[{"name":"R5-151396","title":"Discussion paper on Low Cost MTC testing","source":"Ericsson","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"other","for":"Decision","abstract":"","secretary_remarks":"","agenda_item_sort_order":16,"ainumber":"4.5.6","ainame":"\tOther","tdoc_agenda_sort_order":0,"status":"withdrawn","reservation_date":"2015-05-13 11:53:12","uploaded":"2015-08-06 15:24:06","revisionof":"","revisedto":"","release":"Rel-12","crspec":"","crspecversion":"","workitem":[{"winame":"LC_MTC_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_67_Fukuoka\/Docs\/R5-151396.zip","group":"R5","meeting":"R5-67","year":2015,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]