[{"name":"R4-1700016","title":"On UE OTA testability for NR above 6 GHz","source":"CATR","contact":"Ruixin Wang","contact-id":64036,"tdoctype":"other","for":"Approval","abstract":"This paper discusses the OTA testability for NR UE above 6 GHz.","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":160,"status":"approved","reservation_date":"2017-01-04 07:41:31","uploaded":"2017-01-05 01:52:12","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700016.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700025","title":"TP on general aspects of NR UE test","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"pCR","for":"Approval","abstract":"The contribution is a text proposal for TR 38.803 [2] on testability of UE RF parameters. General testability aspects are taken from [3], [4], [5], and [6]. Aspects associated with the testability of UE RF requirements below [6] GHz are discussed in a sep","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":250,"status":"revised","reservation_date":"2017-01-04 10:37:57","uploaded":"2017-01-06 21:24:58","revisionof":"","revisedto":"R4-1700262","release":"","crspec":38.803,"crspecversion":"1.0.0","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700025.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700026","title":"TP on NR UE test of transmitter characteristic","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":260,"status":"merged","reservation_date":"2017-01-04 10:37:57","uploaded":"2017-01-06 21:24:58","revisionof":"","revisedto":"","release":"","crspec":38.803,"crspecversion":"1.0.0","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700026.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700027","title":"TP on NR UE test of receiver characteristic","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":270,"status":"merged","reservation_date":"2017-01-04 10:37:57","uploaded":"2017-01-06 21:24:58","revisionof":"","revisedto":"","release":"","crspec":38.803,"crspecversion":"1.0.0","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700027.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700028","title":"TP on NR UE test interface aspects","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"pCR","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":280,"status":"merged","reservation_date":"2017-01-04 10:37:57","uploaded":"2017-01-06 21:24:58","revisionof":"","revisedto":"","release":"","crspec":38.803,"crspecversion":"1.0.0","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700028.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700029","title":"On NR UE testability for below 6 GHz","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":290,"status":"noted","reservation_date":"2017-01-04 10:37:57","uploaded":"2017-01-06 21:24:58","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700029.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700030","title":"NR UE testability terminology","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":300,"status":"noted","reservation_date":"2017-01-04 10:37:57","uploaded":"2017-01-06 21:24:58","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700030.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700031","title":"Way Forward on NR UE Testability","source":"Intel Corporation, CATR","contact":"Yang Tang","contact-id":56725,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":310,"status":"revised","reservation_date":"2017-01-04 10:37:57","uploaded":"2017-01-19 23:34:57","revisionof":"","revisedto":"R4-1700294","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700031.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700072","title":"Proposed near field test setup for EIRP measurement","source":"MVG Industries","contact":"Alessandro Scannavini","contact-id":52688,"tdoctype":"other","for":"Approval","abstract":"During RAN4#81, R4-1610926 was agreed. It was mainly pointed out that FF setups would be used as baseline but other test methods are not precluded.\nThis contribution aims at proposing a near field test setup for EIRP measurement. The goals is also to addr","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":720,"status":"noted","reservation_date":"2017-01-05 16:37:19","uploaded":"2017-01-06 20:58:49","revisionof":"","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700072.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700078","title":"NR UE Test Interface Considerations","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"discussion","for":"Discussion","abstract":"This paper proposes of a more comprehensive list of test interface functions to support NR UE RF conformance testing.","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":780,"status":"noted","reservation_date":"2017-01-05 18:46:20","uploaded":"2017-01-06 19:11:10","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700078.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700079","title":"On Baseline Testing Setups for UE RF Requirements","source":"ROHDE & SCHWARZ","contact":"Thorsten Hertel","contact-id":60675,"tdoctype":"discussion","for":"Discussion","abstract":"This contribution provides an overview of suitable baseline systems for TRP\/TRS metrics and how the systems scale for the EIRP\/EIS metrics.","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":790,"status":"noted","reservation_date":"2017-01-05 18:48:47","uploaded":"2017-01-06 19:11:10","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700079.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700262","title":"TP on general aspects of NR UE test [title to be verified]","source":"Intel Corporation, CATR","contact":"John M Meredith","contact-id":637,"tdoctype":"pCR","for":"Approval","abstract":"This is a merger of the above documents.","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":285,"status":"noted","reservation_date":"2017-01-19 21:46:54","uploaded":"2017-01-19 23:32:04","revisionof":"R4-1700025","revisedto":"","release":"","crspec":38.803,"crspecversion":"1.0.0","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700262.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700294","title":"Way Forward on NR UE Testability","source":"Intel Corporation, CATR","contact":"John M Meredith","contact-id":637,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":311,"status":"revised","reservation_date":"2017-01-20 00:36:56","uploaded":"2017-01-20 00:36:56","revisionof":"R4-1700031","revisedto":"R4-1700299","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700294.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"R4-1700299","title":"Way Forward on NR UE Testability","source":"Intel Corporation, CATR","contact":"John M Meredith","contact-id":637,"tdoctype":"other","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":28,"ainumber":"3.5.6","ainame":"Testability [FS_NR_newRAT]","tdoc_agenda_sort_order":312,"status":"approved","reservation_date":"2017-01-20 00:48:09","uploaded":"2017-01-20 00:48:09","revisionof":"R4-1700294","revisedto":"","release":"Rel-14","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_newRAT"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Jan2017\/Docs\/R4-1700299.zip","group":"R4","meeting":"R4-ah-18517","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]