[{"name":"R5-182463","title":"MU budget for EIRP\/TRP measurements with Near Field test range at mmWave","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"pCR","for":"Approval","abstract":"During 3GPPRAN4#86-Bis, R4-1805894, the TP to TR 38.810 \u2013 Full package for Near Field Test Range (NFTF), was approved and will be included in TR 38.810 v 2.1.0.  This contribution presents the measurement uncertainty terms and their descriptors with the p","secretary_remarks":"","agenda_item_sort_order":150,"ainumber":"5.3.14.14","ainame":"TR 38.903 (Derivation of test tolerances and measurement uncertainty for User Equipment (UE) conformance tests)","tdoc_agenda_sort_order":24630,"status":"withdrawn","reservation_date":"2018-05-09 20:42:37","uploaded":"2018-05-11 10:29:59","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.903","crspecversion":"0.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182463.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182670","title":"Editorial update of TR 38.903.","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":150,"ainumber":"5.3.14.14","ainame":"TR 38.903 (Derivation of test tolerances and measurement uncertainty for User Equipment (UE) conformance tests)","tdoc_agenda_sort_order":26700,"status":"approved","reservation_date":"2018-05-11 03:30:23","uploaded":"2018-05-11 12:54:12","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.903","crspecversion":"0.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182670.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183011","title":"TP on TRP measurement grid uncertainty","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":150,"ainumber":"5.3.14.14","ainame":"TR 38.903 (Derivation of test tolerances and measurement uncertainty for User Equipment (UE) conformance tests)","tdoc_agenda_sort_order":30110,"status":"withdrawn","reservation_date":"2018-05-11 20:40:11","uploaded":"2018-05-12 06:54:33","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.903","crspecversion":"0.1.0","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183011.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]