[{"name":"R5-203231","title":"TT analysis for RRM TC 8.5.2.1.1.1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"Corresponding TC TDoc is R5-203234","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":32310,"status":"agreed","reservation_date":"2020-07-23 06:32:22","uploaded":"2020-07-30 14:53:45","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":131.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203231.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203232","title":"TT analysis for RRM TC 8.5.2.2.1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"Corresponding TC TDoc is R5-203235","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":32320,"status":"agreed","reservation_date":"2020-07-23 06:32:26","uploaded":"2020-07-30 14:53:45","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":132.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203232.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203233","title":"TT analysis for RRM TC 8.5.2.3.1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"Corresponding TC TDoc is R5-203236","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":32330,"status":"agreed","reservation_date":"2020-07-23 06:32:28","uploaded":"2020-07-30 14:53:45","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":133.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203233.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203237","title":"TT analysis for RRM TC 4.7.4.1.1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"Corresponding TC TDoc is R5-203241","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":32370,"status":"agreed","reservation_date":"2020-07-23 06:32:32","uploaded":"2020-08-07 10:11:52","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":134.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203237.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203238","title":"TT analysis for RRM TC 4.7.4.1.2","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"Corresponding TC TDoc is R5-203242","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":32380,"status":"agreed","reservation_date":"2020-07-23 06:32:33","uploaded":"2020-08-07 10:11:52","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":135.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203238.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203239","title":"TT analysis for RRM TC 4.7.4.2.1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"Corresponding TC TDoc is R5-203243","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":32390,"status":"withdrawn","reservation_date":"2020-07-23 06:32:34","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":136.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203240","title":"TT analysis for RRM TC 4.7.4.2.2","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"The corresponding TC TDoc is R5-203244","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":32400,"status":"withdrawn","reservation_date":"2020-07-23 06:32:35","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":137.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203305","title":"Correction to the extreme conditions in TT analysis of 4.7.1.2.1","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":33050,"status":"revised","reservation_date":"2020-07-30 14:52:47","uploaded":"2020-07-30 15:06:05","revisionof":"","revisedto":"R5-204788","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":138.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203305.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203313","title":"CR to update the DL AWGN absolute power for RRM test cases","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"CR","for":"Agreement","abstract":"To be provided based on the agreements of the RRM FR2 MU discussion","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":33130,"status":"revised","reservation_date":"2020-07-30 14:52:52","uploaded":"2020-08-06 11:25:31","revisionof":"","revisedto":"R5-204887","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":139.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203313.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203323","title":"Add Draft Test Tolerance analysis for FR2 Tx Timing Test cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":33230,"status":"agreed","reservation_date":"2020-07-31 14:54:14","uploaded":"2020-08-07 16:09:08","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":140.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203323.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203324","title":"Add Draft Test Tolerance analysis for FR2 Inter-freq Event-trig Test cases","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":33240,"status":"agreed","reservation_date":"2020-07-31 15:05:47","uploaded":"2020-08-07 10:14:16","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":141.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203324.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203325","title":"Add Draft Test Tolerance analysis for FR2 Intra-freq SS-RSRP Test case","source":"ANRITSU LTD","contact":"Ian Rose","contact-id":9381,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":33250,"status":"agreed","reservation_date":"2020-07-31 15:13:09","uploaded":"2020-08-07 10:14:16","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":142.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203325.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203486","title":"Adjacent Channel Selectivity FR2 MU definition in 38.903","source":"Keysight Technologies UK Ltd","contact":"Adan Toril","contact-id":62705,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":34860,"status":"revised","reservation_date":"2020-08-04 11:03:29","uploaded":"2020-08-07 14:11:02","revisionof":"","revisedto":"R5-204888","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":143.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203486.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203490","title":"In-band Blocking FR2 MU definition in 38.903","source":"Keysight Technologies UK Ltd","contact":"Adan Toril","contact-id":62705,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":34900,"status":"revised","reservation_date":"2020-08-04 11:03:32","uploaded":"2020-08-07 14:11:02","revisionof":"","revisedto":"R5-204889","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":144.