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{"name":"R5-211802","title":"Addition of applicability for TDD NB-IOT RSTD measurement test cases","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":197,"ainumber":"5.3.12.6","ainame":"\tTS 37.571-3","tdoc_agenda_sort_order":7581,"status":"agreed","reservation_date":"2021-03-08 12:31:24","uploaded":"2021-03-08 12:41:18","revisionof":"R5-210758","revisedto":"","release":"Rel-16","crspec":"37.571-3","crspecversion":"16.6.0","workitem":[{"winame":"NB_IOTenh2-UEConTest"}],"crnumber":133.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-210141","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_90_Electronic\/Docs\/R5-211802.zip","group":"R5","meeting":"R5-90-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]