[{"name":"R4-1706561","title":"Measurement Uncertainty Contributions for mmWave OTA","source":"Anritsu Corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Discussion","abstract":"Based on the WFs, we further studied actual values for each MU contribution of Tx\/Rx test and introduce major MU factor which came out from the study.","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":67830,"status":"noted","reservation_date":"2017-06-16 10:09:56","uploaded":"2017-06-19 11:24:24","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706561.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706783","title":"Framework for multiple OTA test methods and common test equipment uncertainties","source":"Huawei, HiSilicon","contact":"Michal Szydelko","contact-id":65553,"tdoctype":"discussion","for":"Discussion","abstract":"In this contribution we are proposing to extend the OTA test methods equivalence criteria by consideration of the framework defined in the AAS BS TR 37.842, where multiple OTA test methods were considered. Additionally, we are discussing on the approach t","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":67970,"status":"noted","reservation_date":"2017-06-19 11:04:25","uploaded":"2017-06-19 15:19:28","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706783.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706797","title":"TP to TR 38.810: OTA testing framework and test equipment MU contributors","source":"Huawei, HiSilicon","contact":"Michal Szydelko","contact-id":65553,"tdoctype":"other","for":"Approval","abstract":"Based on discussion paper on \"Framework for multiple OTA test methods and common test equipment uncertainties\", TP to TR 38.810 is proposed for approval.","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68340,"status":"revised","reservation_date":"2017-06-19 11:46:04","uploaded":"2017-06-19 15:19:28","revisionof":"","revisedto":"R4-1706939","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706797.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706834","title":"Preliminary Uncertainty contributors for TX measurements with a Near Field Test Range","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68780,"status":"available","reservation_date":"2017-06-19 14:17:31","uploaded":"2017-06-19 19:39:00","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706834.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706836","title":"Preliminary Uncertainty contributors for TX measurements with a CATR","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68790,"status":"available","reservation_date":"2017-06-19 14:20:03","uploaded":"2017-06-19 19:39:11","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706836.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706847","title":"On MU for NR Rx measurement","source":"CATR","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution continues to share some views on defining the MU for UE Rx measurement setup.","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68360,"status":"available","reservation_date":"2017-06-19 15:41:34","uploaded":"2017-06-20 01:15:49","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706847.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706848","title":"WF on NR MU and test tolerance","source":"CATR, Intel Corporation","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"other","for":"Approval","abstract":"Way Forward for approval","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":65610,"status":"approved","reservation_date":"2017-06-19 15:55:06","uploaded":"2017-07-07 07:47:52","revisionof":"","revisedto":"","release":"Rel-15","crspec":38.81,"crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706848.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706860","title":"On MU of Baseline System","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"discussion","for":"Discussion","abstract":"The way forward on NR UE MU and test tolerance suggested a common format for the MU table in terms of 2 stages similar to the work done for SISO and MIMO OTA test cases. This contribution provides additional insight into the work ahead for the baseline se","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68470,"status":"noted","reservation_date":"2017-06-19 16:35:17","uploaded":"2017-06-19 22:10:46","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706860.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706862","title":"TP on MU for UE RF baseline setup","source":"CATR","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68480,"status":"available","reservation_date":"2017-06-19 17:05:07","uploaded":"2017-07-07 07:47:52","revisionof":"","revisedto":"","release":"Rel-15","crspec":38.81,"crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706862.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706878","title":"RF baseline measurement uncertainty budget","source":"Keysight Technologies","contact":"Moray Rumney","contact-id":6630,"tdoctype":"other","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68600,"status":"reserved","reservation_date":"2017-06-19 19:52:26","uploaded":null,"revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706879","title":"CATR measurement uncertainty budget","source":"Keysight Technologies","contact":"Moray Rumney","contact-id":6630,"tdoctype":"other","for":"Information","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68620,"status":"noted","reservation_date":"2017-06-19 19:52:26","uploaded":"2017-06-19 22:00:31","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706879.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1706939","title":"TP to TR 38.810: OTA testing framework and test equipment MU contributors","source":"Huawei, HiSilicon","contact":"Kyoungseok Oh","contact-id":66120,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":55,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance[FS_NR_test_methods]","tdoc_agenda_sort_order":68341,"status":"approved","reservation_date":"2017-07-12 09:01:57","uploaded":"2017-07-18 07:41:12","revisionof":"R4-1706797","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jun2017\/Docs\/R4-1706939.zip","group":"R4","meeting":"R4-ah-18849","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]