[{"name":"R5-182285","title":"TP for updating test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC","source":"Ericsson","contact":"Petter Karlsson","contact-id":76182,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":22850,"status":"revised","reservation_date":"2018-05-03 14:46:33","uploaded":"2018-05-09 06:39:16","revisionof":"","revisedto":"R5-183707","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182285.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182401","title":"5G_FR1_EN_DC_RF_sensitivity_for_DC","source":"Qualcomm Inc.","contact":"Kevin Wang","contact-id":76069,"tdoctype":"pCR","for":"Approval","abstract":"5G_FR1_EN_DC_RF_sensitivity_for_DC","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":24010,"status":"revised","reservation_date":"2018-05-08 23:13:39","uploaded":"2018-05-11 01:48:08","revisionof":"","revisedto":"R5-183929","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182401.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182770","title":"Updated clause 5.5B Configuration for DC to 38.521-3","source":"Bureau Veritas","contact":"Amy Tao","contact-id":62771,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":27700,"status":"revised","reservation_date":"2018-05-11 08:45:26","uploaded":"2018-05-11 18:51:34","revisionof":"","revisedto":"R5-183708","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182770.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182788","title":"Introduction of TC 6.2B.1.3 for EN-DC","source":"Huawei, Hisilicon","contact":"Yinghong Yang","contact-id":55342,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":27880,"status":"revised","reservation_date":"2018-05-11 09:13:37","uploaded":"2018-05-13 08:19:04","revisionof":"","revisedto":"R5-183930","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.3.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182788.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182795","title":"TP for FR2 spurious test procedure (38.521-3)","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":27950,"status":"withdrawn","reservation_date":"2018-05-11 09:24:13","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182837","title":"Introduction of TC 6.2B.1.3 for EN-DC","source":"Huawei, Hisilicon","contact":"Yinghong Yang","contact-id":55342,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":28370,"status":"withdrawn","reservation_date":"2018-05-11 09:37:52","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.3.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182976","title":"pCR: Update to RMC","source":"Qualcomm Wireless GmbH","contact":"Mayur Vora","contact-id":46658,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":29760,"status":"withdrawn","reservation_date":"2018-05-11 18:41:39","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182978","title":"pCR: Update to reference sensitivity","source":"Qualcomm Wireless GmbH","contact":"Mayur Vora","contact-id":46658,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":29780,"status":"withdrawn","reservation_date":"2018-05-11 18:44:30","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182995","title":"Corrections annex for EIRP and TRP metric definition in TS 38.521-3","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":29950,"status":"approved","reservation_date":"2018-05-11 19:57:19","uploaded":"2018-05-11 19:59:33","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182995.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183022","title":"TP to add Occupied BW EN-DC test case","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":30220,"status":"revised","reservation_date":"2018-05-11 21:42:26","uploaded":"2018-05-20 10:55:27","revisionof":"","revisedto":"R5-183709","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183022.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183023","title":"TP to add SEM EN-DC test case","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":30230,"status":"revised","reservation_date":"2018-05-11 21:45:54","uploaded":"2018-05-20 10:55:43","revisionof":"","revisedto":"R5-183710","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183023.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183024","title":"TP to add ACLR EN-DC test case","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":30240,"status":"revised","reservation_date":"2018-05-11 21:46:52","uploaded":"2018-05-20 10:55:56","revisionof":"","revisedto":"R5-183711","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183024.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183707","title":"TP for updating test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":22851,"status":"approved","reservation_date":"2018-05-30 08:38:37","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182285","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183707.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183708","title":"Updated clause 5.5B Configuration for DC to 38.521-3","source":"Bureau Veritas","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":27701,"status":"approved","reservation_date":"2018-05-30 08:38:37","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182770","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183708.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183709","title":"TP to add Occupied BW EN-DC test case","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":30221,"status":"approved","reservation_date":"2018-05-30 08:38:37","uploaded":"2018-05-30 16:27:58","revisionof":"R5-183022","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183709.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183710","title":"TP to add SEM EN-DC test case","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":30231,"status":"approved","reservation_date":"2018-05-30 08:38:37","uploaded":"2018-05-30 16:27:58","revisionof":"R5-183023","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183710.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183711","title":"TP to add ACLR EN-DC test case","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":30241,"status":"approved","reservation_date":"2018-05-30 08:38:37","uploaded":"2018-05-30 16:27:58","revisionof":"R5-183024","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183711.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183929","title":"5G_FR1_EN_DC_RF_sensitivity_for_DC","source":"Qualcomm Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":24011,"status":"revised","reservation_date":"2018-05-30 16:32:34","uploaded":"2018-05-31 08:59:25","revisionof":"R5-182401","revisedto":"R5-183961","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183929.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183930","title":"Introduction of TC 6.2B.1.3 for EN-DC","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":27881,"status":"revised","reservation_date":"2018-05-30 16:32:34","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182788","revisedto":"R5-183962","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.3.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183930.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183938","title":"Statistical Testing Annex for 38.521-3","source":"Qualcomm Inc","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":325700,"status":"revised","reservation_date":"2018-05-30 16:32:39","uploaded":"2018-05-30 16:37:55","revisionof":"","revisedto":"R5-183949","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183938.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183949","title":"Statistical Testing Annex for 38.521-3","source":"Qualcomm Inc","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":325701,"status":"approved","reservation_date":"2018-06-21 09:59:26","uploaded":"2018-07-10 10:29:01","revisionof":"R5-183938","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183949.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183961","title":"5G_FR1_EN_DC_RF_sensitivity_for_DC","source":"Qualcomm Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":24012,"status":"approved","reservation_date":"2018-07-09 10:53:20","uploaded":"2018-07-10 12:24:41","revisionof":"R5-183929","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.4.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183961.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183962","title":"Introduction of TC 6.2B.1.3 for EN-DC","source":"Huawei, Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":142,"ainumber":"5.3.14.6","ainame":"TS 38.521-3","tdoc_agenda_sort_order":27882,"status":"approved","reservation_date":"2018-07-09 10:53:20","uploaded":"2018-07-10 12:24:41","revisionof":"R5-183930","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"0.3.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183962.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]