[{"name":"R5-184068","title":"FR1 TT Way Forward update","source":"Telecom Italia S.p.A.","contact":"Massimiliano Ubicini","contact-id":30837,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":40680,"status":"revised","reservation_date":"2018-08-01 09:34:12","uploaded":"2018-08-09 12:33:43","revisionof":"","revisedto":"R5-185564","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184068.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184124","title":"Discussion on the way to write Clause 7.4 Maximum Input Level and Clause 7.5 Adjacent Channel Selectivity in TS 38.521-3","source":"CMCC, HUAWEI","contact":"Dan Song","contact-id":75340,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":41240,"status":"revised","reservation_date":"2018-08-04 07:56:12","uploaded":"2018-08-09 15:47:37","revisionof":"","revisedto":"R5-185328","release":"Rel-15","crspec":"38.521-3","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184124.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184133","title":"Discussion on RRM 5G progress","source":"ROHDE & SCHWARZ","contact":"Adrian Cardalda Garcia","contact-id":66591,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":41330,"status":"noted","reservation_date":"2018-08-06 11:33:20","uploaded":"2018-08-24 12:27:54","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184133.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184295","title":"Discussion on test frequency definition in FR1","source":"Huawei,HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":42950,"status":"noted","reservation_date":"2018-08-08 03:46:48","uploaded":"2018-08-08 07:41:58","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184295.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184361","title":"Discussion_38.521-3_ApplicabilityRules","source":"Qualcomm Europe Inc. (Spain)","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":43610,"status":"revised","reservation_date":"2018-08-08 21:36:18","uploaded":"2018-08-08 22:23:38","revisionof":"","revisedto":"R5-185558","release":"Rel-15","crspec":"38.521-3","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184361.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184364","title":"Discussion_FR2_EVM_UBF_usage","source":"Qualcomm Europe Inc. (Spain)","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":43640,"status":"noted","reservation_date":"2018-08-08 21:46:20","uploaded":"2018-08-08 22:23:38","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184364.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184365","title":"Discussion_FR2_RefSens_RSRP_vs_EIS","source":"Qualcomm Europe Inc. (Spain)","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":43650,"status":"noted","reservation_date":"2018-08-08 21:49:05","uploaded":"2018-08-08 22:23:38","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184365.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184366","title":"Discussion_FR2_RefSens_TestPointAnalysis","source":"Qualcomm Europe Inc. (Spain)","contact":"Hemish Parikh","contact-id":61982,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":43660,"status":"noted","reservation_date":"2018-08-08 21:51:42","uploaded":"2018-08-08 22:23:38","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184366.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184394","title":"Proposal on Test Tolerance table format in TS 38.521-1 Annex F","source":"NTT DOCOMO, INC.","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"FR1_TT","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":43940,"status":"noted","reservation_date":"2018-08-09 02:14:52","uploaded":"2018-08-09 07:26:27","revisionof":"","revisedto":"","release":"Rel-15","crspec":"38.521-1","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184394.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184397","title":"Proposal on MU and TT table format in TS 38.521-2","source":"NTT DOCOMO, INC.","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"FR2_MU_TT","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":43970,"status":"revised","reservation_date":"2018-08-09 02:18:34","uploaded":"2018-08-09 07:26:27","revisionof":"","revisedto":"R5-185518","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184397.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184400","title":"MU and TT of EN-DC test cases in TS 38.521-3","source":"NTT DOCOMO, INC.","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"IW_MU_TT","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44000,"status":"revised","reservation_date":"2018-08-09 02:21:48","uploaded":"2018-08-09 07:26:27","revisionof":"","revisedto":"R5-185531","release":"Rel-15","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184400.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184407","title":"Discussion on the structure of Clause 7.3A Reference sensitivity for CA in TS 38.521-1","source":"CMCC, Huawei","contact":"Dan Song","contact-id":75340,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44070,"status":"noted","reservation_date":"2018-08-09 03:38:10","uploaded":"2018-08-09 15:47:37","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184407.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184408","title":"Discussion on the structure of Clause 7.7A Spurious response for CA in TS 38.521-1","source":"CMCC, Huawei","contact":"Dan Song","contact-id":75340,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44080,"status":"noted","reservation_date":"2018-08-09 03:42:10","uploaded":"2018-08-09 15:47:37","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184408.