[{"name":"R5-254313","title":"Updates on test freq for R18 EN-DC configuration with more than three bands","source":"ZTE Corporation","contact":"Zhifeng Ma","contact-id":61569,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 8\/15\/2025. Original source : ZTE Corporation","agenda_item_sort_order":201,"ainumber":"5.3.12.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":43130,"status":"agreed","reservation_date":"2025-08-14 14:49:09","uploaded":"2025-08-15 14:33:37","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R18-UEConTest"}],"crnumber":3553.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252246","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254313.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.4.1.3","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254479","title":"Addition of test frequency for Rel-18 CA_8A-n77A","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 8\/15\/2025. Original source : Huawei, HiSilicon","agenda_item_sort_order":201,"ainumber":"5.3.12.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":44790,"status":"revised","reservation_date":"2025-08-15 02:13:13","uploaded":"2025-08-15 07:36:39","revisionof":"","revisedto":"R5-255205","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R18-UEConTest"}],"crnumber":3567.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254479.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.1.2.1","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-254531","title":"Addition of test frequencies for Rel18 NR CA configurations","source":"NTT DOCOMO INC.","contact":"Shun Kato","contact-id":100492,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":201,"ainumber":"5.3.12.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":45310,"status":"agreed","reservation_date":"2025-08-15 06:56:04","uploaded":"2025-08-15 10:51:12","revisionof":"","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R18-UEConTest"}],"crnumber":3573.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-252246","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-254531.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R5-255205","title":"Addition of test frequency for Rel-18 CA_8A-n77A","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"Source modified on 04\/09\/2025. Original source : Huawei, HiSilicon","agenda_item_sort_order":201,"ainumber":"5.3.12.1.1","ainame":"Test frequencies (Clause 4.3.1)","tdoc_agenda_sort_order":44791,"status":"agreed","reservation_date":"2025-09-04 11:30:20","uploaded":"2025-09-04 11:31:06","revisionof":"R5-254479","revisedto":"","release":"Rel-19","crspec":"38.508-1","crspecversion":"19.0.0","workitem":[{"winame":"NR_CADC_NR_LTE_DC_R18-UEConTest"}],"crnumber":3567.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-252246","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/WG5_Test_ex-T1\/TSGR5__108_Bangalore\/Docs\/R5-255205.zip","group":"R5","meeting":"R5-108","year":2025,"uicc_affected":false,"me_affected":false,"ran_affected":false,"cn_affected":false,"clauses_affected":"4.3.1.1.2.1","crsinpack":null,"crsinpacknumber":0}]