[{"name":"R5-182274","title":"Discussion on quiet zone for NR RRM with 2 TRxP","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":22740,"status":"withdrawn","reservation_date":"2018-05-03 09:53:16","uploaded":null,"revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182465","title":"Impact of Phase variation on UE antenna arrays beam pattern at mmWave","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"discussion","for":"Discussion","abstract":"During 3GPP RAN4 #85, and #86, two contributions [1-2] with simulation results for measurement distance uncertainty were presented. Specifically, a pointing error was observed when testing an UE antenna array offset with respect to the centre of the syste","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":24650,"status":"noted","reservation_date":"2018-05-09 20:47:43","uploaded":"2018-05-11 10:30:20","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182465.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182473","title":"FR2 RefSens Test & Peak Beam Search Polarization","source":"Qualcomm UK Ltd","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":24730,"status":"noted","reservation_date":"2018-05-09 22:04:01","uploaded":"2018-05-11 17:44:00","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182473.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182474","title":"Statistical Testing (new)Annex H for 38.521-1\/2\/3","source":"Qualcomm UK Ltd","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":24740,"status":"revised","reservation_date":"2018-05-09 22:14:33","uploaded":"2018-05-11 17:44:00","revisionof":"","revisedto":"R5-183902","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182474.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182521","title":"Discussion on test point selection for NR PRACH time mask in FR1","source":"KTL","contact":"Phil Kwak","contact-id":54036,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":25210,"status":"revised","reservation_date":"2018-05-10 07:17:38","uploaded":"2018-05-11 10:12:28","revisionof":"","revisedto":"R5-183904","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182521.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182522","title":"Discussion on test point selection for NR Transmit Intermodulation in FR1","source":"KTL","contact":"Phil Kwak","contact-id":54036,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":25220,"status":"revised","reservation_date":"2018-05-10 07:19:46","uploaded":"2018-05-11 10:12:28","revisionof":"","revisedto":"R5-183905","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182522.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182523","title":"Discussion on test point selection for NR PRACH time mask in FR2","source":"KTL","contact":"Phil Kwak","contact-id":54036,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":25230,"status":"revised","reservation_date":"2018-05-10 07:21:54","uploaded":"2018-05-11 10:12:52","revisionof":"","revisedto":"R5-183907","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182523.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182686","title":"Discussion on MIMO OTA performance conformance test","source":"CMCC","contact":"Dan Song","contact-id":75340,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":26860,"status":"revised","reservation_date":"2018-05-11 04:42:34","uploaded":"2018-05-11 16:06:30","revisionof":"","revisedto":"R5-183700","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182686.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182726","title":"Discussion on TT calculation from MU in FR2","source":"KDDI Corporation","contact":"Masashi Fushiki","contact-id":47068,"tdoctype":"other","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":27260,"status":"revised","reservation_date":"2018-05-11 06:51:54","uploaded":"2018-05-11 10:35:11","revisionof":"","revisedto":"R5-183909","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182726.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182789","title":"Proposal for Maximum Test System Uncertainty for NR FR1 TRx tests","source":"Anritsu, ROHDE & SCHWARZ","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":27890,"status":"revised","reservation_date":"2018-05-11 09:15:20","uploaded":"2018-05-11 12:43:21","revisionof":"","revisedto":"R5-183910","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182789.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182790","title":"Discussion on the FR2 spurious emission test procedure (1)","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":27900,"status":"withdrawn","reservation_date":"2018-05-11 09:17:02","uploaded":"2018-05-11 13:29:20","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182790.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182791","title":"Proposal on the coarse grid and offset value for FR2 TRx spurious test","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":27910,"status":"revised","reservation_date":"2018-05-11 09:18:21","uploaded":"2018-05-11 13:32:48","revisionof":"","revisedto":"R5-183913","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182791.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182800","title":"Discussion on common test setup for FR2 TRx MU work","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":28000,"status":"noted","reservation_date":"2018-05-11 09:27:22","uploaded":"2018-05-15 11:26:06","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182800.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182808","title":"Discussion on test frequencies for spurious emissions test in FR2","source":"Rohde & Schwarz","contact":"Niels Petrovic","contact-id":49274,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":28080,"status":"noted","reservation_date":"2018-05-11 09:29:12","uploaded":"2018-05-11 15:29:04","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182808.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182809","title":"Discussion on FR1 MU","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":28090,"status":"withdrawn","reservation_date":"2018-05-11 09:29:29","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182925","title":"FR2 MU and TT defining approach about test setup","source":"NTT DOCOMO, INC.","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29250,"status":"revised","reservation_date":"2018-05-11 16:12:40","uploaded":"2018-05-11 17:13:40","revisionof":"","revisedto":"R5-183912","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182925.