[{"name":"R5-220356","title":"FR2 EVM MU definition in 38.903","source":"Keysight Technologies UK Ltd","contact":"Adan Toril","contact-id":62705,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":3560,"status":"revised","reservation_date":"2022-02-08 14:51:25","uploaded":"2022-02-11 16:07:25","revisionof":"","revisedto":"R5-221743","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":286.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220356.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220716","title":"TT analysis for FR2 SSB based BFD TCs","source":"Huawei,Hisilicon","contact":"Xuesong Wang","contact-id":75459,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 dependency: R4-2204847","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":7160,"status":"revised","reservation_date":"2022-02-10 12:43:10","uploaded":"2022-02-11 11:24:54","revisionof":"","revisedto":"R5-221744","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":287.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220716.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220717","title":"TT analysis for FR2 SSB intra-freq measurement without DRX TCs","source":"Huawei,Hisilicon","contact":"Xuesong Wang","contact-id":75459,"tdoctype":"CR","for":"Agreement","abstract":"RAN4 dependency: R4-2204847","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":7170,"status":"revised","reservation_date":"2022-02-10 12:43:11","uploaded":"2022-02-11 11:24:54","revisionof":"","revisedto":"R5-221745","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":288.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220717.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220718","title":"TT analysis for FR2 SSB intra-freq measurement with DRX TCs","source":"Huawei,Hisilicon","contact":"Xuesong Wang","contact-id":75459,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":7180,"status":"agreed","reservation_date":"2022-02-10 12:43:12","uploaded":"2022-02-11 11:24:54","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":289.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220718.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-220782","title":"Addition of summary table for MU factors","source":"Huawei, HiSilicon","contact":"Chunying Gu","contact-id":65493,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":7820,"status":"revised","reservation_date":"2022-02-10 16:58:50","uploaded":"2022-02-11 11:10:54","revisionof":"","revisedto":"R5-221746","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":292.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-220782.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221159","title":"Update of predicted SNR upper bound for noise free SDR scenarios","source":"Qualcomm CDMA Technologies","contact":"Vijay Balasubramanian","contact-id":84569,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":11590,"status":"revised","reservation_date":"2022-02-11 11:30:56","uploaded":"2022-02-12 08:48:14","revisionof":"","revisedto":"R5-221747","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":300.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221159.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221277","title":"38.903 Beam correspondence Measurement Uncertainties","source":"Keysight technologies UK Ltd","contact":"Flores Fernandez Martos","contact-id":47301,"tdoctype":"CR","for":"Agreement","abstract":"This document depends on R5-221275.","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":12770,"status":"revised","reservation_date":"2022-02-11 17:10:31","uploaded":"2022-02-12 01:30:36","revisionof":"","revisedto":"R5-221629","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":301.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221277.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221287","title":"Test Tolerance analysis for inter-frequency RRC re-establishment test case","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"CR","for":"Agreement","abstract":"Test tolerance analysis. RAN4 dependant.","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":12870,"status":"agreed","reservation_date":"2022-02-11 17:45:12","uploaded":"2022-02-11 19:14:54","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":303.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221287.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221288","title":"Test Tolerance analysis for inter-frequency RRC re-establishment test case","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"CR","for":"Agreement","abstract":"Test tolerance analysis. RAN4 dependant.","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":12880,"status":"revised","reservation_date":"2022-02-11 17:45:14","uploaded":"2022-02-11 19:14:54","revisionof":"","revisedto":"R5-221644","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":304.0,"crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221288.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221304","title":"Correction of clause 3","source":"Ericsson","contact":"Jakub Kolodziej","contact-id":76956,"tdoctype":"CR","for":"Agreement","abstract":"Editiorial correction of Clause 3","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":13040,"status":"agreed","reservation_date":"2022-02-11 17:45:28","uploaded":"2022-02-11 19:14:54","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":305.0,"crrevision":"","crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221304.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221629","title":"38.903 Beam correspondence Measurement Uncertainties","source":"Keysight technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":12771,"status":"agreed","reservation_date":"2022-03-06 15:05:56","uploaded":"2022-03-08 07:51:06","revisionof":"R5-221277","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":301.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221629.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221644","title":"Test Tolerance analysis for inter-frequency RRC re-establishment test case","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":12881,"status":"agreed","reservation_date":"2022-03-06 15:06:07","uploaded":"2022-03-08 07:51:06","revisionof":"R5-221288","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":304.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221644.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221743","title":"FR2 EVM MU definition in 38.903","source":"Keysight Technologies UK Ltd","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":3561,"status":"agreed","reservation_date":"2022-03-06 15:07:42","uploaded":"2022-03-08 07:51:10","revisionof":"R5-220356","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":286.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221743.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221744","title":"TT analysis for FR2 SSB based BFD TCs","source":"Huawei,Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":7161,"status":"agreed","reservation_date":"2022-03-06 15:07:43","uploaded":"2022-03-08 07:51:10","revisionof":"R5-220716","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":287.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221744.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221745","title":"TT analysis for FR2 SSB intra-freq measurement without DRX TCs","source":"Huawei,Hisilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":7171,"status":"agreed","reservation_date":"2022-03-06 15:07:44","uploaded":"2022-03-08 07:51:10","revisionof":"R5-220717","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":288.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221745.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221746","title":"Addition of summary table for MU factors","source":"Huawei, HiSilicon","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":7821,"status":"agreed","reservation_date":"2022-03-06 15:07:45","uploaded":"2022-03-08 07:51:10","revisionof":"R5-220782","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":292.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221746.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-221747","title":"Update of predicted SNR upper bound for noise free SDR scenarios","source":"Qualcomm CDMA Technologies","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR","for":"Agreement","abstract":"","secretary_remarks":"","agenda_item_sort_order":80,"ainumber":"5.3.1.15","ainame":"TR 38.903 ((NR MU &  TT analyses)","tdoc_agenda_sort_order":11591,"status":"agreed","reservation_date":"2022-03-06 15:07:46","uploaded":"2022-03-08 07:51:10","revisionof":"R5-221159","revisedto":"","release":"Rel-16","crspec":"38.903","crspecversion":"16.10.1","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":300.0,"crrevision":1.0,"crcategory":"F","tsg_crp":"RP-220076","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_94_Electronic\/Docs\/R5-221747.zip","group":"R5","meeting":"R5-94-e","year":2022,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]