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{"name":"R5-173038","title":"The UE test loop mode for V2X Communication","source":"LG Electronics, Huawei","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":166,"ainumber":"5.3.15.7","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":23101,"status":"agreed","reservation_date":"2017-06-05 17:31:35","uploaded":"2017-06-05 17:37:56","revisionof":"R5-172310","revisedto":"","release":"Rel-14","crspec":"36.509","crspecversion":"13.3.0","workitem":[{"winame":"LTE_V2X-Perf"}],"crnumber":"0168","crrevision":1.0,"crcategory":"F","tsg_crp":"RP-171510","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_75_Hangzhou\/Docs\/R5-173038.zip","group":"R5","meeting":"R5-75","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]