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182960","title":"Updates of 5G time plan about FR2 MU and TT","source":"NTT DOCOMO, INC., Anritsu, Dish Network, Ericsson, KDDI Corporation, KT Corp., KTL, LG Electronics, Samsung, SGS Wireless, Sharp, SoftBank Corp., Sony, Verizon","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29600,"status":"revised","reservation_date":"2018-05-11 17:23:41","uploaded":"2018-05-11 17:27:20","revisionof":"","revisedto":"R5-183933","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182960.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182987","title":"FR2 MU factors for conducted part","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29870,"status":"noted","reservation_date":"2018-05-11 19:29:32","uploaded":"2018-05-20 10:55:08","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182987.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182994","title":"Discussion on EN-DC test cases definition in TS 38.521-3","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29940,"status":"noted","reservation_date":"2018-05-11 19:53:44","uploaded":"2018-05-11 20:50:17","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182994.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182997","title":"Discussion on connection diagram structure in TS 38.508-1 Annex A","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29970,"status":"revised","reservation_date":"2018-05-11 20:04:06","uploaded":"2018-05-11 20:13:34","revisionof":"","revisedto":"R5-183915","release":"Rel-15","crspec":"38.508-1","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182997.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183000","title":"Discussion on test point selection for transmit modulation quality test cases in FR1","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":30000,"status":"revised","reservation_date":"2018-05-11 20:40:05","uploaded":"2018-05-31 08:56:06","revisionof":"","revisedto":"R5-183964","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183000.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183007","title":"DFF and IFF test system assumptions for assessing the FR2 measurement uncertainty","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":30070,"status":"noted","reservation_date":"2018-05-11 20:40:11","uploaded":"2018-05-12 06:54:33","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183007.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183008","title":"On Beam Peak Search Measurement Grids for mm-wave","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":30080,"status":"noted","reservation_date":"2018-05-11 20:40:11","uploaded":"2018-05-12 06:16:09","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183008.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183009","title":"On TRP Measurement Grids for mm-wave","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":30090,"status":"noted","reservation_date":"2018-05-11 20:40:11","uploaded":"2018-05-12 06:16:09","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183009.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183012","title":"Discussion on test frequencies for SEM in FR2","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":30120,"status":"noted","reservation_date":"2018-05-11 20:40:11","uploaded":"2018-05-12 06:16:09","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183012.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183039","title":"Analysis of Measurement Uncertainty Terms between methods in TR 38.903","source":"MVG","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution is looking at the measurement uncertainty terms listed for DFF and IFF1 and identifying the differences.","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":303900,"status":"noted","reservation_date":"2018-05-30 08:35:19","uploaded":"2018-05-30 16:27:56","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183039.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183257","title":"Updates of 5G time plan about FR2 MU and TT","source":"NTT DOCOMO, INC., Anritsu, AT&T, Dish Network, Ericsson, KDDI Corporation, KT Corp., KTL, LG Electronics, Samsung, SGS Wireless, Sharp, SoftBank Corp., Sony, T-Mobile US, Verizon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29602,"status":"noted","reservation_date":"2018-05-30 08:37:52","uploaded":"2018-05-30 16:27:58","revisionof":"R5-183933","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183257.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183700","title":"Discussion on MIMO OTA performance conformance test","source":"CMCC","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":26861,"status":"noted","reservation_date":"2018-05-30 08:38:35","uploaded":"2018-07-10 12:50:09","revisionof":"R5-182686","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183700.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183701","title":"Discussion paper on UBF Message Contents and Procedure","source":"Qualcomm CDMA Technologies","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":307500,"status":"noted","reservation_date":"2018-05-30 08:38:35","uploaded":"2018-05-30 16:27:58","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183701.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183902","title":"Statistical Testing (new)Annex H for 38.521-1\/2\/3","source":"Qualcomm UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":24741,"status":"noted","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182474","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183902.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183904","title":"Discussion on test point selection for NR PRACH time mask in FR1","source":"KTL","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":25211,"status":"noted","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182521","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183904.