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203490.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203821","title":"Addition of FR1 Test tolerance analysis for DCI based BWP switch","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 dependent, corresponding TCs TDoc: R5-203833\/3834\/3848\/3849","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38210,"status":"revised","reservation_date":"2020-08-07 02:18:20","uploaded":"2020-08-07 11:15:51","revisionof":"","revisedto":"R5-205001","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":145.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203821.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203822","title":"Addition of FR1 Test tolerance analysis for RRC based BWP switch","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 dependent, corresponding TCs TDoc: R5-203836\/3851","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38220,"status":"revised","reservation_date":"2020-08-07 02:18:21","uploaded":"2020-08-07 11:15:51","revisionof":"","revisedto":"R5-205002","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":146.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203822.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203823","title":"Addition of FR1 Test tolerance analysis for SSB based BFR","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 dependent, corresponding TCs TDoc :R5-203828\/3829\/3843\/3844","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38230,"status":"revised","reservation_date":"2020-08-07 02:18:22","uploaded":"2020-08-07 11:15:51","revisionof":"","revisedto":"R5-205003","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":147.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203823.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203824","title":"Addition of FR1 Test tolerance analysis for CSI-RS based BFR","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 dependent, corresponding TCs TDoc :R5-203830\/3831\/3845\/3846","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38240,"status":"revised","reservation_date":"2020-08-07 02:18:23","uploaded":"2020-08-07 11:15:51","revisionof":"","revisedto":"R5-205004","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":148.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203824.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203825","title":"Addition of FR1 Test tolerance analysis for 6.3.2.1.3 RRC Re-establishment","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"Corresponding TC TDoc:R5-203837","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38250,"status":"agreed","reservation_date":"2020-08-07 02:18:24","uploaded":"2020-08-07 11:15:51","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":149.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203825.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-203826","title":"Update of grouping of test cases in clause 8","source":"Huawei, HiSilicon","contact":"Zhaorui Ma","contact-id":79398,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38260,"status":"agreed","reservation_date":"2020-08-07 02:18:26","uploaded":"2020-08-07 11:15:13","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":150.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-203826.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204028","title":"CR to 38.903 on some of the Transmit OFF power MU parameters","source":"Samsung R&D Institute UK","contact":"Carolyn Taylor","contact-id":81481,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":40280,"status":"revised","reservation_date":"2020-08-07 08:50:45","uploaded":"2020-08-07 23:37:09","revisionof":"","revisedto":"R5-204945","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":152.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204028.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204080","title":"CR to update MU in 38.903","source":"Anritsu, Keysight Technologies","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":40800,"status":"revised","reservation_date":"2020-08-07 09:38:57","uploaded":"2020-08-07 19:04:48","revisionof":"","revisedto":"R5-204890","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":153.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204080.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204190","title":"On Standard Deviation Definition in 38.903","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"CR","for":"Agreement","abstract":"Introduce the definition of the standard deviation that is commonly used for OTA measurements.","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":41900,"status":"agreed","reservation_date":"2020-08-07 15:11:44","uploaded":"2020-08-07 22:57:24","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":154.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204190.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204257","title":"FR2 Minimum output power measurement uncertainty","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":42570,"status":"revised","reservation_date":"2020-08-07 19:11:33","uploaded":"2020-08-07 19:57:02","revisionof":"","revisedto":"R5-204891","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":155.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204257.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204272","title":"Update of AWGN flatness in TR 38.903","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"CR","for":"Agreement","abstract":"Associated discussion paper in R5-204271","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":42720,"status":"revised","reservation_date":"2020-08-07 19:15:49","uploaded":"2020-08-07 23:48:33","revisionof":"","revisedto":"R5-204946","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":156.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204272.