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{"name":"R5-211913","title":"Adding test applicability for switching test case","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":226,"ainumber":"5.3.14.5","ainame":"\tTS 38.522","tdoc_agenda_sort_order":7451,"status":"agreed","reservation_date":"2021-03-08 12:33:43","uploaded":"2021-03-08 12:41:21","revisionof":"R5-210745","revisedto":"","release":"Rel-16","crspec":"38.522","crspecversion":"16.6.0","workitem":[{"winame":"NR_RF_FR1-UEConTest"}],"crnumber":57.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-210146","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211913.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]