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184422","title":"Treatment of power supply cable for FR2 UE tests","source":"Anritsu","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Agreement","abstract":"This contribution raises an issue of a treatment of power supply cable physically attached to a UE.","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44220,"status":"revised","reservation_date":"2018-08-09 05:18:58","uploaded":"2018-08-10 01:16:14","revisionof":"","revisedto":"R5-185525","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184422.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184423","title":"Meeting notes of offline call on FR2 UE common test setup","source":"Anritsu","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"other","for":"Information","abstract":"Meeting notes of offline call on FR2 UE common test setup","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44230,"status":"noted","reservation_date":"2018-08-09 05:18:58","uploaded":"2018-08-10 00:35:10","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184423.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184424","title":"Common test setup for FR2 measurement uncertainty estimation","source":"Anritsu","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Agreement","abstract":"This contribution introduces our views for a further discussion of common test setup in FR2.","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44240,"status":"noted","reservation_date":"2018-08-09 05:18:58","uploaded":"2018-08-10 10:46:00","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184424.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184425","title":"Testability issue of maximum input level and ACS (case 2) in FR2","source":"Anritsu","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Agreement","abstract":"In this contribution, we introduce our latest result of the study and propose a relaxation of the test requirement of maximum input level and ACS (case 2) interferer level in FR2.","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44250,"status":"noted","reservation_date":"2018-08-09 05:18:58","uploaded":"2018-08-10 01:04:32","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184425.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184426","title":"Estimation of measurement uncertainty for FR2 TRx test cases","source":"Anritsu","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution introduces estimation of measurement uncertainty (MU) for FR2 test cases with IFF1 test system.","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44260,"status":"revised","reservation_date":"2018-08-09 05:18:58","uploaded":"2018-08-10 16:20:59","revisionof":"","revisedto":"R5-185335","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184426.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184427","title":"Removing brackets from MU values in FR2","source":"Anritsu","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Agreement","abstract":"This contribution introduce our views on MU values which are still in square brackets yet.","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44270,"status":"revised","reservation_date":"2018-08-09 05:18:58","uploaded":"2018-08-11 07:01:34","revisionof":"","revisedto":"R5-185336","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184427.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184429","title":"Offset in quality of quiet zone evaluation","source":"Anritsu","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Agreement","abstract":"This paper points out a overlooked point of the current quality of quiet zone evaluation method specified in Annex D of TR38.810.","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44290,"status":"revised","reservation_date":"2018-08-09 05:18:58","uploaded":"2018-08-10 00:38:33","revisionof":"","revisedto":"R5-185526","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184429.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184431","title":"Testability issue of low PSD test cases in FR2","source":"Anritsu","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Agreement","abstract":"Proposal of relaxation of Tx RF test requirements in FR2","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44310,"status":"revised","reservation_date":"2018-08-09 05:18:58","uploaded":"2018-08-10 10:48:47","revisionof":"","revisedto":"R5-185527","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184431.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184484","title":"Proposal for remaining Maximum Test System Uncertainty for NR FR1 TRx tests","source":"Anritsu, ROHDE & SCHWARZ","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44840,"status":"noted","reservation_date":"2018-08-09 06:43:10","uploaded":"2018-08-10 00:27:13","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184484.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184485","title":"Test approach of EN-DC Rx tests with multiple LTE\/NR CCs","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44850,"status":"revised","reservation_date":"2018-08-09 06:44:40","uploaded":"2018-08-11 02:24:02","revisionof":"","revisedto":"R5-185529","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184485.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184487","title":"Discussion on FR2 TRx spurious test procedure","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44870,"status":"revised","reservation_date":"2018-08-09 06:49:30","uploaded":"2018-08-11 03:18:12","revisionof":"","revisedto":"R5-185347","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184487.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184488","title":"Discussion on UL RMC for FR2 spurious test","source":"Anritsu","contact":"Hiroyuki Baba","contact-id":65585,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44880,"status":"revised","reservation_date":"2018-08-09 06:50:48","uploaded":"2018-08-11 03:18:12","revisionof":"","revisedto":"R5-185533","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184488.