[{"name":"R5-168135","title":"Addition of applicability for new RRM test case for CAT-M1 UE 7.3.56, 7.3.57, 7.3.58 and 7.3.59","source":"East China Institute of Tel.","contact":"Jibin Zhang","contact-id":65859,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":135,"ainumber":"5.3.14.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":81350,"status":"withdrawn","reservation_date":"2016-11-01 06:24:54","uploaded":"2016-11-01 06:29:49","revisionof":"","revisedto":"","release":"Rel-13","crspec":"36.521-2","crspecversion":"13.3.0","workitem":[{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":470.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_73_Reno\/Docs\/R5-168135.zip","group":"R5","meeting":"R5-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-168201","title":"Update to the applicability for HD-FDD Cat-M1 UE in CEModeB","source":"LG Electronics","contact":"Changsoo Lee","contact-id":59602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":135,"ainumber":"5.3.14.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":82010,"status":"withdrawn","reservation_date":"2016-11-02 11:26:56","uploaded":"2016-11-04 11:40:10","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.521-2","crspecversion":"14.0.0","workitem":[{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":471.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_73_Reno\/Docs\/R5-168201.zip","group":"R5","meeting":"R5-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-168496","title":"Addition of applicabilities for 3 RRM test cases for Cat-M1 and correcting typos","source":"Korea Testing Laboratory","contact":"Phil Kwak","contact-id":54036,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":135,"ainumber":"5.3.14.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":84960,"status":"withdrawn","reservation_date":"2016-11-04 02:24:59","uploaded":"2016-11-04 11:20:46","revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.521-2","crspecversion":"14.0.0","workitem":[{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":488.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_73_Reno\/Docs\/R5-168496.zip","group":"R5","meeting":"R5-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-168563","title":"Applicability of eMTC RF and RRM test cases","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":135,"ainumber":"5.3.14.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":85630,"status":"postponed","reservation_date":"2016-11-04 08:40:12","uploaded":"2016-11-21 02:27:24","revisionof":"","revisedto":"R5-169733","release":"Rel-14","crspec":"36.521-2","crspecversion":"14.0.0","workitem":[{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":495.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_73_Reno\/Docs\/R5-168563.zip","group":"R5","meeting":"R5-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-168839","title":"Applicability for E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions for Cat-M1 UE in CEModeA TCs","source":"Intel Corporation (UK) Ltd","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"CR","for":"Agreement","abstract":"Resubmission of endorsed draft CR","secretary_remarks":"","agenda_item_sort_order":135,"ainumber":"5.3.14.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":88390,"status":"revised","reservation_date":"2016-11-04 19:59:40","uploaded":"2016-11-05 05:28:32","revisionof":"","revisedto":"R5-169589","release":"Rel-14","crspec":"36.521-2","crspecversion":"14.0.0","workitem":[{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":508.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_73_Reno\/Docs\/R5-168839.zip","group":"R5","meeting":"R5-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-168972","title":"Addition of applicability for new RRM test case for CAT-M1 UE 7.3.56, 7.3.57, 7.3.58 and 7.3.59","source":"East China Institute of Tel.","contact":"Mathieu Mangion","contact-id":27904,"tdoctype":"CR","for":"Agreement","abstract":"reissued because of wrong spec and Rel.","secretary_remarks":"","agenda_item_sort_order":135,"ainumber":"5.3.14.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":897200,"status":"withdrawn","reservation_date":"2016-11-22 09:15:34","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-14","crspec":"36.521-2","crspecversion":"14.0.0","workitem":[{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":514.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-169589","title":"Applicability for E-UTRAN HD-FDD intra-frequency event triggered reporting under fading propagation conditions for Cat-M1 UE in CEModeA TCs","source":"Intel Corporation (UK) Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":135,"ainumber":"5.3.14.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":88391,"status":"agreed","reservation_date":"2016-11-22 09:16:46","uploaded":"2016-11-22 09:17:26","revisionof":"R5-168839","revisedto":"","release":"Rel-14","crspec":"36.521-2","crspecversion":"14.0.0","workitem":[{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":508.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-162087","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_73_Reno\/Docs\/R5-169589.zip","group":"R5","meeting":"R5-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-169733","title":"Applicability of eMTC RF and RRM test cases","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":135,"ainumber":"5.3.14.4","ainame":"\tTS 36.521-2","tdoc_agenda_sort_order":85631,"status":"agreed","reservation_date":"2016-11-29 15:19:02","uploaded":"2016-11-29 15:27:24","revisionof":"R5-168563","revisedto":"","release":"Rel-14","crspec":"36.521-2","crspecversion":"14.0.0","workitem":[{"winame":"LTE_MTCe2_L1-UEConTest"}],"crnumber":495.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-162087","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_73_Reno\/Docs\/R5-169733.zip","group":"R5","meeting":"R5-73","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]