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204281","title":"FR2 EIRP OFF power measurement uncertainty","source":"Keysight Technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":42810,"status":"revised","reservation_date":"2020-08-07 19:23:16","uploaded":"2020-09-01 13:51:13","revisionof":"","revisedto":"R5-204947","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":157.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204281.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204788","title":"Correction to the extreme conditions in TT analysis of 4.7.1.2.1","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":33051,"status":"agreed","reservation_date":"2020-09-02 09:22:33","uploaded":"2020-09-02 09:31:13","revisionof":"R5-203305","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":138.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204788.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204887","title":"CR to update the DL AWGN absolute power for RRM test cases","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":33131,"status":"agreed","reservation_date":"2020-09-02 09:24:55","uploaded":"2020-09-02 09:31:15","revisionof":"R5-203313","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":139.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204887.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204888","title":"Adjacent Channel Selectivity FR2 MU definition in 38.903","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":34861,"status":"agreed","reservation_date":"2020-09-02 09:24:57","uploaded":"2020-09-02 09:31:15","revisionof":"R5-203486","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":143.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204888.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204889","title":"In-band Blocking FR2 MU definition in 38.903","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":34901,"status":"agreed","reservation_date":"2020-09-02 09:24:58","uploaded":"2020-09-02 09:31:15","revisionof":"R5-203490","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":144.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204889.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204890","title":"CR to update MU in 38.903","source":"Anritsu, Keysight Technologies","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":40801,"status":"agreed","reservation_date":"2020-09-02 09:24:59","uploaded":"2020-09-02 09:31:15","revisionof":"R5-204080","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":153.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204890.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204891","title":"FR2 Minimum output power measurement uncertainty","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":42571,"status":"agreed","reservation_date":"2020-09-02 09:25:01","uploaded":"2020-09-02 09:31:15","revisionof":"R5-204257","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":155.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204891.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204945","title":"CR to 38.903 on some of the Transmit OFF power MU parameters","source":"Samsung R&D Institute UK","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":40281,"status":"agreed","reservation_date":"2020-09-02 09:26:13","uploaded":"2020-09-02 09:31:17","revisionof":"R5-204028","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":152.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204945.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204946","title":"Update of AWGN flatness in TR 38.903","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":42721,"status":"agreed","reservation_date":"2020-09-02 09:26:14","uploaded":"2020-09-02 09:31:17","revisionof":"R5-204272","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":156.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204946.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-204947","title":"FR2 EIRP OFF power measurement uncertainty","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":42811,"status":"agreed","reservation_date":"2020-09-02 09:26:15","uploaded":"2020-09-02 09:31:17","revisionof":"R5-204281","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":157.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-204947.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205001","title":"Addition of FR1 Test tolerance analysis for DCI based BWP switch","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38211,"status":"agreed","reservation_date":"2020-09-02 09:27:08","uploaded":"2020-09-02 09:31:18","revisionof":"R5-203821","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":145.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-205001.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205002","title":"Addition of FR1 Test tolerance analysis for RRC based BWP switch","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38221,"status":"agreed","reservation_date":"2020-09-02 09:27:09","uploaded":"2020-09-02 09:31:18","revisionof":"R5-203822","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":146.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-205002.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205003","title":"Addition of FR1 Test tolerance analysis for SSB based BFR","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38231,"status":"agreed","reservation_date":"2020-09-02 09:27:10","uploaded":"2020-09-02 09:31:18","revisionof":"R5-203823","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":147.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-205003.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205004","title":"Addition of FR1 Test tolerance analysis for CSI-RS based BFR","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":86,"ainumber":"5.3.2.15","ainame":"\tTR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":38241,"status":"agreed","reservation_date":"2020-09-02 09:27:11","uploaded":"2020-09-02 09:31:18","revisionof":"R5-203824","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.4.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":148.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-201453","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_88_Electronic\/Docs\/R5-205004.zip","group":"R5","meeting":"R5-88-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]