[{"name":"R5-222718","title":"Addition of test tolerance analysis for 4.7.7.1 and 6.7.9.1 EN-DC FR1 L1-SINR absolute accuracy tests","source":"Sporton","contact":"Ivan Cheng","contact-id":81169,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":27180,"status":"withdrawn","reservation_date":"2022-04-25 03:25:58","uploaded":"2022-04-25 15:28:21","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":310.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222718.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222720","title":"Addition of test tolerance analysis for 4.7.7.2 and 6.7.9.2 FR1 L1-SINR absolute accuracy tests","source":"Sporton","contact":"Ivan Cheng","contact-id":81169,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":27200,"status":"withdrawn","reservation_date":"2022-04-25 03:26:01","uploaded":"2022-04-25 15:28:21","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":311.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222720.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-222722","title":"Addition of test tolerance analysis for 4.7.7.3 and 6.7.9.3 EN-DC FR1 L1-SINR absolute accuracy tests","source":"Sporton","contact":"Ivan Cheng","contact-id":81169,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":27220,"status":"withdrawn","reservation_date":"2022-04-25 03:26:03","uploaded":"2022-04-25 15:28:21","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":312.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-222722.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223008","title":"Addition of test tolerance analysis for 5.6.6.1 and 7.6.6.1","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-223001, R5-223004","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30080,"status":"revised","reservation_date":"2022-04-25 10:01:31","uploaded":"2022-04-25 16:40:29","revisionof":"","revisedto":"R5-223883","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":313.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223008.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223009","title":"Addition of test tolerance analysis for 5.6.6.2","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-223002","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30090,"status":"revised","reservation_date":"2022-04-25 10:01:32","uploaded":"2022-04-25 16:40:29","revisionof":"","revisedto":"R5-223884","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":314.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223009.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223010","title":"Addition of test tolerance analysis for 5.6.6.3","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-223003","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30100,"status":"revised","reservation_date":"2022-04-25 10:01:34","uploaded":"2022-04-25 16:40:29","revisionof":"","revisedto":"R5-223708","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":315.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223010.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223011","title":"Addition of test tolerance analysis for 7.6.6.2","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-223005","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30110,"status":"revised","reservation_date":"2022-04-25 10:01:35","uploaded":"2022-04-25 16:40:29","revisionof":"","revisedto":"R5-223885","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":316.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223011.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223012","title":"Addition of test tolerance analysis for 7.6.6.3","source":"Huawei, HiSilicon","contact":"Yaping Zhang","contact-id":85042,"tdoctype":"CR","for":"Agreement","abstract":"TC in R5-223006","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30120,"status":"revised","reservation_date":"2022-04-25 10:01:36","uploaded":"2022-04-25 16:40:29","revisionof":"","revisedto":"R5-223709","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":317.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223012.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223708","title":"Addition of test tolerance analysis for 5.6.6.3","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30101,"status":"agreed","reservation_date":"2022-05-24 10:06:33","uploaded":"2022-05-24 10:11:08","revisionof":"R5-223010","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":315.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221091","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223708.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223709","title":"Addition of test tolerance analysis for 7.6.6.3","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30121,"status":"agreed","reservation_date":"2022-05-24 10:06:34","uploaded":"2022-05-24 10:11:08","revisionof":"R5-223012","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":317.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221091","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223709.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223883","title":"Addition of test tolerance analysis for 5.6.6.1 and 7.6.6.1","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30081,"status":"agreed","reservation_date":"2022-05-24 10:10:57","uploaded":"2022-05-26 06:21:09","revisionof":"R5-223008","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":313.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221091","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223883.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223884","title":"Addition of test tolerance analysis for 5.6.6.2","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30091,"status":"agreed","reservation_date":"2022-05-24 10:10:58","uploaded":"2022-05-26 06:21:09","revisionof":"R5-223009","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":314.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221091","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223884.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-223885","title":"Addition of test tolerance analysis for 7.6.6.2","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":204,"ainumber":"5.3.10.9","ainame":"\tTR 38.903 (NR MU & TT analyses)","tdoc_agenda_sort_order":30111,"status":"agreed","reservation_date":"2022-05-24 10:10:59","uploaded":"2022-05-26 06:21:09","revisionof":"R5-223011","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.11.0","workitem":[{"winame":"NR_eMIMO-UEConTest"}],"crnumber":316.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-221091","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_95_Electronic\/Docs\/R5-223885.zip","group":"R5","meeting":"R5-95-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]