[{"name":"R5-196398","title":"Addition of Test Tolerance Analysis for 3DL\/3UL TDD CA UE Transmit Timing Accuracy","source":"LG Electronics","contact":"Tae Howan Hong","contact-id":76281,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":49,"ainumber":"5.3.1.8","ainame":"\tTR 36.903 (E-UTRAN RRM TT analyses)","tdoc_agenda_sort_order":63980,"status":"agreed","reservation_date":"2019-08-16 00:49:33","uploaded":"2019-08-16 05:55:53","revisionof":"","revisedto":"","release":"Rel-15","crspec":"36.903","crspecversion":"15.0.0","workitem":[{"winame":"LTE_CA_Rel13-UEConTest"}],"crnumber":429.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-191683","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_84_Ljubljana\/Docs\/R5-196398.zip","group":"R5","meeting":"R5-84","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]