[{"name":"RP-170054","title":"Status report for UE Conformance Test Aspects - Further Enhancements of Minimization of Drive Tests for E-UTRAN (Rel-13)","source":"Intel Corporation (UK) Ltd","contact":"Anjali Mishra","contact-id":49861,"tdoctype":"WI status report","for":"","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"13.5.8","ainame":"UE Conf. Test Aspects \u2013 Further Enhancements of Minimization of Drive Tests for E-UTRAN [LTE_eMDT2-UEConTest]","tdoc_agenda_sort_order":540,"status":"noted","reservation_date":"2017-02-16 22:18:51","uploaded":"2017-02-23 19:13:31","revisionof":"","revisedto":"","release":"Rel-13","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_eMDT2-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/TSG_RAN\/TSGR_75\/Docs\/RP-170054.zip","group":"RP","meeting":"RP-75","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0},
{"name":"RP-170087","title":"RAN5 agreed non TTCN CR(s) WI MS Conformance Test Aspects - Further Enhancements of Minimization of Drive Tests   for E-UTRAN (LTE_eMDT2-UEConTest)","source":"RAN5","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"CR pack","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":162,"ainumber":"13.5.8","ainame":"UE Conf. Test Aspects \u2013 Further Enhancements of Minimization of Drive Tests for E-UTRAN [LTE_eMDT2-UEConTest]","tdoc_agenda_sort_order":870,"status":"approved","reservation_date":"2017-02-21 18:02:25","uploaded":"2017-03-03 14:01:07","revisionof":"","revisedto":"","release":"Rel-13","crspec":"","crspecversion":"","workitem":[{"winame":"LTE_eMDT2-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/TSG_RAN\/TSGR_75\/Docs\/RP-170087.zip","group":"RP","meeting":"RP-75","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":[{"crtdoc":"R5-171505","crwgdecision":"agreed","crtsgdecision":"approved","crspec":"36.523-1","crnumber":3862,"crrevision":1.0,"crcategory":"F","crrelease":"Rel-13","crspecversion":"13.3.0","crtitle":"Addition of new eMDT2 testcase: Measurement \/ Latency metrics for UL PDCP Packet Delay per QCI"},{"crtdoc":"R5-171591","crwgdecision":"agreed","crtsgdecision":"approved","crspec":"36.523-2","crnumber":988,"crrevision":1.0,"crcategory":"F","crrelease":"Rel-14","crspecversion":"14.0.0","crtitle":"Applicability of new eMDT2 testcase"}],"crsinpacknumber":2}]