[{"name":"R5-212939","title":"Adding test applicability for eMIMO demod test cases","source":"Huawei, HiSilicon, Bureau Veritas","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-212933 ~ 2936, PICS in R5-212938","secretary_remarks":"","agenda_item_sort_order":283,"ainumber":"5.3.17.7","ainame":"TS 38.522","tdoc_agenda_sort_order":293900,"status":"agreed","reservation_date":"2021-05-07 07:07:30","uploaded":"2021-05-07 16:06:42","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.522","crspecversion":"17.0.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":76.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-211011","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_91_Electronic\/Docs\/R5-212939.zip","group":"R5","meeting":"R5-91-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]