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184489","title":"Discussion on test point selection for NR Out-of-band in FR1","source":"CAICT","contact":"Yongtai Xu","contact-id":78259,"tdoctype":"discussion","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44890,"status":"revised","reservation_date":"2018-08-09 07:11:56","uploaded":"2018-08-09 08:13:06","revisionof":"","revisedto":"R5-185301","release":"Rel-15","crspec":"38.521-1","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184489.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184497","title":"Discussion on Uplink configuration for NR Transmit Intermodulation in FR1","source":"KTL","contact":"Phil Kwak","contact-id":54036,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44970,"status":"revised","reservation_date":"2018-08-09 08:24:34","uploaded":"2018-08-10 06:49:29","revisionof":"","revisedto":"R5-185423","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184497.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184509","title":"Handling on TT defining from MU in FR2","source":"NTT DOCOMO, INC.","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"FR2_MU_TT","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":45090,"status":"noted","reservation_date":"2018-08-09 09:55:53","uploaded":"2018-08-09 10:09:23","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184509.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184741","title":"Discussion on starting point of 200ms in FR1 RF test procedures","source":"Huawei,HiSilicon, Keysight","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":47410,"status":"revised","reservation_date":"2018-08-10 11:46:39","uploaded":"2018-08-10 11:48:31","revisionof":"","revisedto":"R5-185306","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184741.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184752","title":"Discussion on test point selection for NS_35 A-MPR in FR1","source":"Ericsson LM","contact":"Mats Johansson","contact-id":38077,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":47520,"status":"noted","reservation_date":"2018-08-10 11:56:43","uploaded":"2018-08-10 19:40:45","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184752.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184801","title":"Discussion on UE device size for FR2","source":"Rohde & Schwarz","contact":"Niels Petrovic","contact-id":49274,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48010,"status":"noted","reservation_date":"2018-08-10 14:10:31","uploaded":"2018-08-10 15:19:48","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184801.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184802","title":"Discussion on treatment of multi-panel UEs","source":"Rohde & Schwarz","contact":"Niels Petrovic","contact-id":49274,"tdoctype":"discussion","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48020,"status":"noted","reservation_date":"2018-08-10 14:10:31","uploaded":"2018-08-10 15:19:48","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184802.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184803","title":"Discussion on Test Tolerance for FR2","source":"Intel Corporation (UK) Ltd, Apple Inc.","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"discussion","for":"Endorsement","abstract":"Discussion on Test Tolerance for FR2","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48030,"status":"revised","reservation_date":"2018-08-10 14:32:58","uploaded":"2018-08-11 04:15:07","revisionof":"","revisedto":"R5-185534","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184803.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184804","title":"Discussion on TT for Max Output Power TC Requirements for FR2","source":"Intel Corporation (UK) Ltd, Apple Inc.","contact":"Hassan Yaghoobi","contact-id":34546,"tdoctype":"discussion","for":"Endorsement","abstract":"Discussion on TT for Max Output Power TC Requirements for FR2","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48040,"status":"revised","reservation_date":"2018-08-10 14:36:49","uploaded":"2018-08-11 04:15:07","revisionof":"","revisedto":"R5-185566","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184804.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184834","title":"Discussion on the test applicability for the modulation of Pi\/2-BPSK","source":"Huawei, Hisilicon","contact":"Yinghong Yang","contact-id":55342,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48340,"status":"revised","reservation_date":"2018-08-10 15:14:01","uploaded":"2018-08-11 04:11:10","revisionof":"","revisedto":"R5-185308","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184834.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184835","title":"Discussion on test point selection for Configured transmitted power for SUL test case in FR1","source":"Huawei, Hisilicon","contact":"Yinghong Yang","contact-id":55342,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48350,"status":"noted","reservation_date":"2018-08-10 15:14:01","uploaded":"2018-08-11 04:11:10","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184835.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184852","title":"Discussion on OBW, SEM and ACLR for EN-DC interband FR1","source":"Keysight Technologies UK Ltd","contact":"Emilio Ruiz","contact-id":62021,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48520,"status":"revised","reservation_date":"2018-08-10 16:05:13","uploaded":"2018-08-10 16:17:07","revisionof":"","revisedto":"R5-185478","release":"Rel-15","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184852.