[{"name":"R5-164032","title":"Discussion on test configuration for Cat-M1 RF TX and Rx test cases","source":"Ericsson LM","contact":"Fredrik Sundstr\u00f6m","contact-id":41388,"tdoctype":"discussion","for":"Endorsement","abstract":"The test cases for UE Cat-M1 in TS36.521-1 are currently missing test configuration tables. This paper suggests basic test config tables for Tx and Rx test cases only. Se also RAN5 RF AP#71.22from RAN5#71 in Nanjing.\nThe suggestion is to agree a basline","secretary_remarks":"","agenda_item_sort_order":29,"ainumber":"4.2.4","ainame":"General Papers","tdoc_agenda_sort_order":40320,"status":"revised","reservation_date":"2016-06-21 11:31:03","uploaded":"2016-06-22 20:44:36","revisionof":"","revisedto":"R5-164118","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_AHs\/2016-06-27_IoT_Adhoc_1\/Docs\/R5-164032.zip","group":"R5","meeting":"R5-ah-18066","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-164118","title":"Discussion on test configuration for Cat-M1 RF TX and Rx test cases","source":"Ericsson LM","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"","secretary_remarks":"","agenda_item_sort_order":29,"ainumber":"4.2.4","ainame":"General Papers","tdoc_agenda_sort_order":40321,"status":"noted","reservation_date":"2016-07-22 09:51:40","uploaded":"2016-08-31 15:49:17","revisionof":"R5-164032","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_AHs\/2016-06-27_IoT_Adhoc_1\/Docs\/R5-164118.zip","group":"R5","meeting":"R5-ah-18066","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R5-164125","title":"WF on RF\/RRM test frequency and selection approach","source":"Dish, Ericsson, Qualcomm","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"other","for":"Discussion","abstract":"outcome of contributions of the present meeting.\n\nRx tests : total 7 tests \nTx tests: total 19 tests\nDemod Performance & RRM: [TBD] tests\nNB-IoT operating bands 1, 2, 3, 5, 8, 12, 13, 17, 18, 19, 20, 26, 28, 66\nNominal channel spacing between 2 adja","secretary_remarks":"","agenda_item_sort_order":29,"ainumber":"4.2.4","ainame":"General Papers","tdoc_agenda_sort_order":412500,"status":"noted","reservation_date":"2016-07-22 09:51:41","uploaded":"2016-08-31 15:49:17","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_AHs\/2016-06-27_IoT_Adhoc_1\/Docs\/R5-164125.zip","group":"R5","meeting":"R5-ah-18066","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]