[{"name":"R5-182387","title":"Addition of new test case for Maximum input level for UE category 1Bis","source":"Qualcomm Inc.","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23870,"status":"revised","reservation_date":"2018-05-08 19:54:13","uploaded":"2018-05-11 01:46:53","revisionof":"","revisedto":"R5-183815","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4170.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182387.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182388","title":"LTE_New test case 7.5EB Adjacent Channel Selectivity (ACS) for UE category 1bis","source":"Qualcomm Inc","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23880,"status":"revised","reservation_date":"2018-05-08 20:14:36","uploaded":"2018-05-11 01:47:33","revisionof":"","revisedto":"R5-183816","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4171.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182388.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182389","title":"LTE_New test case 7.6.1EB In-band blocking for UE category 1bis","source":"Qualcomm Inc","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23890,"status":"revised","reservation_date":"2018-05-08 20:26:39","uploaded":"2018-05-11 01:46:53","revisionof":"","revisedto":"R5-183817","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4172.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182389.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182390","title":"LTE_New test case 7.6.2EB Out-of-band blocking for UE category 1bis","source":"Qualcomm Inc","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23900,"status":"revised","reservation_date":"2018-05-08 20:34:28","uploaded":"2018-05-11 01:46:53","revisionof":"","revisedto":"R5-183818","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4173.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182390.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182391","title":"LTE_New test case 7.6.3EB Narrow band blocking for UE Category 1bis","source":"Qualcomm Inc","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23910,"status":"revised","reservation_date":"2018-05-08 21:26:39","uploaded":"2018-05-11 01:46:53","revisionof":"","revisedto":"R5-183819","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4174.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182391.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182392","title":"LTE_New test case 7.7EB Spurious response for UE category 1bis","source":"Qualcomm Inc.","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"LTE_New test case 7.7EB Spurious response for UE category 1bis","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23920,"status":"revised","reservation_date":"2018-05-08 21:33:48","uploaded":"2018-05-11 01:46:29","revisionof":"","revisedto":"R5-183820","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4175.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182392.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182393","title":"LTE_New test case 7.8.1EB Wide band Intermodulation for UE category 1bis","source":"Qualcomm Inc.","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"LTE_New test case 7.8.1EB Wide band Intermodulation for UE category 1bis","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23930,"status":"revised","reservation_date":"2018-05-08 21:38:17","uploaded":"2018-05-11 01:46:29","revisionof":"","revisedto":"R5-183821","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4176.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182393.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182394","title":"LTE_New test case 7.9EB Spurious emissions for UE category 1bis","source":"Qualcomm Inc.","contact":"Kevin Wang","contact-id":76069,"tdoctype":"CR","for":"Agreement","abstract":"LTE_New test case 7.9EB Spurious emissions for UE category 1bis","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23940,"status":"revised","reservation_date":"2018-05-08 21:43:34","uploaded":"2018-05-11 01:46:29","revisionof":"","revisedto":"R5-183822","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4177.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182394.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182533","title":"Test Tolerance and other details for CAT1-bis TM9 Demod TCs","source":"Qualcomm UK Ltd","contact":"Ashwin Mohan","contact-id":74924,"tdoctype":"CR","for":"Agreement","abstract":"Annex F updates to CAT1bis TM9 Demod tests","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":25330,"status":"revised","reservation_date":"2018-05-10 07:55:33","uploaded":"2018-05-11 23:49:07","revisionof":"","revisedto":"R5-183718","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4188.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182533.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182642","title":"Update of TC 8.9.1.1.2_1 FDD PDSCH Closed Loop Single Layer Spatial Multiplexing for UE category 1bis","source":"CATR, ROHDE & SCHWARZ","contact":"Yongtai Xu","contact-id":63987,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":26420,"status":"revised","reservation_date":"2018-05-11 02:59:22","uploaded":"2018-05-11 07:08:00","revisionof":"","revisedto":"R5-183823","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4229.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182642.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182647","title":"Resubmit the CR of TC 9.7_1.1.2 for UE category 1bis","source":"CATR, ROHDE & SCHWARZ","contact":"Yongtai Xu","contact-id":63987,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":26470,"status":"agreed","reservation_date":"2018-05-11 03:10:07","uploaded":"2018-05-11 07:08:00","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4230.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182647.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182673","title":"Update of TC 8.9.1.2.2_1 TDD PDSCH Closed Loop Single Layer Spatial Multiplexing for UE category 1bis","source":"CATR","contact":"Yongtai Xu","contact-id":63987,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":26730,"status":"revised","reservation_date":"2018-05-11 04:06:14","uploaded":"2018-05-11 07:08:00","revisionof":"","revisedto":"R5-183824","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4238.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182673.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-182962","title":"Addition of new CAT1Bis demod TC 8.9.2.2.1_1","source":"Qualcomm UK Ltd","contact":"Mursalin Habib","contact-id":63873,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":29620,"status":"revised","reservation_date":"2018-05-11 17:39:44","uploaded":"2018-05-11 23:11:32","revisionof":"","revisedto":"R5-183825","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4314.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-182962.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183001","title":"Editorial correction to Cat1bis performance test cases","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":30010,"status":"withdrawn","reservation_date":"2018-05-11 20:40:05","uploaded":"2018-05-12 06:16:09","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4319.