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184858","title":"Quality of Quiet Zone Results for IFF","source":"Keysight Technologies UK Ltd","contact":"Thorsten Hertel","contact-id":77978,"tdoctype":"other","for":"Approval","abstract":"This contribution is presenting Quality of Quiet Zone measurement results performed in an Indirect Far-Field (IFF) system.","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48580,"status":"revised","reservation_date":"2018-08-10 16:37:32","uploaded":"2018-08-10 23:10:49","revisionof":"","revisedto":"R5-185492","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184858.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-184883","title":"Proposal for 5G NR EVM Test Tolerance","source":"Qualcomm Incorporated","contact":"Kevin Wang","contact-id":76069,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48830,"status":"revised","reservation_date":"2018-08-10 17:44:33","uploaded":"2018-08-11 01:58:51","revisionof":"","revisedto":"R5-185532","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-184883.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-185318","title":"Discussion on test point selection for In-band Emissions test case in FR1","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":49571,"status":"noted","reservation_date":"2018-08-28 13:09:35","uploaded":"2018-08-29 09:17:56","revisionof":"R5-184957","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185318.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-185328","title":"Discussion on the way to write Clause 7.4 Maximum Input Level and Clause 7.5 Adjacent Channel Selectivity in TS 38.521-3","source":"CMCC, HUAWEI","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":41241,"status":"approved","reservation_date":"2018-08-28 13:09:36","uploaded":"2018-08-29 09:17:56","revisionof":"R5-184124","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185328.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-185349","title":"Discussion on test point selection for Frequency Error in FR2","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":49621,"status":"noted","reservation_date":"2018-08-28 13:09:55","uploaded":"2018-08-29 09:17:56","revisionof":"R5-184962","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185349.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-185492","title":"Quality of Quiet Zone Results for IFF","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48581,"status":"noted","reservation_date":"2018-08-28 13:12:06","uploaded":"2018-08-29 09:17:57","revisionof":"R5-184858","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185492.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-185518","title":"Proposal on MU and TT table format in TS 38.521-2","source":"NTT DOCOMO, INC.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":43971,"status":"noted","reservation_date":"2018-08-29 09:35:13","uploaded":"2018-08-29 09:47:57","revisionof":"R5-184397","revisedto":"","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185518.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-185531","title":"MU and TT of EN-DC test cases in TS 38.521-3","source":"NTT DOCOMO, INC.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44001,"status":"noted","reservation_date":"2018-08-29 09:35:18","uploaded":"2018-08-29 09:47:57","revisionof":"R5-184400","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185531.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-185532","title":"Proposal for 5G NR EVM Test Tolerance","source":"Qualcomm Incorporated","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48831,"status":"noted","reservation_date":"2018-08-29 09:35:18","uploaded":"2018-08-29 09:47:57","revisionof":"R5-184883","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185532.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-185533","title":"Discussion on UL RMC for FR2 spurious test","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":44881,"status":"noted","reservation_date":"2018-08-29 09:35:18","uploaded":"2018-08-29 09:47:57","revisionof":"R5-184488","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185533.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-185534","title":"Discussion on Test Tolerance for FR2","source":"Intel Corporation (UK) Ltd, Apple Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48031,"status":"noted","reservation_date":"2018-08-29 09:35:18","uploaded":"2018-08-29 09:47:57","revisionof":"R5-184803","revisedto":"","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185534.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-185558","title":"Discussion_38.521-3_ApplicabilityRules","source":"Qualcomm Europe Inc. (Spain)","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":43611,"status":"noted","reservation_date":"2018-08-29 09:35:42","uploaded":"2018-08-29 09:47:57","revisionof":"R5-184361","revisedto":"","release":"Rel-15","crspec":"38.521-3","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185558.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-185564","title":"FR1 TT Way Forward update","source":"Telecom Italia S.p.A.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":40681,"status":"noted","reservation_date":"2018-08-29 09:35:42","uploaded":"2018-08-29 09:47:57","revisionof":"R5-184068","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185564.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-185566","title":"Discussion on TT for Max Output Power TC Requirements for FR2","source":"Intel Corporation (UK) Ltd, Apple Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"5.3.13.17","ainame":"\tGeneral Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":48041,"status":"noted","reservation_date":"2018-08-29 09:35:42","uploaded":"2018-08-29 09:47:57","revisionof":"R5-184804","revisedto":"","release":"Rel-15","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_80_Gothenburg\/Docs\/R5-185566.zip","group":"R5","meeting":"R5-80","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]