[{"name":"R5-220807","title":"Addition of TT analysis for FR2 BFR test cases","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-220799, R5-220800, R5-220802, R5-220803, R5-220805","secretary_remarks":"","agenda_item_sort_order":239,"ainumber":"5.3.12.9","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":8070,"status":"revised","reservation_date":"2022-02-10 16:59:14","uploaded":"2022-02-11 07:14:28","revisionof":"","revisedto":"R5-221840","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":293.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220807.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220994","title":"Addition of test tolerance analysis for 4.6.7.1 and 6.6.8.1 EN-DC and NR SA CSI-RS based L1-SINR measurement","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-220986, R5-220989","secretary_remarks":"","agenda_item_sort_order":239,"ainumber":"5.3.12.9","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":9940,"status":"agreed","reservation_date":"2022-02-11 08:07:14","uploaded":"2022-02-11 11:59:06","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":295.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220094","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220994.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220995","title":"Addition of test tolerance analysis for 4.6.7.2 EN-DC SSB based L1-SINR measurement","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-220987","secretary_remarks":"","agenda_item_sort_order":239,"ainumber":"5.3.12.9","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":9950,"status":"agreed","reservation_date":"2022-02-11 08:07:15","uploaded":"2022-02-11 11:59:06","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":296.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220094","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220995.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220996","title":"Addition of test tolerance analysis for 4.6.7.3 EN-DC CSI-RS based L1-SINR measurement","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-220988","secretary_remarks":"","agenda_item_sort_order":239,"ainumber":"5.3.12.9","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":9960,"status":"agreed","reservation_date":"2022-02-11 08:07:16","uploaded":"2022-02-11 11:59:06","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":297.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220094","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220996.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220997","title":"Addition of test tolerance analysis for 6.6.8.2 NR SA SSB based L1-SINR measurement","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-220990","secretary_remarks":"","agenda_item_sort_order":239,"ainumber":"5.3.12.9","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":9970,"status":"agreed","reservation_date":"2022-02-11 08:07:17","uploaded":"2022-02-11 11:59:06","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":298.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220094","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220997.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220998","title":"Addition of test tolerance analysis for 6.6.8.3 NR SA CSI-RS based L1-SINR measurement","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-220991","secretary_remarks":"","agenda_item_sort_order":239,"ainumber":"5.3.12.9","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":9980,"status":"agreed","reservation_date":"2022-02-11 08:07:18","uploaded":"2022-02-11 11:59:06","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":299.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220094","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220998.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221840","title":"Addition of TT analysis for FR2 BFR test cases","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":239,"ainumber":"5.3.12.9","ainame":"TR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":8071,"status":"agreed","reservation_date":"2022-03-06 15:09:23","uploaded":"2022-03-08 07:51:12","revisionof":"R5-220807","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":293.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220094","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221840.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]