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183001.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183013","title":"Addition of UE category 1bis transmit quality test cases","source":"ROHDE & SCHWARZ","contact":"Edwin Menzel","contact-id":65839,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":30130,"status":"revised","reservation_date":"2018-05-11 20:40:11","uploaded":"2018-05-22 09:57:55","revisionof":"","revisedto":"R5-183826","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4326.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183013.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183718","title":"Test Tolerance and other details for CAT1-bis TM9 Demod TCs","source":"Qualcomm UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":25331,"status":"agreed","reservation_date":"2018-05-30 08:38:51","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182533","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4188.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183718.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183815","title":"Addition of new test case for Maximum input level for UE category 1Bis","source":"Qualcomm Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23871,"status":"agreed","reservation_date":"2018-05-30 08:41:13","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182387","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4170.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183815.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183816","title":"LTE_New test case 7.5EB Adjacent Channel Selectivity (ACS) for UE category 1bis","source":"Qualcomm Inc","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23881,"status":"agreed","reservation_date":"2018-05-30 08:41:14","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182388","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4171.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183816.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183817","title":"LTE_New test case 7.6.1EB In-band blocking for UE category 1bis","source":"Qualcomm Inc","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23891,"status":"agreed","reservation_date":"2018-05-30 08:41:15","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182389","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4172.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183817.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183818","title":"LTE_New test case 7.6.2EB Out-of-band blocking for UE category 1bis","source":"Qualcomm Inc","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23901,"status":"agreed","reservation_date":"2018-05-30 08:41:17","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182390","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4173.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183818.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183819","title":"LTE_New test case 7.6.3EB Narrow band blocking for UE Category 1bis","source":"Qualcomm Inc","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23911,"status":"agreed","reservation_date":"2018-05-30 08:41:18","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182391","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4174.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183819.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183820","title":"LTE_New test case 7.7EB Spurious response for UE category 1bis","source":"Qualcomm Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23921,"status":"agreed","reservation_date":"2018-05-30 08:41:19","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182392","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4175.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183820.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183821","title":"LTE_New test case 7.8.1EB Wide band Intermodulation for UE category 1bis","source":"Qualcomm Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23931,"status":"agreed","reservation_date":"2018-05-30 08:41:20","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182393","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4176.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183821.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183822","title":"LTE_New test case 7.9EB Spurious emissions for UE category 1bis","source":"Qualcomm Inc.","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":23941,"status":"agreed","reservation_date":"2018-05-30 08:41:22","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182394","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4177.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183822.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183823","title":"Update of TC 8.9.1.1.2_1 FDD PDSCH Closed Loop Single Layer Spatial Multiplexing for UE category 1bis","source":"CATR, ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":26421,"status":"agreed","reservation_date":"2018-05-30 08:41:30","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182642","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4229.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183823.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183824","title":"Update of TC 8.9.1.2.2_1 TDD PDSCH Closed Loop Single Layer Spatial Multiplexing for UE category 1bis","source":"CATR","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":26731,"status":"agreed","reservation_date":"2018-05-30 08:41:31","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182673","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4238.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183824.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183825","title":"Addition of new CAT1Bis demod TC 8.9.2.2.1_1","source":"Qualcomm UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":29621,"status":"agreed","reservation_date":"2018-05-30 08:41:33","uploaded":"2018-05-30 16:27:58","revisionof":"R5-182962","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4314.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183825.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-183826","title":"Addition of UE category 1bis transmit quality test cases","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":118,"ainumber":"5.3.12.2","ainame":"TS 36.521-1","tdoc_agenda_sort_order":30131,"status":"agreed","reservation_date":"2018-05-30 08:41:34","uploaded":"2018-05-30 16:27:58","revisionof":"R5-183013","revisedto":"","release":"Rel-15","crspec":"36.521-1","crspecversion":"15.1.2","workitem":[{"winame":"LTE_UE_cat_1RX-UEConTest"}],"crnumber":4326.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-180706","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_79_Busan\/Docs\/R5-183826.zip","group":"R5","meeting":"R5-79","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]