[{"name":"R4-1709324","title":"Methodology of CDF for REFSENS and estimation of test time for mmWave","source":"Anritsu Corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Discussion","abstract":"We introduce our view on the methodologies of CDF EIS and also show our approximate estimation of test time by those methodologies.","secretary_remarks":"","agenda_item_sort_order":148,"ainumber":"3.6.2","ainame":"UE RF [FS_NR_test_methods]","tdoc_agenda_sort_order":93240,"status":"noted","reservation_date":"2017-09-08 09:30:39","uploaded":"2017-09-11 00:44:27","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Sep2017\/Docs\/R4-1709324.zip","group":"R4","meeting":"R4-ah-19871","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1709325","title":"A way to curtail CDF EIS measurement time","source":"Anritsu Corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Discussion","abstract":"This paper proposes a way to curtail the measurement time of CDF EIS in which the Rx-front-end including array-antennas and the common demodulator after MRC are evaluated separately.","secretary_remarks":"","agenda_item_sort_order":148,"ainumber":"3.6.2","ainame":"UE RF [FS_NR_test_methods]","tdoc_agenda_sort_order":93250,"status":"noted","reservation_date":"2017-09-08 09:34:07","uploaded":"2017-09-11 00:49:49","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Sep2017\/Docs\/R4-1709325.zip","group":"R4","meeting":"R4-ah-19871","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1709745","title":"Importance of pre-scan to reduce mmW UE unwanted emissions test time","source":"Qualcomm Incorporated","contact":"Valentin Gheorghiu","contact-id":43117,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":148,"ainumber":"3.6.2","ainame":"UE RF [FS_NR_test_methods]","tdoc_agenda_sort_order":93920,"status":"noted","reservation_date":"2017-09-11 16:10:38","uploaded":"2017-09-11 22:35:24","revisionof":"","revisedto":"","release":"Rel-15","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Sep2017\/Docs\/R4-1709745.zip","group":"R4","meeting":"R4-ah-19871","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1709771","title":"On the Effect of DUT Configuration on Conformance Test Automation and Test Times","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution discusses the need to consider the DUT configuration during the OTA testing, specifically testing devices in battery operation vs operating the DUT with charging and data cables.","secretary_remarks":"","agenda_item_sort_order":148,"ainumber":"3.6.2","ainame":"UE RF [FS_NR_test_methods]","tdoc_agenda_sort_order":95920,"status":"noted","reservation_date":"2017-09-11 17:16:30","uploaded":"2017-09-11 22:47:19","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Sep2017\/Docs\/R4-1709771.zip","group":"R4","meeting":"R4-ah-19871","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1709774","title":"DUT Positioning Guidelines for NR","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"discussion","for":"Discussion","abstract":"During the RAN4#84 meeting, it was decided to adopt the black-box approach for NR. The lack of a vendor declaration about the antenna system and architecture has consequences related to the measurement uncertainties and test tolerances of various conforma","secretary_remarks":"","agenda_item_sort_order":148,"ainumber":"3.6.2","ainame":"UE RF [FS_NR_test_methods]","tdoc_agenda_sort_order":97450,"status":"noted","reservation_date":"2017-09-11 17:27:44","uploaded":"2017-09-11 22:47:19","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Sep2017\/Docs\/R4-1709774.zip","group":"R4","meeting":"R4-ah-19871","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1709788","title":"TP on DUT Positioning Guidelines for NR","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"other","for":"Approval","abstract":"This contribution is a text proposal to TP38.810 to define the DUT positioning guidelines for NR. A respective discussion paper was presented in R4-1709774.","secretary_remarks":"","agenda_item_sort_order":148,"ainumber":"3.6.2","ainame":"UE RF [FS_NR_test_methods]","tdoc_agenda_sort_order":97530,"status":"approved","reservation_date":"2017-09-11 17:31:30","uploaded":"2017-09-11 22:47:19","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Sep2017\/Docs\/R4-1709788.zip","group":"R4","meeting":"R4-ah-19871","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1709808","title":"Test Interface functions for NR UE OTA testing","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"other","for":"Approval","abstract":"At RAN4 meeting #84 contribution proposed a set of standard NR UE test interface (TI) functions in order to enable and simplify OTA testing of certain parameters. Basically, the test interface approach was endorsed by RAN4#84, the beam lock TI function wa","secretary_remarks":"","agenda_item_sort_order":148,"ainumber":"3.6.2","ainame":"UE RF [FS_NR_test_methods]","tdoc_agenda_sort_order":97710,"status":"noted","reservation_date":"2017-09-11 17:37:09","uploaded":"2017-09-11 22:47:19","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Sep2017\/Docs\/R4-1709808.zip","group":"R4","meeting":"R4-ah-19871","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]