:50:06","revisionof":"","revisedto":"R5-202876","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":122.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-201716.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202085","title":"Addition of Quiet Zone size above 30cm to TR 38.903","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"CR","for":"Agreement","abstract":"Associated discussion paper in R5-202082","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":20850,"status":"not pursued","reservation_date":"2020-05-07 17:23:49","uploaded":"2020-05-09 07:16:38","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":123.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202085.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202104","title":"Test tolerance correction for event triggered measurement test cases","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"CR","for":"Agreement","abstract":"TT analysis correction","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":21040,"status":"agreed","reservation_date":"2020-05-07 17:28:50","uploaded":"2020-05-08 14:56:43","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":124.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202104.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202105","title":"Test tolerance correction for CSI-RS-based L1-RSRP measurement test cases","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"CR","for":"Agreement","abstract":"TT analysis correction","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":21050,"status":"agreed","reservation_date":"2020-05-07 17:28:52","uploaded":"2020-05-08 14:56:43","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":125.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202105.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202125","title":"CR to 38.903 to introduce PC1 MU Tables","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"CR","for":"Agreement","abstract":"This contribution adds the framework for PC1 MU tables","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":21250,"status":"revised","reservation_date":"2020-05-08 00:06:27","uploaded":"2020-05-08 23:08:17","revisionof":"","revisedto":"R5-202916","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":126.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202125.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202128","title":"CR to 38.903 to introduce baseline Demod MU tables","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"CR","for":"Agreement","abstract":"This contribution adds the previously agreed consolidated MU Tables for Mode 1 (conditions with external noise) and for Mode 2 (noise free conditions) demodulation test cases","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":21280,"status":"revised","reservation_date":"2020-05-08 00:06:28","uploaded":"2020-05-08 23:08:17","revisionof":"","revisedto":"R5-202769","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":127.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202128.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202279","title":"Update to FR2 Measurement Uncertainties","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":22790,"status":"revised","reservation_date":"2020-05-08 12:41:19","uploaded":"2020-05-08 18:02:10","revisionof":"","revisedto":"R5-202917","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":128.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202279.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202384","title":"Addition of EIRP to Transmit OFF power MU analysis","source":"Samsung R&D Institute UK","contact":"Carolyn Taylor","contact-id":81481,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":23840,"status":"revised","reservation_date":"2020-05-08 16:06:13","uploaded":"2020-05-08 18:19:07","revisionof":"","revisedto":"R5-202938","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":129.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202384.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202391","title":"Test Tolerance analysis TC 4.5.4 and 6.5.4 RRC reconfiguration delay","source":"Samsung R&D Institute UK","contact":"Carolyn Taylor","contact-id":81481,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":23910,"status":"revised","reservation_date":"2020-05-08 16:30:42","uploaded":"2020-05-08 18:19:07","revisionof":"","revisedto":"R5-202702","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":130.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202391.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202702","title":"Test Tolerance analysis TC 4.5.4 and 6.5.4 RRC reconfiguration delay","source":"Samsung R&D Institute UK","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":23911,"status":"agreed","reservation_date":"2020-06-01 16:33:36","uploaded":"2020-06-10 14:56:20","revisionof":"R5-202391","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":130.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202702.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202769","title":"CR to 38.903 to introduce baseline Demod MU tables","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":21281,"status":"agreed","reservation_date":"2020-06-01 16:35:06","uploaded":"2020-06-10 14:56:21","revisionof":"R5-202128","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":127.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202769.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202876","title":"Addition of Test Tolerance analysis for FR2 Tx Timing Test cases","source":"ANRITSU LTD","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":17161,"status":"withdrawn","reservation_date":"2020-06-01 16:58:43","uploaded":"2020-06-12 12:47:55","revisionof":"R5-201716","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":122.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202876.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202915","title":"MU contributors for RRM FR2 TC 7.7.1.1","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":16061,"status":"agreed","reservation_date":"2020-06-01 16:59:39","uploaded":"2020-06-10 14:56:28","revisionof":"R5-201606","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":117.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202915.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202916","title":"CR to 38.903 to introduce PC1 MU Tables","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":21251,"status":"agreed","reservation_date":"2020-06-01 16:59:40","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202125","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":126.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202916.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202917","title":"Update to FR2 Measurement Uncertainties","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":22791,"status":"agreed","reservation_date":"2020-06-01 16:59:41","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202279","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":128.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202917.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-202938","title":"Addition of EIRP to Transmit OFF power MU analysis","source":"Samsung R&D Institute UK","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":23841,"status":"agreed","reservation_date":"2020-06-01 16:59:57","uploaded":"2020-06-10 14:56:28","revisionof":"R5-202384","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":129.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-202938.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203094","title":"FR1 Test tolerance analysis for SCell activation","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":87,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":16631,"status":"agreed","reservation_date":"2020-06-10 08:22:55","uploaded":"2020-06-10 14:56:29","revisionof":"R5-201663","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.3.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":119.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-200576","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_87_Electronic\/Docs\/R5-203094.zip","group":"R5","meeting":"R5-ah-38102","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]