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{"name":"R5-220079","title":"Discussion of adding additional tolerance deltaTIB,c to test requirement of Transmitter power test cases in 38.521-1","source":"CAICT","contact":"Yufeng Zhang","contact-id":86588,"tdoctype":"discussion","for":"Endorsement","abstract":"TDocList update Title to align discussion title. \nAssociated CR R5-220080","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":790,"status":"noted","reservation_date":"2022-01-20 05:56:18","uploaded":"2022-01-30 02:12:39","revisionof":"","revisedto":"","release":"Rel-17","crspec":"38.521-1","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220079.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220353","title":"Discussion on MU and TT proposal for FR2 EVM","source":"Keysight Technologies UK Ltd","contact":"Adan Toril","contact-id":62705,"tdoctype":"discussion","for":"Discussion","abstract":"Associated CRs:  R5-220354, R5-220355, R5-220356.","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":3530,"status":"revised","reservation_date":"2022-02-08 14:51:24","uploaded":"2022-02-11 16:07:25","revisionof":"","revisedto":"R5-221625","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220353.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220780","title":"Discussion on statistical testing","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"discussion","for":"Endorsement","abstract":"CR in R5-220781","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7800,"status":"revised","reservation_date":"2022-02-10 16:58:48","uploaded":"2022-02-11 01:49:11","revisionof":"","revisedto":"R5-221639","release":"Rel-17","crspec":"38.521-1","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220780.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220883","title":"MU and TT proposal for FR2 EVM","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8830,"status":"revised","reservation_date":"2022-02-11 05:17:59","uploaded":"2022-02-11 08:15:38","revisionof":"","revisedto":"R5-221626","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220883.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220884","title":"Discussion on the dynamic range issue for FR2 ON OFF time mask","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8840,"status":"revised","reservation_date":"2022-02-11 05:17:59","uploaded":"2022-02-11 08:15:38","revisionof":"","revisedto":"R5-221610","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220884.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220887","title":"Introduction of DL MU for FR2 absolute power tolerance","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8870,"status":"revised","reservation_date":"2022-02-11 05:18:01","uploaded":"2022-02-11 08:15:38","revisionof":"","revisedto":"R5-221627","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220887.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220889","title":"Discussion on test procedure for SCell drop issue","source":"Anritsu","contact":"Masafumi Setsu","contact-id":89240,"tdoctype":"discussion","for":"Endorsement","abstract":"\"RF AP#90e.23","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8890,"status":"noted","reservation_date":"2022-02-11 05:18:02","uploaded":"2022-02-11 08:15:38","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220889.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221135","title":"Discussion on Additional RF requirements for NS_03U, NS_05U and NS_43U","source":"Huawei, Hisilicon","contact":"Yuxin Hao","contact-id":82979,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11350,"status":"noted","reservation_date":"2022-02-11 10:57:47","uploaded":"2022-02-11 16:23:19","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221135.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221164","title":"Discussion on fading crest factor","source":"Qualcomm CDMA Technologies","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11640,"status":"revised","reservation_date":"2022-02-11 11:31:01","uploaded":"2022-03-08 07:51:15","revisionof":"","revisedto":"R5-221628","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221164.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-221249","title":"Discussion on acceptable clipping and testable SNR for FR2 demod","source":"Ericsson","contact":"Mikael Ziren","contact-id":88614,"tdoctype":"discussion","for":"Endorsement","abstract":"RF AP#89e.23","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12490,"status":"revised","reservation_date":"2022-02-11 15:47:09","uploaded":"2022-02-11 16:15:51","revisionof":"","revisedto":"R5-221614","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221249.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221250","title":"Solutions for preventing SCell drop in RAN5 FR2 UL CA test cases","source":"Ericsson","contact":"Mikael Ziren","contact-id":88614,"tdoctype":"discussion","for":"Endorsement","abstract":"RF AP#90e.23","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12500,"status":"noted","reservation_date":"2022-02-11 15:47:09","uploaded":"2022-02-11 16:15:51","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221250.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221253","title":"Discussion on Beam Peak Search procedure in case of intra-band DL CA","source":"Keysight Technologies UK Ltd","contact":"Adan Toril","contact-id":62705,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12530,"status":"revised","reservation_date":"2022-02-11 15:59:50","uploaded":"2022-02-11 16:07:25","revisionof":"","revisedto":"R5-221643","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221253.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-221275","title":"Beam correspondence Measurement Uncertainties and test tolerances derivation","source":"Keysight technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"discussion","for":"Endorsement","abstract":"Associated CRS in R5-221276 and R5-221277","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12750,"status":"noted","reservation_date":"2022-02-11 17:10:30","uploaded":"2022-02-12 01:30:36","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221275.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221284","title":"FR2 RRM test cases: Known Issue List","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"Document for tracking FR2 RRM known issues","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12840,"status":"noted","reservation_date":"2022-02-11 17:45:06","uploaded":"2022-02-11 19:14:54","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221284.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221285","title":"FR2 RRM test cases: Known Issue List - after RAN5_94e","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"discussion","for":"Information","abstract":"Document for tracking FR2 RRM known issues","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12850,"status":"noted","reservation_date":"2022-02-11 17:45:10","uploaded":"2022-03-08 07:51:15","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221285.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221318","title":"Discussion on handling ETC for FR2 UE RF test scenarios","source":"Apple Hungary Kft.","contact":"Istvan Szini","contact-id":91966,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":13180,"status":"noted","reservation_date":"2022-02-11 18:13:57","uploaded":"2022-02-12 04:18:35","revisionof":"","revisedto":"","release":"Rel-16","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221318.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-221612","title":"On FR2 ON\/OFF Time Mask","source":"ROHDE & SCHWARZ","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12701,"status":"noted","reservation_date":"2022-03-06 15:05:50","uploaded":"2022-03-08 07:51:15","revisionof":"R5-221270","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221612.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-221625","title":"Discussion on MU and TT proposal for FR2 EVM","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":3531,"status":"noted","reservation_date":"2022-03-06 15:05:56","uploaded":"2022-03-08 07:51:15","revisionof":"R5-220353","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221625.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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{"name":"R5-221627","title":"Introduction of DL MU for FR2 absolute power tolerance","source":"Anritsu","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":8871,"status":"noted","reservation_date":"2022-03-06 15:05:56","uploaded":"2022-03-08 07:51:15","revisionof":"R5-220887","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221627.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221628","title":"Discussion on fading crest factor","source":"Qualcomm CDMA Technologies","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":11641,"status":"noted","reservation_date":"2022-03-06 15:05:56","uploaded":"2022-03-08 07:51:15","revisionof":"R5-221164","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221628.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221639","title":"Discussion on statistical testing","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":7801,"status":"noted","reservation_date":"2022-03-06 15:06:06","uploaded":"2022-03-08 07:51:15","revisionof":"R5-220780","revisedto":"","release":"Rel-17","crspec":"38.521-1","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221639.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221643","title":"Discussion on Beam Peak Search procedure in case of intra-band DL CA","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":82,"ainumber":"5.3.1.17","ainame":"Discussion Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":12531,"status":"noted","reservation_date":"2022-03-06 15:06:07","uploaded":"2022-03-08 07:51:15","revisionof":"R5-221253","revisedto":"","release":"Rel-16","crspec":"38.521-2","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221643.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
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