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183905","title":"Discussion on test point selection for NR Transmit Intermodulation in FR1","source":"KTL","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":25221,"status":"noted","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182522","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183905.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183907","title":"Discussion on test point selection for NR PRACH time mask in FR2","source":"KTL","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":25231,"status":"noted","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182523","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183907.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183909","title":"Discussion on TT calculation from MU in FR2","source":"KDDI Corporation","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"other","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":27261,"status":"noted","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182726","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183909.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183910","title":"Proposal for Maximum Test System Uncertainty for NR FR1 TRx tests","source":"Anritsu, ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":27891,"status":"revised","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182789","revisedto":"R5-183951","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183910.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183911","title":"Way Forward on MU&TT","source":"ORANGE, Telecom Italia, Vodafone, CMCC, China Unicom, China Telecom, AT&T, Dish","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":325200,"status":"revised","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"","revisedto":"R5-183952","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183911.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183912","title":"FR2 MU and TT defining approach about test setup","source":"NTT DOCOMO, INC.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29251,"status":"noted","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182925","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183912.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183913","title":"Proposal on the coarse grid and offset value for FR2 TRx spurious test","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":27911,"status":"noted","reservation_date":"2018-05-30 16:32:32","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182791","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183913.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183915","title":"Discussion on connection diagram structure in TS 38.508-1 Annex A","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29971,"status":"noted","reservation_date":"2018-05-30 16:32:33","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182997","revisedto":"","release":"Rel-15","crspec":"38.508-1","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183915.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183932","title":"Required RMCs and parameters for few selected NR RF test cases","source":"Ericsson, Huawei, Rohde&Schwarz, Qualcomm","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"In order to complete an RAN5 RF test case, the UL and DL RMC are required. In NR the possible parameter combinations are large, and therefore it is beneficial to indicate exactly the required RMC for the test to form a minimum set of RMCs that is needed f","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":325200,"status":"revised","reservation_date":"2018-05-30 16:32:34","uploaded":"2018-05-30 16:37:55","revisionof":"","revisedto":"R5-183950","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183932.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183933","title":"Updates of 5G time plan about FR2 MU and TT","source":"NTT DOCOMO, INC., Anritsu, Dish Network, Ericsson, KDDI Corporation, KT Corp., KTL, LG Electronics, Samsung, SGS Wireless, Sharp, SoftBank Corp., Sony, Verizon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":29601,"status":"revised","reservation_date":"2018-05-30 16:32:34","uploaded":"2018-05-30 16:37:55","revisionof":"R5-182960","revisedto":"R5-183257","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183933.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183950","title":"Required RMCs and parameters for few selected NR RF test cases","source":"Ericsson, Huawei, Rohde&Schwarz, Qualcomm","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":325201,"status":"noted","reservation_date":"2018-06-21 09:59:27","uploaded":"2018-06-21 10:07:54","revisionof":"R5-183932","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183950.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183951","title":"Proposal for Maximum Test System Uncertainty for NR FR1 TRx tests","source":"Anritsu, ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":27892,"status":"noted","reservation_date":"2018-07-17 10:41:44","uploaded":"2018-07-17 10:48:02","revisionof":"R5-183910","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183951.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183952","title":"Way Forward on MU&TT","source":"ORANGE, Telecom Italia, Vodafone, CMCC, China Unicom, China Telecom, AT&T, Dish","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"other","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":325201,"status":"noted","reservation_date":"2018-07-17 10:41:44","uploaded":"2018-07-17 10:48:02","revisionof":"R5-183911","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183952.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183964","title":"Discussion on test point selection for transmit modulation quality test cases in FR1","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":152,"ainumber":"5.3.14.16","ainame":"General Papers, Work Plan, TC lists","tdoc_agenda_sort_order":30001,"status":"noted","reservation_date":"2018-07-17 14:15:42","uploaded":null,"revisionof":"R5-183000","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]