[{"name":"R4-2316378","title":"Discussion on Test method for UE Demodulation","source":"Huawei,HiSilicon","contact":"Lingyu Kong","contact-id":90594,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":153,"ainumber":"5.2.4","ainame":"Test methods for Demodulation requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-09-27 13:06:11","uploaded":"2023-09-27 13:13:05","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316378.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316509","title":"Discussion on demodulation test method for FR2 multi-Rx UE","source":"Qualcomm Incorporated","contact":"Bin Han","contact-id":75122,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":153,"ainumber":"5.2.4","ainame":"Test methods for Demodulation requirements","tdoc_agenda_sort_order":0,"status":"noted","reservation_date":"2023-09-27 14:29:29","uploaded":"2023-09-27 18:20:33","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316509.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316512","title":"TP on TR 38.871 for Demodulation test method","source":"Qualcomm Incorporated","contact":"Bin Han","contact-id":75122,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":153,"ainumber":"5.2.4","ainame":"Test methods for Demodulation requirements","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2023-09-27 14:29:29","uploaded":"2023-09-27 18:20:33","revisionof":"","revisedto":"R4-2316949","release":"Rel-18","crspec":"38.871","crspecversion":"0.4.0","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316512.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0},
{"name":"R4-2316949","title":"TP on TR 38.871 for Demodulation test method","source":"Qualcomm Incorporated","contact":"Achraf Khsiba","contact-id":92474,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":153,"ainumber":"5.2.4","ainame":"Test methods for Demodulation requirements","tdoc_agenda_sort_order":0,"status":"approved","reservation_date":"2023-09-29 09:37:44","uploaded":"2023-10-13 08:01:08","revisionof":"R4-2316512","revisedto":"","release":"Rel-18","crspec":"38.871","crspecversion":"0.4.0","workitem":[{"winame":"FS_NR_FR2_OTA_enh"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_108bis\/Docs\/R4-2316949.zip","group":"R4","meeting":"R4-108-bis","year":2023,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]