[{"name":"R5-205662","title":"Introduction of test frequencies for RRM and NR band n257","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":56620,"status":"revised","reservation_date":"2020-10-29 15:13:24","uploaded":"2020-10-30 20:52:00","revisionof":"","revisedto":"R5-206790","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1581.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205662.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205663","title":"Introduction of test frequencies for RRM and NR band n258","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":56630,"status":"revised","reservation_date":"2020-10-29 15:13:25","uploaded":"2020-10-30 20:52:00","revisionof":"","revisedto":"R5-206791","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1582.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205663.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205664","title":"Introduction of test frequencies for RRM and NR band n260","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":56640,"status":"revised","reservation_date":"2020-10-29 15:13:26","uploaded":"2020-10-30 20:52:01","revisionof":"","revisedto":"R5-206792","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1583.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205664.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205665","title":"Introduction of test frequencies for RRM and NR band n261","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":56650,"status":"revised","reservation_date":"2020-10-29 15:13:27","uploaded":"2020-10-30 20:52:01","revisionof":"","revisedto":"R5-206793","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1584.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205665.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205720","title":"Correction to test frequencies for NR band n34","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57200,"status":"revised","reservation_date":"2020-10-30 02:11:16","uploaded":"2020-10-31 07:02:01","revisionof":"","revisedto":"R5-206621","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1589.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205720.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205721","title":"Correction to test frequencies for NR band n38","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57210,"status":"revised","reservation_date":"2020-10-30 02:11:20","uploaded":"2020-10-31 07:02:01","revisionof":"","revisedto":"R5-206622","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1590.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205721.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205722","title":"Correction to test frequencies for NR band n39","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57220,"status":"revised","reservation_date":"2020-10-30 02:11:21","uploaded":"2020-10-31 07:02:01","revisionof":"","revisedto":"R5-206623","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1591.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205722.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205723","title":"Correction to test frequencies for NR band n40","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57230,"status":"revised","reservation_date":"2020-10-30 02:11:22","uploaded":"2020-10-31 07:02:01","revisionof":"","revisedto":"R5-206624","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1592.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205723.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205724","title":"Correction to test frequencies for NR band n50","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57240,"status":"revised","reservation_date":"2020-10-30 02:11:23","uploaded":"2020-10-31 07:02:01","revisionof":"","revisedto":"R5-206625","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1593.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205724.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205725","title":"Correction to test channel bandwidth for NR band n40 and n50","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57250,"status":"agreed","reservation_date":"2020-10-30 02:11:24","uploaded":"2020-10-31 07:02:01","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1594.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205725.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205851","title":"Addition of test channel bandwidth for n30","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":58510,"status":"withdrawn","reservation_date":"2020-10-30 07:37:20","uploaded":"2020-10-30 08:18:15","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1604.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205851.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205873","title":"Correction of test frequency of band n1","source":"Huawei, HiSilicon, Ericsson","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":58730,"status":"withdrawn","reservation_date":"2020-10-30 09:29:30","uploaded":"2020-10-31 01:16:29","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1606.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205873.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205874","title":"Correction of test frequency of CA_n41C","source":"Huawei, HiSilicon, Ericsson","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":58740,"status":"agreed","reservation_date":"2020-10-30 09:29:31","uploaded":"2020-10-31 01:16:29","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1607.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205874.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205875","title":"Correction of test frequency of CA_n66B","source":"Huawei, HiSilicon, Ericsson","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":58750,"status":"agreed","reservation_date":"2020-10-30 09:29:32","uploaded":"2020-10-31 01:16:29","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1608.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205875.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205876","title":"Correction of test frequency of CA_n78C","source":"Huawei, HiSilicon, Ericsson","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":58760,"status":"revised","reservation_date":"2020-10-30 09:29:33","uploaded":"2020-10-31 01:16:29","revisionof":"","revisedto":"R5-206626","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1609.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205876.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-205928","title":"Update test frequencies for n79","source":"CMCC, Huawei","contact":"Dan Song","contact-id":86282,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":59280,"status":"revised","reservation_date":"2020-10-30 10:14:40","uploaded":"2020-10-30 16:37:31","revisionof":"","revisedto":"R5-206627","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1613.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-205928.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206019","title":"Correction of test frequencies for CA_n260 of intra-band non-contiguous A-I","source":"ZTE Corporation","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"CR","for":"Agreement","abstract":"Correction of test frequencies for CA_n260 of intra-band non-contiguous A-I","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":60190,"status":"agreed","reservation_date":"2020-10-30 13:23:31","uploaded":"2020-10-30 15:38:00","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1637.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206019.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206135","title":"Adding 30 kHz SSB SCS for n38","source":"QUALCOMM Europe Inc. - Spain","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":61350,"status":"withdrawn","reservation_date":"2020-10-30 17:40:49","uploaded":"2020-10-31 06:18:23","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1662.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206135.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206621","title":"Correction to test frequencies for NR band n34","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57201,"status":"agreed","reservation_date":"2020-11-22 12:52:34","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205720","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1589.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206621.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206622","title":"Correction to test frequencies for NR band n38","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57211,"status":"agreed","reservation_date":"2020-11-22 12:52:35","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205721","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1590.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206622.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206623","title":"Correction to test frequencies for NR band n39","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57221,"status":"agreed","reservation_date":"2020-11-22 12:52:36","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205722","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1591.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206623.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206624","title":"Correction to test frequencies for NR band n40","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57231,"status":"agreed","reservation_date":"2020-11-22 12:52:37","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205723","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1592.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206624.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206625","title":"Correction to test frequencies for NR band n50","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":57241,"status":"agreed","reservation_date":"2020-11-22 12:52:38","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205724","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1593.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206625.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206626","title":"Correction of test frequency of CA_n78C","source":"Huawei, HiSilicon, Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":58761,"status":"agreed","reservation_date":"2020-11-22 12:52:39","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205876","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1609.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206626.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206627","title":"Update test frequencies for n79","source":"CMCC, Huawei","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":59281,"status":"withdrawn","reservation_date":"2020-11-22 12:52:40","uploaded":"2020-11-22 13:01:18","revisionof":"R5-205928","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1613.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206627.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206790","title":"Introduction of test frequencies for RRM and NR band n257","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":56621,"status":"agreed","reservation_date":"2020-11-22 12:58:02","uploaded":"2020-11-22 13:01:23","revisionof":"R5-205662","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1581.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206790.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206791","title":"Introduction of test frequencies for RRM and NR band n258","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":56631,"status":"agreed","reservation_date":"2020-11-22 12:58:03","uploaded":"2020-11-22 13:01:23","revisionof":"R5-205663","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1582.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206791.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206792","title":"Introduction of test frequencies for RRM and NR band n260","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":56641,"status":"agreed","reservation_date":"2020-11-22 12:58:05","uploaded":"2020-11-22 13:01:23","revisionof":"R5-205664","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1583.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206792.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-206793","title":"Introduction of test frequencies for RRM and NR band n261","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"5.3.2.1.1","ainame":"\tTest frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":56651,"status":"agreed","reservation_date":"2020-11-22 12:58:06","uploaded":"2020-11-22 13:01:23","revisionof":"R5-205665","revisedto":"","release":"Rel-16","crspec":"38.508-1","crspecversion":"16.5.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":1584.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-202222","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_89_Electronic\/Docs\/R5-206793.zip","group":"R5","meeting":"R5-89-e","year":2020,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]